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Product
Telephone Line Testers for POTS / Analog Line
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*This analog line tester is suitable for all instalers installing telephone equepement on POTS line.*Led indications signaling the status of analog line.
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Product
Transmission Line Pulse Testing
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Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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Product
Flight Test Switches
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Curtiss-Wright Defense Solutions
Our compact, deterministic flight test switches have been qualified to reliably deliver high-speed, real-time data with a wide temperature operation ranging from -40 to 85°C. Their rapid boot-up capability minimizes data loss from power outages, while their flexible forwarding and filtering configurations can send what is required to multiple destinations for real-time monitoring, recording, and transmission.
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Product
PC/104 Input/Output Module providing 96 lines of digital I/O
PCM-UIO96C-16
Digital I/O
The PCM-UIO96C-16 is a highly versatile PC/104 input/output module providing 96 lines of digital I/O. One important feature of this card is its ability to monitor 48 of the 96 lines for both rising and falling digital edge transitions, latch them, and then interrupt the host processor notifying that a change-of-input status has occurred. This is an efficient way of signaling the CPU of real-time events without the burden of polling the digital I/O.
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Product
Classic Collet | Black | Without Line | Matt Or Glossy | Ø 21 Mm
020-4x20/5
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Secure plastic mounting cap for collet or wing knob
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Product
Tunable Laser Source, High Power And Lowest SSE, Top Line
N7776C
Laser Source
The new Keysight N7776C top line tunable laser source is designed to reach best-in-class accuracy in static and swept operation for outstanding test efficiency. Two-way sweeps up to 200 nm/s speed with sub-picometer repeatability and without impacting the specified dynamic accuracy accelerate wavelength-dependent alignment processes and the automated calibration of wavelength-selective devices. Shorter time to testing and faster swept-wavelength tests help reduce test cost per device, improve test margins and lower the cost of ownership.
