Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
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Scanning Probe Microscopes
attoMICROSCOPY
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The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Scanning Probe Microscopes
SpectraView 2500
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* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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AFM-Raman for Physical and Chemical Imaging
LabRAM Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance.
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Advanced Stand-Alone AFM
SmartSPM
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The SmartSPM Scanning Probe Microscope is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes. With the SmartSPM zooming in from large up to 100 µm overview scans down to atomic resolution has become a reality. Its design has been specially developed to be capable of being seamlessly integrated with optical spectroscopies (SNOM, Raman, Photoluminescence and TERS/SERS techniques).
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AFM-Raman for Physical and Chemical Imaging
XploRA Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
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Create Topographic Profiles from SPM Images
TopoStitch
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topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
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Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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Scanning Probe Microscope
SPM-9700HT
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Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
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The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Standard 0.62 (18.00) - 5.40 (153.00) Probe
LFRE-39I15-5.4
ICT/FCT Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 50,000Overall Length (mil): 1,437Overall Length (mm): 36.50
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Standard 0.49 (13.89) - 2.50 (70.87) Battery Probe
CP-4T
Battery Probe
Current Rating (Amps): 10Average Probe Resistance (mOhm): 25Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 60Full Travel (mm): 1.52Recommended Travel (mil): 40Recommended Travel (mm): 1.01Overall Length (mil): 311Overall Length (mm): 7.90Overall Length Remark: Overall length does not include tail.
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High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1B-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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SP500X , 500 MHz, ±300 V, 10X Attenuation, Single-Ended Passive Oscilloscope Probe
783629-01
Oscilloscope Probe
The SP500X, or Multi-Contact Isoprobe IV - 10:1, is a standard passive probe with fixed 10x attenuation for oscilloscopes that provide 1 MΩ input impedance.
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Differential Active Probe, 500 MHz
DP0011A
Signal Probe
The Keysight DP0011A is the 500 MHz model of the DP001xA Series differential active probes. These probes provide the superior general-purpose differential signal measurements required for many of today’s high-speed power-related measurements such as motor drives, automotive differential bus measurements, and high-speed digital system designs.
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Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72U-4
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Standard 1.02 (29.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-62H-4-S
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1B-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25L-8
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Passive Probe, 10:1, 150 MHz, 1.2 M
N2841A
Oscilloscope Probe
The Keysight N2841A low-cost passive probe provides a 10:1 attenuation and features a high input resistance of 10 MΩ. The probe can be adjusted for low-frequency compensation and high-frequency compensation.
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Passive Probe, 10:1, 500 MHz, 1.2 M
N2843A
Oscilloscope Probe
The Keysight N2843A low-cost passive probe provides a 10:1 attenuation and features a high input resistance of 10 MΩ. The probe can be adjusted for low-frequency compensation and high-frequency compensation.
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Standard 0.30 (8.50) - 1.06 (30.00) Battery Probe
BIP-3
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 60Recommended Travel (mm): 1.52Mechanical Life (no of cyles): 250,000Overall Length (mil): 511Overall Length (mm): 12.98
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72J-7
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1Z1-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1P-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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SA1500X, 1.5 GHz, ±8 V, 10X Attenuation, Single-Ended Active Oscilloscope Probe
784256-01
Oscilloscope Probe
The SA1500X is single-ended, active voltage probe that is used for many different high-speed measurement applications. The probe is powered by an included auxiliary power supply that is internationally compatible and certified. You can use it with oscilloscopes that provide 50 Ω input impedance.
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AC / DC Current Probe, 100 MHz, 30 Arms
N2783B
Oscilloscope Probe
The N2783B current probe is an accurate and reliable solution for measuring AC and DC currents. Using a hybrid technology that includes a Hall effect sensor and an AC current transformer, the probe provides accurate measurement of DC or AC currents up to 30 Arms continuous.
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1Z1-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25T79-16
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1Z1-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
