Transistor
damage check for polarity, gain (5-1000 volts), and shorts.
See Also: Field Effect Transistor, NPN Transistor, GaN
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Product
Single Head Component Testers
34XX
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Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
