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Showing results: 7711 - 7725 of 8115 items found.

  • Nuclear Event Detectors

    DDC Connectivity Power Controls

    DDC's radiation-hardened, hybrid, Nuclear Event Detectors (NED) sense ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20ns. The active low Nuclear Event Detection signal (NED) is used to initiate a wide variety of circumvention functions, thus preventing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps.

  • 2 Channel IV Analyzer / Source Monitor Unit

    E5263A - Keysight Technologies

    Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.

  • OTDR Tester

    M-OTDR-502 - Fuzhou Metricu Technology Co Ltd

    Optical Time Domain Reflectometer Wavelength 1310 / 1550nm, max test range 150KM, Dynamic range 28 / 26dB, SOR standard data saving, create PDF/EXCEL format report, stable laser source, support CW/270/330/1000/2000Hz, Test fiber's length, loss, attenuation parameters and event map, locate connection point/fusion point, Automatic analysis of various linkers/fusion points, easy analyze of various events,Support saving curves number ≥30000pcs, loss test, detect the optical or optical components loss value, etc. Test IP camera, optical power meter, visual fault locator, RJ45 cable TDR test, cable tester, cable tracer, etc.

  • 10 Function True RMS Multimeter

    Extech EX365 - Extech Instruments Corporation

    The EX365 is a Compact Industrial True RMS MultiMeter with a Built in Non Contact Voltage Detector. Featuring highly accurate True RMS measurements, LoZ for the prevention of false readings caused by ghost voltages, .5% basic accuracy, a 1000V AC/DC volt range, resistance up to 40MΩ, continuity beeper with visual alert, smart data hold, peak hold, auto power off with disable, relative mode for capacitance zero and offset adjustment. Additionally, the EX365 excels in frequency and capacitance measurements as well as commercial applications which require AC/DC current measurements from 1 mA to 10A. Complete with test leads, 9V battery, holster with tilt stand and built-in magnet.

  • Memory

    Renesas Electronics Corp.

    Renesas is renowned for its product lifetimes, and our memory products are no different. Our wide range of low power SRAM products provide high reliability, stable supply and long lifetime support often not found in these devices, making them ideal for industrial designs. Renesas’ ultra-fast QDR™ (Quad Data Rate) SRAMs are ideal for next-generation high bandwidth communication systems that require memories capable of very high operating frequencies combined with low latencies and full cycle utilization. Our EEPROM realizes high speed, low power consumption and a high level of reliability by employing advanced MONOS memory technology, a CMOS process and low voltage circuitry technology.

  • LPDDR3 178-ball BGA Interposer For Logic Analyzers

    W3301A - Keysight Technologies

    The W3301A LPDDR3 rigid BGA interposer for LPDDR3 178-ball DRAM enables capture of simultaneous read and write traffic at data rates in excess of 1866 Mb/s. E5406A Soft Touch probes and U4201A cables connect the W3301A LPDDR3 BGA interposer into the U4164A logic analyzer module. The W3301A LPDDR3 178-ball rigid BGA interposer allows signal access to the LPDDR3 signals critical to your debug and validation effort through a U4164A logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR3 178-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR3 signals.

  • Digital Multimeter and Phase Rotation Tester

    3000 MPR - Standard Electric Works Co., Ltd

    ● 4000-count LCD● Auto ranging● Voltage, Resistance, Current, Continuity, Diode measurement● Can measure Resistance up to 200.0 Mohm● Checks a wide range of 3-phase power sources (80~750VAC)● Phase Rotation indication : clockwise and counter-clockwise on LCD● The LCD will show AC voltage between phases and Phase Rotation● Wide range for capacitance test: 0~40000μF(40.00mF)● REL / Auto-Zero function● MAX /MIN function● VAHz function● Frequency : 40.00 MHz● Data hold function● Over range indication● Low battery detection● Auto power off in 15 minutes● Convenient stand for viewing● Comply with EN 61010-1, CAT III 600V for the range of 600V AC/DC

  • PCIe-7857, Kintex-7 160T FPGA, 1 MS/s, DRAM Multifunction Reconfigurable I/O Device

    786458-01 - NI

    PCIe, Kintex-7 160T FPGA, 1 MS/s, DRAM Multifunction Reconfigurable I/O Device - The PCIe‑7857 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7857 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.

  • IC-3121, 1.91 GHz Intel Atom Quad-Core Processor, 2-USB3 Port Industrial Controller

    784961-01 - NI

    1.91 GHz Intel Atom Quad-Core Processor, 2-USB3 Port Industrial Controller - The IC‑3121 is a compact and rugged industrial controller that withstands the harsh environments common in automation, supervisory control, distributed control, and industrial embedded OEM applications. The IC‑3121 offers two USB3 ports with dedicated bandwidth, FPGA-based I/O capabilities, and network connectivity for distributed control applications. The advanced features include the ability to synchronize image inspection results with industrial I/O and configure hardware-timed network triggers to trigger camera acquisition, motion control, or data acquisition. You can use the advanced FPGA personality that is shipped with the system or customize the FPGA functionality using the LabVIEW FPGA Module.

  • cDAQ-9132, 1.33 GHz Dual-Core Atom, 4-Slot, CompactDAQ Controller

    783339-01 - NI

    1.33 GHz Dual-Core Atom, 4-Slot, CompactDAQ Controller - The cDAQ‑9132 controls the timing, synchronization, and data transfer between C Series I/O modules and an integrated computer. It includes Intel Atom dual-core processing and 16 GB nonvolatile storage for data-logging and embedded monitoring. You can choose between running Windows or NI Linux® Real‑Time. The cDAQ‑9132 offers an array of standard connectivity and expansion options, including SD storage, USB, Ethernet, RS232 serial, and trigger input. You can combine the cDAQ‑9132 with up to four C Series I/O modules for a custom analog I/O, digital I/O, counter/timer, and controller area network (CAN) measurement and logging system.

  • cDAQ-9132, 1.33 GHz Dual-Core Atom, 4-Slot, CompactDAQ Controller

    783338-01 - NI

    1.33 GHz Dual-Core Atom, 4-Slot, CompactDAQ Controller - The cDAQ‑9132 controls the timing, synchronization, and data transfer between C Series I/O modules and an integrated computer. It includes Intel Atom dual-core processing and 16 GB nonvolatile storage for data-logging and embedded monitoring. You can choose between running Windows or NI Linux® Real‑Time. The cDAQ‑9132 offers an array of standard connectivity and expansion options, including SD storage, USB, Ethernet, RS232 serial, and trigger input. You can combine the cDAQ‑9132 with up to four C Series I/O modules for a custom analog I/O, digital I/O, counter/timer, and controller area network (CAN) measurement and logging system.

  • 2 GHz Dual 1:4 RF Mux, 75 Ohm Module for 34970A/34972A

    34906A - Keysight Technologies

    The Keysight 34906A RF multiplexer module for the 34970A/34972A Data Acquisition/Switch Unit offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation. The RF multiplexers are arranged as two independent 1 x 4 multiplexers, each with a common shield and a switched center conductor. Connections can be made directly to SMB inputs with 2 GHz usable bandwidth, or to the BNC-to-SMB adapters provided with 1 bandwidth. Multiple banks may be cascaded together for applications requiring even larger topologies--create a stubless 16:1 multiplexer in a single frame.

  • Test Benches

    Atec, Inc.

    Atec has made test equipment throughout all of its 65-year history. Test benches for aerospace and energy uses represent a significant segment of our experience. Atec has produced test benches involving hydraulics, mechanicals, electromechanicals, electronics, pneumatics, motors, and digital automation. Atec test benches have performed for challenging measurements, factory production, problem analysis and component overhaul scenarios. Today, complex test benches have capable data acquisition, control and communication systems integral in their electronics. Atec’s ADAQ™ system, based on COTS components and software, is proven and popular in test bench applications. DCUs, ECUs, FADECs and earlier analog or mechanical control units are easily interfaced.

  • Test Bench for AC Compressors

    MS111 - MSG Equipment

    The test bench is intended to test AC compressors of wide range of vehicles on R134a refrigerant. The equipment detects failures of a vehicle unit before its mounting in a car, whether it is a remanufactured, repaired unit or a used one. In the process of testing, data is shown on LCD display. It gives an opportunity to follow testing results realtime, save and/or print them due to software special features. Unit fixation mechanism is very flexible: a compressor can be easily fixed, no matter what kind of fittings it has. Units with electromagnetic clutch or electromagnetic valve can be tested both separately and simultaneously. Peculiar features of electric commutation are considered, connection polarity is identified automatically, indicator on the control panel indicates on presence of a diode in a circuit.

  • AC and DC Voltage Divider

    WAFRC - Wuhan Sangao Electrical Test Installations Limit Co.

    AC and DC voltage divider, Mainly composition by the high stability of passive resistance capacitance voltage divider and high precision digital kV table. The divider is passive resistance capacitance, Connected digit kV meter by coaxial cables. Which can be directly read out the AC, DC data measured from the table. This instrument has high precision, convenient operation, can be used instead of the electrostatic voltmeter. Device and the measuring line, power line, manual loaded box in light aluminum alloy, easy to carry and use. This equipment is mainly used for AC and DC high voltage measurement, and is suitable for power system's field measured and Institutions of higher learning laboratory's AC and DC high voltage measurement.

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