Predictive Analysis
See Also: Data Analytics, Predictive Analytics, Simulation Software, Perception
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Impedance Analysis
S96041B
Make impedance analysis measurements of Surface Mount Device (SMD) components on the E5080B vector network analyzer with 16198A-010 10 GHz SMD test fixture.
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Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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Quadrupole Mass Spectrometer for Residual Gas Analysis
RGA Series
Systems for the examination of components present in a vessel or evolved from a process. HALO RGA – for residual gas analysis. 3F Series RGA – triple filter mass spectrometers for analytical applications. 3F-PIC – pulse ion counting detection for fast event studies. Measures the concentration of gases and vapours in real time.
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PathWave BenchVue Advanced Power Control And Analysis
BV9201B
The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Solder Paste Analysis
SPA1000
The SPA 1000 also introduces new process control capability by accurately measuring the suitability of the solder paste prior to its implementation on the production line. It achieves this by determining the "Open-Time" for the paste. It also performs the Slump Test and both of these methods provide a "Go/No Go" answer in less than 30 minutes to ensure minimum delay for the production line.
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Universal Partial Discharge Measurement and Analysis System
MPD 800
Our MPD 800 universal partial discharge (PD) measurement and analysis system represents the next generation of our widely-used and innovative MPD PD testing technology. Enhanced and newly-added hardware and software features ensure highly-sensitive multi-channel PD measurements for reliable, industry-standard PD testing on a variety of electrical equipment and components.
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Probing & Analysis Adapters
No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Scanning Electron Microscopy (SEM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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System Grounding & Earthing Analysis
ETAP's system grounding & earthing foundation automatically detects the system earthing configuration based on source and transformer grounding or earthing type selection. The resulting earthing types are displayed both on the one line diagram and for the various connected cables.
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Analysis
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Spectrum Analysis For P50xxB Up To 6.5 GHz
S970901B
Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Sound and Vibration Analysis
Compact Analysis
Compact Analysis is an ArtemiS SUITE module which is focused on the basic functions and the ideal tool for tasks that only require a few clicks.
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Blade Timing Analysis Software
Blade Timing BT
APEX Turbine Testing Technologies
BT is a data analysis software product for post-processing tiptiming data from laser-based and capacitance-based tiptiming systems (also known as NSMS).
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Real-Time Analysis up to 255 MHz, Optimum Detection, Multi-touch
N9041B-RT2
See, capture, and understand elusive signals as short as3.51 s with 100% POI and a complete set of advanced triggers, up to 110 GHz View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 VSA software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Safety Analysis
Ensure System Safety and Cybersecurity. Dramatically decrease analysis efforts with efficient application of quality, safety, reliability and cybersecurity analysis methods at the system, item, software, hardware and PCB levels.
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Failure Analysis – Materials
Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Automated Routine Analysis of Waters by Purge & Trap Concentration
AQUATek LVA
The AQUATek LVA is a full automation solution for routine analysis of waters by purge and trap concentration. It utilizes a fixed volume loop that is filled with liquid sample, internal and/or surrogate standards are added, and then the sample is transferred to the Lumin or Stratum PTC. Upon completion of the purge step by the concentrator, the AQUATek LVA then initiates a clean up cycle where the sample loop and concentrator sparger are cleaned with 90o C water via the two-stage water heater.
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Veracode Dynamic Analysis
DAST
Identify and Fix Critical Runtime Vulnerabilities in Web Applications and APIs.* Identify Vulnerabilities in Runtime Environments. Simultaneously scan hundreds of web apps and APIs to find vulnerabilities quickly - including pre-production and staging environments behind a firewall.*Prioritize and Fix Flaws Quickly, A <5% false positive rate allows teams to focus on the vulnerabilities that matter. Detailed, actionable remediation guidance means flaws are fixed faster.*Contribute to a Successful DevSecOps ProgramDynamic scans can be viewed in the Veracode Platform alongside other application security tests, providing multi-faceted insights into the entire security program. Insights and analytics can be used to further improve your DevSecOps program.
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Gas Analysis
HPR-20 EGA
The Hiden HPR-20 EGA gas analysis system is configured for continuous analysis of evolved gases and vapours from thermogravimetric analysers, TGA.
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Strain Measurements and Experimental Stress Analysis
Experimental structural testing using strain gauges is necessary in a wide range of applications from airframes and sub-assemblies down to individual components such as turbine blades, satellites, wind turbines, buildings, bridges and many others. These tests enable the engineers to compare the acquired data with the predicted results from the design calculations.
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Spectrum Analysis For P50xxB Up To 9 GHz
S970902B
Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Data Analysis & Graphing Software
Origin
Origin is the data analysis and graphing software of choice for over half a million scientists and engineers in commercial industries, academia, and government laboratories worldwide. Origin offers an easy-to-use interface for beginners, combined with the ability to perform advanced customization as you become more familiar with the application.
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Device Parameter Analysis
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Structural & Stress Analysis
Structural analysis is critical because it can determine cause and predict failure – evaluating whether or not a specific structural design will be able to withstand the external and internal stresses and forces expected for the design.
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Manual Label-Free Molecular Interaction Analysis Machine, Flexible Research Platform
OpenPleX
Designed to meet the demands of biologists, biochemists and biophysicists, the OpenPlex is a flexible surface plasmon resonance imaging system.OpenPlex is your companion for the development of label-free and multiplexed bio-assays and molecule detection. It is a robust and compact system designed for simple use and high versatility. Its open format, dedicated sensor chips and manual operation enable numerous types of experiments to be explored without compromise, covering chemistry, biochemistry, physico-chemistry and biomolecular interactions.
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Community Noise Prediction Software, Version 2
SPM9613
A low-cost computer program for analyzing community noise and sound propagation emitted from a variety of noise sources. The engineering software is based on the ISO 9613 parts 1 and 2 standards. SPM9613 provides calculations at specific field points (listeners) and predictions of A- and C-weighted sound level contours as well.
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Mercury Porosimetry Analysis
AutoPore V
The AutoPore V Series Mercury Porosimeters can determine a broader pore size distribution more quickly and accurately than other methods. This instrument also features enhanced safety features and offers new data reduction and reporting characteristics of your material.
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4G Analysis & Drive Studies
Berkeley Varitronics Systems, Inc.
Portable, calibrated test transmitters and receivers to simulate and analyze cellular 4G LTE, CDMA, UMTS and WiMAX base station coverage for drive study engineers and technicians.
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Residual Pollution Analysis System
Cleanalyzer
The Cleanalyzer is a high-end analytical system designed to examine particles on filters – a key procedure in performing reliable and reproducible evaluation of component cleanliness. High-resolution, optical zoom system (15µm and 5 µm version. High-resolution, fixed magnification optical system (35µm version).
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Sensor Scene Modeling and Analysis Software
INSSITE
INSSITE is a sensor scene modeling and analysis environment. Different sensor types and modalities, spanning radar (synthetic aperture radar [SAR], ground moving target indicator [GMTI], detection and ranging, radio frequency [RF] communications), visible/infrared (passive electro-optical/infrared [EO/IR], laser radar [ladar], thermal IR), can be evaluated against high fidelity scenarios constructed by the user.
