PXI Functional Test
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Product
Leather Testing Machine
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Dongguan Kejian Instrument Co., Ltd.
Test method uses clean ball placed within the material applications, steel ball itself of the impedance and total weight, must be in conformity with the provisions, on this condition detection material zigzag waterproof penetration index, using the latest inductive components and special design, test as long as materials applications in water infiltration immediately automatic stop counting or in setting time (test times) arrived, namely automatic stop and display the time or times.
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Product
PXI Relay Driver Module
Relay Driver
The PXI Relay Driver Module controls up to 64 external relays with up to 50 VDC or 600 mA per channel drive capacity when using an external power supply. Modules can drive small DC motors or other inductive relay coils, and they include overcurrent, overvoltage, and flyback protection to ensure long operation. The PXI Relay Driver Module allows you to build custom switch configurations while using the standard IVIcompliant NISWITCH driver software.
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Product
SoC Test System
V93000 SoC / Smart Scale
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Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
Analog IC test system
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A paradigm shift has been occurred in Japan’s major brand WL25 series tester. Ultimate simple system is available by effective analog pin architecture.This cost performance system is covered analog IC extensively, which are high accuracy, speed and multi-site test function.
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Product
PXI Multiplexer, Dual 24-Channel, 1-Pole
40-632A-021-D/24/1
Multiplexer Module
The 40-632A-021-D/24/1 is a dual 24-channel, 1-pole PXI multiplexer and is part of our series of general purpose multiplexer modules featuring a wide range of switching configurations. Typical applications include signal routing in ATE and data acquisition systems.
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Product
Speedometer Test Bench
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Maschinenbau Haldenwang GmbH & Co. KG.
Tachometer tester for cars and commercial vehicles.
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Product
UDP Test Suite
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Design engineers, quality assurance engineers and testers use the IWL UDP Test Suite to find and fix bugs in their UDP implementation. The tests help ensure that the UDP implementation is sufficiently robust so that it is not vulnerable to the wide range of attacks in today's Internet. The tests make use of the Maxwell Pro network emulation environment, so that each test sequence can intelligently impair all aspects of the UDP protocol.
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Product
Optics Test Systems
Contract Measurements And Services
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Optik Elektronik Gerätetechnik GmbH
Thanks to our very good laboratory equipment, we offer contract measurements for numerous measuring tasks. In the field of optics, measurement and testing technology, these are, for example, the parameters MTF, focal length, radius, contact dimension, focal length, geometric and optical parameters of cylindrical lenses. Others on request.
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Product
Test Handlers
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Boston Semi Equipment test handlers are designed for optimum production performance on your test floor.
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Product
Material Testing Machine
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Beijing TIME High Technology Ltd.
A device used to measure the physical and mechanical properties of materials.
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Product
Fuel Cell Test Systems
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Fuel Cell Test System is a complete test station for operation and measurement of PEM/DMFC fuel cells.
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Product
Multi-Channel Test Instrument
960B
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The 960B is a powerful multi-channel IP Telephony precision test instrument combining TDM, Ethernet and Analog interfaces and simultaneous test capability to comprehensively test and monitor Next Generation Networks in Real-Time.
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Product
PXI Signal Generators (Signal Sources)
Vector Signal Generator
Accelerate test throughput with fast, high-quality measurements optimized for RF or microwave design validation & manufacturing testIncrease test configuration flexibility with a PXI platform and license key upgradesReduce development time with easy integration of drivers and programming examples into test environments
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
(125×150×22mm) Single-Channel Full Function Standard Booster EDFA module
EATV5100-FM05
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Hangzhou Huatai Optic Tech. Co., Ltd.
The EATV5100-FM05 standard Booster EDFA module provides high power, high reliability, and superior optical performance in an industry standard form factor. This product enables deployment fo flexible, high-density optical networks, while reducing capital and operating applications' requirements. This module is ideal for today's highly dynamic networks and cost sensitive market. EATV5100-FM05 Full Function Booster EDFA Module adopts Standard Versions for Single Channel and Narrowband. The EDFA includes a cooling pump laser, input monitor and input isolator, output monitor and output isolator, and a reel of optimized erbium-doped fiber. These components are contained within a standard 125×150×22mm package.
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Product
Eclipse Test Development Environment
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The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Product
EV Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
5V cell equipment adopts Sinexcel innovative circuit design + high-speed DSP complex algorithm, the detection process supports multi-gear switching; The equipment integrates voltage, temperature, pressure and other auxiliary channels, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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Product
PXI ARINC 608A Switch Modules
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The matrix module is based on our proven BRIC format and can be specified as a 4 or 8 slot module. The module can be fitted with a combination of Resource Distributor and Bus Matrix Input daughter cards as required by the user. The maximum configuration is six Bus Matrix and two Resource Distributor cards fitted in a BRIC8 module.
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Product
Immunity Testing Systems
CIS Series
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The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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Product
PAT Testing Software
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How PAT test results are recorded and managed can be an important factor in the implementation of effective workplace electrical safety testing programs.
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Product
Accessibility Test Probes
TF-24 Series
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Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements.
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Product
Test Probes and Pins
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Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Pick And Place Test Handlers
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Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.
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Product
Multimeter with Cable Checker Phone Test Lan Wire Test
VA43
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Shanghai Yi Hua V&A Instrument Co., Ltd. CO.,LTD
Lan Telephone test multimeter: VA43 is a multimeter with lan wire test. phone test .cable check.
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Product
RF Functional Test Fixtures
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EMC Technologies’ design team has developed a variety of test adaptors and test stations for testing RF circuit assemblies and microwave sub-assemblies.
