Showing results: 121 - 135 of 217 items found.
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Ferrites India
Many times it is requires to study the magnetic field profile of the 2D or 3D surface to estimate the performance of the magnetic device. The field pattern is measured by sensors and very precise mechanical arrangement. The spacing between two points of measurement can be as low as a few microns. This precise measurements can confirm the quality of performance of any device.
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DataMan 2-D -
Cognex Corporation
In addition to breakthrough code reading, there are DataMan products for every step of the direct part marking (DPM) process, including quality verification, and data validation. Easy-to-use and reliable DataMan products enable quality control solutions for applications that require the highest read rates for 2-D Data Matrix codescritical to product traceability.
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FilmTek 2000 PAR -
Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
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FilmTek 2000 -
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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ROM-5420 B1 -
Advantech Co. Ltd.
ROM-5420 SAMRC v1.1 Module integrates ARM Cortex-A9 NXP i.MX6 series ultra low power SoC and I/O solution chips to be OS support ready. NXP i.MX6 supports 2D, 3D graphics acceleration, full HD 1080P video decoding and an HD 1080p video encoding hardware engine.
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NEXIV VMZ-K6555 -
Nikon Metrology, Inc.
The Nikon Confocal NEXIV VMZ-K6555 was developed on the strength of Nikon's leading opto-mechatronics (optical, mechanical and electronic) technologies. It incorporates a variety of confocal optics for fast and accurate evaluation of fine three-dimensional surface metrology, image processing technology, and TT L laser autofocus. It allows both 2D and height measurements in the same field of view.
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Panasonic Industrial Devices Sales Company of America
With over 20 years of experience building Laser Marking Systems and 2D Code Readers, Panasonic has built a strong following that identify the brand with innovation, reliability, and quality. Throughout the years Panasonic has developed numerous high-quality products for a variety of applications only to be matched by their first-class customer service and expert technical support.
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Boin GmbH
PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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Boin GmbH
WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
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FX-940 ULTRA -
YesTech, Inc.
Nordson YESTECH’s advanced 3D imaging technology offers high-speed PCB inspection with exceptional defect coverage. With one top down viewing camera, four side viewing cameras and 2D + 3D inspection, the FX-940 ULTRA inspects solder joints and verifies correct part assembly enabling users to improve quality and increase throughput.
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QES Mechatronic Sdn Bhd
High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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dOCTor™ -
NOVACAM Technologies, Inc.
dOCTor™ Optical Coherence Tomography (OCT) systemsoffer very high quality non-invasive tissue imaging in 2D and 3D. They are ideal for: In-Vivo Imaging Small Animal Imaging Tissue Engineering and Visualization Developmental BiologydOCTor systems are available in Swept-Source(SS) OCT and Time-Domain (TD) OCT configurations to satisfy different application imaging needs.
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Nordson Corporation
The Nordson TEST & INSPECTION µCT inspection option provides Computerized Tomography (CT) functionality to compliment the 2D X-ray investigations on Nordson TEST & INSPECTION X-ray inspection systems. It uses the superior, sub-micron feature recognition 2D x-ray images, that Nordson TEST & INSPECTION X-ray systems always provide, to produce the best CT models for 3D sample analysis, virtual micro-sectioning and internal dimensional measurements. It reduces the number of time-consuming micro-section analyses needed and / or assists in identifying where micro-section preparation and investigation must concentrate. Available with a system order or as retro-fit to suit application and workflow needs.
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ZEISS Celldiscoverer 7 -
Carl Zeiss AG
Combine the ease of use of an automated microscope with the image quality and flexibility of a research microscope. Whether working with 2D or 3D cell cultures, tissue or small model organisms, you will acquire better data in shorter times with this automated live cell imaging platform. Add LSM 900 with Airyscan 2 to gently image dynamic processes with highest framerates in superresolution.
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CRESBOX -
NAPSON Corp.
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator