Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Lan Digitizer / Oszilloscope With 16 Bit, 4 Channels 200 MS/s Up To 8 GS Memory
Razor-X
The GaGe series of Faceless Connected Instruments (FCiX) provide test and measurement professionals new options for integrating high resolution, multi-channel digitizers into Ethernet and LAN enabled measurement systems. The applications served include manufacturing test, automotive test, remote communications monitoring, multi-site semiconductor test, and other solutions where a lightweight but powerful, multi-channel, independent digitizer system is required.
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PCIe-7841, Virtex-5 LX30 FPGA, 200 kS/s Multifunction Reconfigurable I/O Device
781100-01
Virtex-5 LX30 FPGA, 200 kS/s Multifunction Reconfigurable I/O Device - The PCIe‑7841 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe...show more -
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Turns Ratio Meter 3 Phase Rack
TR-MARK III R 250V
The TR-MARK III R 250V is the successor of the famous TR-MARK III R. Besides an extended test voltage up to 250V, it offers new features and increased accuracy to make it a perfect system. A color LCD with back lighting and touch screen increases handling and user comfort. Two USB interfaces make it easy to store measurements on external storage devices and transfer easily to a personal computer or download nameplate data of xformer to test.
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5 Gas Industrial Combustion Analyzer
K9206
UEi Test & Measurement Instruments
K9206 is an Industrial Flue Gas Analyzer with wireless handset and built to test combustion systems over 10,000 MBTU/h with high concentration gas levels for extended durations. The K9206 is easily customized to measure 5 toxic gases simultaneously, 6 with direct CO2 measurement or order a preset sensor combination.
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PXI Resistor Module 4-Channel 1R to 127R with SPDT
40-293-112
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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X-Scan U
X-Scan U series based on the novel digital platform improves image quality, increases maximum scanning speed and saves the overall system cost of industrial in-line and off-line nondestructive testing (NDT) of tires. X-Scan U series is an enhanced product family of U-shaped X-ray line cameras developed and optimized specially for high-speed digital tire inspection utilizing panoramic X-ray sources.
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Lifecycle Test System
Model 933
The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
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Multi-Wavelength Meter
86122C
With an absolute wavelength accuracy of 0.2 ppm and 0.15 ppm differential accuracy, the new Keysight 86122C Multi-Wavelength Meter belongs in the top class of wavelength meters available for optical communication testing. Its wavelength range of 1270 to 1650 nm covers all fiber-to-the-home, metro and long-haul transmission systems. The instrument can measure the spectra of up to 1,000 laser lines at once, which is more than sufficient for fully populated dense-wavelength-division multiplexed systems (DWDM).
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron® TestMaster AT3 and AT3+ Automated Testing System utilizes an innovative design for the automatic tensile and/or flexural testing of plastic specimens. Meeting the testing requirements of ASTM D638 and D790, ISO 527 and 178, as well as other testing standards, this system offers many of the benefits of our robotic AT6 systems, but in a smaller footprint.
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802.11ad & ay (WiGig) Test System
IQgig-IF
When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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Low Cost / Used Test Systems
For the last 30 years, Terotest has offered a range of used and refurbished ATE Systems, along with all associated spares at very competitive prices. From completely configured systems to the smallest replacement parts Terotest holds a comprehensive range for some of the largest ATE manufactures in the world. See below for more details.
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MEMS Sensor Simulation
SimSENSOR
Performance testing of sensor fusion in MEMS inertial and multi-GNSS navigation systems. SimSENSOR extends the capabilities of Spirent’s multi-GNSS simulators by simulating MEMS sensor outputs on a common trajectory with the simulated GNSS RF signals. The simulated MEMSs sensor outputs include user control of representative noise and errors (bias/drift).
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PCI High Density Pecision Resistor Card, 9-Channel, 3Ω To 6.97kΩ
50-298-030
The 50-298-030 is a high density programmable resistor card with 9 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Switches
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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Partial Discharge Test System
TPP
The Partial Discharge Test System type TPP is used for non-destructive insulation and quality testing of electrical components (for example according VDE 0110-1, EN 50178, IEC 60270 and IEC 60060).
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Metallic Pendulum Impact Testing Machine
JB-S Series
Jinan Testing Equipment IE Corporation
JB-S series superior metallic pendulum impact testing system is strictly designed according to international standards ISO148, ASTM E23 and EN10045. The pendulum impact testing system is mainly used to determine the anti-impact capability of metal materials under dynamic load and is capable of doing a large number of of impact tests continuously. Adopting the important intelligent programmable logic controller (PLC) system, the pendulum impact testing system can realize the test process control ...show more -
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PXI Precision Resistor Module 4-Channel, 1.5 to 925
40-297-121
This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI 10W Programmable Resistor Module, 1-Channel, 1Ω to 122Ω
40-253-112
The 40-253-112 is a programmable resistor module with 1 channel which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Noise and Vibration Testing
Electronic Systems of Wisconsin, Inc.
ESW's unique Noise & Vibration Test Systems come fully equipped with the latest industry features. The on-screen operator display in our testers make it easy to set-up, read, track and record your noise or vibration information. We work directly with you to determine the best solution that will work for your application. Our data logging make sure that important data is stored and available for download for future reference. ESW's design engineers work to make sure the testing interface is easy for your operators to use. We work closely with our customers to make sure that your unique testing needs are met. Please see the slideshow below to see some of our Noise & Vibration Testers.
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Multiport Coaxial Switch, DC to 26.5 GHz, SP6T
87106C
The Keysight 87106C multiport switch improves insertion loss repeatability and isolation, which is necessary for higher performance test systems. The repeatability and reliability of this switch is vital to ATS measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. The Keysight 87106C terminated multiport switch provides the long life and reliability required for automated test and measurement, signal monitoring, and routing appl...show more -
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Retractable Cable + Automotive Voltage Tester With Magnet Adsorption
3703
Peaceful Thriving Enterprise Co Ltd
*Check on 6, 24 and 48V DC systems.*Used as an extension cord for testing electrical circuits in cars , trailer, boats.
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Digital Image Correlation (DIC) Measurement System
EduDIC
EduDIC is a complete Digital Image Correlation (DIC) measurement system, designed as a simple and convenient educational training tool for academic courses in experimental solid mechanics. This easy-to-use system allows academic instructors to effectively present the optical measurement technique of DIC for materials testing to the engineers and scientists of tomorrow.
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Multifunction Substation Test Set
STS 5000
STS 5000 is a multifunction substation maintenance & commissioning test system for current, voltage and power transformers designed to perform primary tests requested in substations commissioning. It allows to perform accurate tests on CTs, VTs, PTs and ground grid.
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Automated Thermal Stress System
ATSS Series
Thermotron's Automated Thermal Stress Systems (ATSS) facilitate extremely rapid product temperature change rates in a space-saving, self-contained design that accelerate a Thermal Stress test. Thermotron's ATSS chambers meet the latest MIL-STD 883E and MIL-STD 202F thermal shock specifications as well as JEDEC and IPC test methods. ATSS chambers are capable of the following: Rapid thermal shocking, Accelerated product stressing, Controlled thermal cycling in a self-contained, compact design. Wit...show more -
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512-Crosspoint, 1-Wire PXI Matrix Switch Module
PXIe-2531 / 780587-31
512-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXIe‑2531 is a high-density PXI matrix switch module built to serve high‑channel‑count automated test systems. Featuring compact reed relays with switching speeds up to 2,000 cycles/s, the PXIe‑2531 is designed for low‐current, high‐speed switching. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Cone Penetration Tester
DRK8096
Shandong Drick Instruments Co., Ltd.
Determination of compliance with national standards GB / T26991, were compact design, LCD display, automatic data collection and the corresponding statistical calculations, measurement report printout.It can connect the PC output data.The entire testing process is very simple, in full compliance with the provisions of the State Pharmacopoeia. Accurate measurement results, which has good reproducibility, stability of the system.
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O.N.E. Platform
O.N.E. platform allows to connect any HW component to any SW component independently of a vendor. With this data distribution and scheduling framework the user can build HW/SW architectures of any complexity. „Testing & Validation Phase“ and „Real World Deployment“ are covered by the O.N.E. technology. This results in ONE single environment for development and for productive systems at big scale.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Electrolyzer Test Systems
Advanced Test System for Research & Development of PEM Electrolyzers
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3U CPCI 32-bit Test Extender
Measurement and testing of CompactPCI® assemblies in the 3U Euro-board form factor is greatly facilitated by the use of this test adapter. Easy access to the DUT is guaranteed because the adapter has plug-in connections on 3 sides. The Modern BRIDGE design permits up to 3 CompactPCI® cards and one standard PCI® card to be inserted in one CompactPCI® slot. This allows system developers to implement a large number of tests with little effort and enables you to achieve vital time to market.
