Modem Test
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Product
DC Hipot Testing
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Weshine Electric Manufacturing Co., Ltd
Your product description goes here.
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Product
EMC/EMI Testing
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NCEE Labs has state of the art test equipment and experienced iNARTE EMC/EMI and qualified staff to provide Electromagnetic Compatibility (EMC) and Electromagnetic Interference (EMI) testing. The lab maintains accreditation to the latest FCC, CE and other international EMC/EMI standards.
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Test Chambers
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The focus of the Feutron climate simulation overall concept is on the simplest operation of the overall functions of the test systems and the highest reliability with maximum efficiency. This is why our systems are supplied as plug-in compact devices.
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Penetration Testing Services
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All web and mobile applications are vulnerable to attack. You are going to get hacked – it's not "if", it's "when." Before it happens, you want to make sure you have a mature security system in place. Our specialists in software security testing have a background in IT and software development, know different types of exploits, and have experience in performing thousands of pen tests. We get hired to hack into systems and determine weaknesses.
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Product
Crack Testing
STATOGRAPH® Product Family
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Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
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Performance Testing Service
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Web Application Performance Testing. Mobile App Performance Assessment. Media Streaming User Experience Assessment. ERP/CRM Applications Performance Testing.
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Product
VFTLP+ Test System
4012
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The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Product
Test Tool
Iron - IEC 60870-6
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Iron is a Windows™ application that creates compliant IEC 60870-6 (TASE.2/ICCP) Applications, both unidirectional and bidirectional. Iron is a highly configurable tool with multiple simulation options for changing Data Model values and generating valid message traffic. Support for Read, Write, Reporting, Discovery, Controls, and Dynamic DataSets are built into the tool.
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Test Chambers
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The left-hand axis scales the level of the 100 measurements and the right-hand axis displays the uncertainty to a statistical confidence level of 95%; proving the repeatability is better than +/-0.25dB between the measured values. Guaranteeing repeatability, accuracy and correlation across Lab’s, across Production lines and across the World
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Photonic Device Testing
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ficonTEC’s series of photonic device testing machines is focused on automated electrical, optical or mixed-signal electro-optical characterization (test-&-qualify) of chips and dies, opto-electronic assembles and integrated devices. Capability includes PIC design validation and device verification.
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Microwave Testing
75
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The MODEL 75 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 75 Picoprobe, with or without the bias T option, achieves an insertion loss of less than 1.0 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Environmental Test Chamber
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The chamber is produced by SUS304 Steel, the temperature keeping material is produced by Polyurethane hard foam and ultra-fine fibre glass, the doorframe heat insulated by Double high temperature aging silicone rubber door sealing strip.The temperature controller is used by Korean TEMI display in English/Chinese and German Siemens PLC, it can be communicated to PC via RS-232. The temperature accuracy is 0.1 and humidity is 0.1%R.HThe temperature sensor is platinum PT100 Ohms/MV resistor
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Product
Speaker Test
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Determines speaker polarity by analyzing a proprietary signal. See our new demo video of this module. Measures woofers, midrange, and tweeter drivers.
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Battery Test Systems
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Was designed to meet the specific demands of our loyal customers. This system is used to test both single cell batteries as well as super-capacitors.
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Test Automation
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Deployment ramping up pressure on the test organization to validate products in shorter test cycles. We have assisted Tier – 1 companies in the BFSI, Cloud Solutions and Communication domains to deploy highly efficient test strategies. Talk to our engineers to see how we can assist your business.
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Product
PC Based Test Setup for Electric Iron Testing
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SCR ELEKTRONIKS make PC Based Test Setup for Electric Iron Testing is useful to carry out various tests mentioned in IS 366:1991 clauses 10,11,12,13 & 14 on the Iron under test.
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Oil Test System
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The Oil Test system Model OTS 2K1 is portable transformer oil Test system. It is a specially designed for accurate measurement of Loss Factor, Permitivity & Volume Resistivity Measurement of Transformer Oils & Petroleum jellys. The test frequency is 50 Hz . The system is provided with Mode Selector Switch so that once the oil cell is connected, it can measure all Three parameters in different modes without handling the test leads.
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Product
Custom Test Sockets
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RTI specializes in producing custom test sockets We work with your engineering team from prototype to production, ensuring your product meets your test requirements. Contact us for a free quote.
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IC Test Services
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With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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Test System
Griffin III
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The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Product
Grease Test Rigs
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SKF Condition Monitoring Center
Through the development of a number of grease test rigs, we continue to deepen our understanding of lubrication theory and pass that knowledge on to our customers.
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Product
Site Testing and Investigations
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EMC Technologies has a dedicated In-Situ test team that carries out EMC testing nationwide and in the Asia-Pacific region. Equipped with portable EMC test equipment, we are able to support a wide range of EMC emissions and immunity tests and measurements at your site.
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Product
Test Contactor
cDragon
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cDragon™ Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
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Test Devices
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qCf - quickCONNECT - efficient, accurate, safe!Measurements on internal components of the fuel cell and electrolysis
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Test Engines
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Verified Systems International GMBH
The test system cluster architecture is based on dual CPU or 4-CPU PCs acting as cluster nodes. The nodes communicate and synchronise over a high-speed network (Myrinet or InfiniBand). A modification of the Linux operating system allows to run the test execution and evaluation algorithms in hard real-time on reserved CPUs, where scheduling is non-preemptive and controlled by the test system itself. The interrupts caused by interfaces to the system under test may be relayed to CPUs designated explicitly for their handling. This approach offers the opportunity to utilise high-performance standard hardware and the services provided by the widely accepted Linux operating system in combination with all mechanisms required for hard real-time computing. The cluster architecture presents an opportunity to distribute interfaces with high data throughput on different nodes, so that PCI bus overload can be avoided. In addition, the CPU load can be balanced by allocating test data generators, environment simulations and checkers for the behaviour of the system under test ("test oracles") on dedicated CPUs.
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Temperature shock test chambers test
TSS series
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The operating principle of Schocktestprfschrank based of two superposed test rooms (top hot chamber, cold chamber below), between which a car with the test specimens is moved up and down by the large thermal shock test equipment may be subjected
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Impact Testing
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Educated Design & Development, Inc.
ED&D is the only company in the world currently supplying safety products that actually meet or exceed the specified Rockwell hardness’s that are called for in the standards. Manufacturing to these specifications is an extremely difficult process. In addition, we rely on external laboratories that specialize in Rockwell hardness to verify and certify our results. These are corners our competitors’ often cut, but are vital toward providing equipment that meets or exceeds the requirements! If you’ve purchased product safety test equipment that specified a Rockwell hardness requirement, and you didn’t purchase it from us, chances are you’re using a piece of test equipment that DOES NOT meet the requirements.
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CAM/TRAC Test Kits
Series 47
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The VP Series 47 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 47 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those wanting to provide their own ITA Interface.
