Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Uniload Voltage Transformer Test Set
2J6
The Type 2J6 Knopp Uniload Voltage Transformer Test Set consists of three major parts: When the Knopp Precision Transformer in the 2J6 set is compensated for, and used with, a secondary burden of 15 volt-amperes, for example, the ratio of this precision transformer is well within 0.02% and the phase angle is well within 2 minutes. The transformer, in common with other Knopp Precision Multirange Transformers, is wound so that it has practically the same ratio and phase angle accuracy on all ranges.
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AFDX ® / ARINC 664 Test And Simulation PMC Module
PMC-664
*Supports IEEE 802.3 10/100/1000 Mbit / s full duplex Ethernet connections*Uses SFPs to support both electrical and optical interfaces*Half-size PCI / PCI-X modules*Simulates multiple AFDX® / ARINC 664 end systems*Standard Ethernet processes simultaneous to AFDX® / ARINC 664*Up to 128 output VLs and 512 input VLs*Upper layer protocol handling (ARINC 653, UDP, IP) managed onboard*DMA for high data rate applications*Windows XP / 7, Linux, and LabVIEW Real Time Drivers & APIs (others on request)Easy to use tool for configuring A*FDX® / ARINC 664 end systems (XML based)
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ARINC 429 Test & Simulation Interface for VME
VME-429
Avionics Interface Technologies
4, 8, 16, 32, or 64 Software Programmable Tx/Rx Channels - Programmable High/Low Speed Operation - Concurrent operation of all Tx/Rx Channels at high data rates - Full Error Injection & Detection - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - IRIG-B Time Code Encoder/Decoder for Data Correlation - ANSI Application interface supporting C, C++, C#, and .net development - Device driver support: Windows, Linux, & VxWorks (others on request) - Designed for extended temperature operations - 64-bit VME - Interface (VME master & slave capability) - Front Panel and Rear I/O (P2) Available
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Ethernet Instrument & System Control Software Application
F-SIM-DCE
Avionics Interface Technologies
Simulation and Data Capture application for use with AIT’s Dual Channel Ethernet (DCE) and 10G Ethernet Instruments.
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Application Specific LC Systems
Co-Sense for BA (Bio-sample Analysis)
Automate sample pretreatment for higher productivity.Innovative, efficient analysis of bio-samples.
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4, 8, 16 Or 32 Channel ARINC429 Test And Simulation Modules For VME (6U)
AVC429-x
Integrated modular solution by using the AMCX429-x PMC cards installed on AIM’s AVC-2 Generic VME64x (6U) carrier card.
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Power Supply Rack For Climatic Cycling Test
One essential part of the module quality testing according to IEC 61215 is the thermal cycling test (MQT 11) and humidity freeze test (MQT 12). Besides the environment simulation in the climate chamber, it is necessary to energize the PV modules during specific parts of the test.
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Vision System With LGA1151 Socket 7th/6th Gen Intel® Core™ I7/i5/i3 & Celeron®, Intel® Q170, 4 PoE, 4 USB 3.0, And Real-time Vision I/O
IPS962-512-PoE
The IPC962-512-PoE meets the increasing requirements for maximum quality and flexibility in modern production plants. It features flexible expansion capacity, camera communication interfaces, real-time vision-specific I/O with microsecond-scale and LED lighting control. This machine vision controller is powered by the LGA1151 socket 7th/6th generation Intel® Core™ (codename: Kaby Lake/Skylake) and Celeron® processors (up to 65W) with the Intel® Q170 chipset. The IPS962-512-PoE comes with a full ...show more -
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Three Phase Closed I-P Link Energy Meter Test Bench Type KP-S3000-B
Bofa Instrument & Equipment Co., Ltd
Three phase closed I-P link energy meter test bench, type KP-S3000-B, is designed for testing three-phase energy meters, especially for testing Closed I-P Links three-phase energy meters. It is an ideal testing equipment for energy meter factory or R&D institute. All the testing procedures can be automatically operated by PC or by Keyboard manually.
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Double-deck High and Low Temperature Environmental Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell’s Double-deck High and Low Temperature chamber was designed to test battery cell combined with charge and discharge equipment, and also available to thermal test for small products and components.
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IEC60669 Pendulum Impact Test Machine
CX-BC1
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60669 Pendulum Impact Test Machine
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SMA-Male to N-Male Test Cable
C50SMNM
Our 2N-to-SMA test cable is made to ideally suit our larger line of vector network analyzers. The C50SMNM operates at a frequency of 18000 MHz and is compatible with select family lines of vector network analyzers including our Compacts, Full Size, and Cobalt analyzers.
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DisplayPort 2.0 Receiver Test
N5991DP2A
Use the Keysight N5991DP2A DisplayPort 2.0 Receiver Test Software to test, debug and characterize your DisplayPort Sink products maximizing the usage of your test instruments.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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PCB Test And Design-For-Test Services Group
ntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Choosing Intellitech Test Services can help you lower the risk of adopting a new Design-for-Test methodology or speed your product to market when you need to deploy a test solution quickly.
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Power Supply System
PL516
The PL516 is a high sophisticated, high density, programmable 16-channel with full redundancy low-voltage power supply system. Using the remote monitoring and control features it can be used to supply a large numbers of external load- channels with high power consumption also over long distances.
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Video-Endoscope Systems
Documentation Unit + High Power Light Source + probe incl. Control and lens The modular systems can be combined and endlessly expandable.
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USB-C® Tx & Long Chnnel Rx Precet. Test Fixture
AUT20044 Rev:B0
The original Intel USB-C 3.1 Tx Test Fixtures includes two types of fixtures, UFP and DPF. Allion Pre-Cert Test Fixture integrates functions of the two fixtures into an one-board solution, eliminating the hassel to frequent switching of two fixtures.
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Fused Test Probes with Silicone Test Leads
AL-57FL
Standard Electric Works Co., Ltd
● AL-57FL is an ideal tool which shows the indication of live voltage even with blown fuse.● 2 replaceable fast-acting fuses are built-in. The specs of the fuses are 1000V, 11A with internal rating of 20kA AC/DC.● Provide additional testing protection.● Help to prevent a possible mis-indication when there is voltage present.● CAT III 1000V, CAT IV 600V, 10A with protective cover.● 2mm probe tips, removable 4mm brass caged banana probe tips are also included.● Include High-qu...show more -
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Semiconductor Test Hardware Solutions
A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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Automation And Validation Of ECU Tests
ECU-TEST
Softing Automotive Electronics GmbH
Automotive Electronics - ECU-TEST is the universal test automation ECU-TEST was designed for test automation and for the validation of ECUs. Standard test tools are already integrated and can be used together in tests. ECU-TEST is used to design, realize, run and evaluate tests.
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Step-Top Box Test Platform
Promptlink Communications, Inc.
Promptlink’s Set-Top Box Test Platform (STBTP) is a complete functional testing solution designed for the highest volume testing requirements. With only the highest-quality, highest-speed components, STBTP is the ultimate tool for accurate, high-demand testing of set top boxes. With support for satellite, DAC-based and DVB-based set-tops, STBTP is the solution that never leaves you unsatisfied.
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21.5" 1920 X 1080 Onboard Passenger Information Display System
ARD-R2150
- EN50155 compliant with cabin temperature OT1 level / EN45545- Brightness: 500 /1500 nits (BOM option)- NXP i.MX8M Plus / Intel Atom x7433RE Processor- Supports 2x M12 D-code LAN 10/100Mb- Wide range DC 24-110V power input- Auto-dimming for enhancing readability and eco-friendliness- IK grade glass/Anti-glare/Anti-reflection/SRF surface coating (optional)- ADLINK PIDS software with EGiFlow for on-site configurations (optional)
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High Current IC Test
C.C.P. Contact Probes Co., LTD.
Our patented probe design allows very high currents of up to 5 Amps
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Autoranging System DC Power Supply, 200 V, 70 A, 5000 W, 400 VAC
N8941A
The Keysight N8900 Series is a family of 5 kW, 10 kW, and 15 kW autoranging, single-output power supplies available in 14 different voltage, current, and power combinations and either 208 VAC or 400 VAC (28 total models).
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Facility & Asset Management System
Insight
Today’s environment confronts lab managers in new, challenging ways. The current regulations demand increasingly complex test procedures that require more time and resources to execute, which counteracts the goals to improve productivity and reduce costs. Therefore, lab managers need to maximize the test cell availability by continual awareness of the current situation in their facility. They must ensure the equipment is fully functional, meets all mandatory quality standards and regulations, and is up to date with all service and maintenance requirements.
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Medium-size Compact Antenna Test Range
H-Series CATR
The H-Series CATR chamber provide complete 3D performance assessment for 5G OTA devices and antennas including gain, efficiency, directivity, polarization and beam characteristics for frequencies from 3 up to 110 GHz, capable of supporting forthcoming 5G Sub-6 GHz (from 3 to 6 GHz) and mmWave (24 to 110 GHz) standardized testing including TRP/TIS, EIRP, EIS, IBB and emissions in accordance to 3GPP TR38.810 and TR37.842.
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Vehicle Mount Cable Fault Location System
Weshine Electric Manufacturing Co., Ltd
VS2088Plus Built in Booster And Capacitor In Vehicle Underground Cable Fault Test Device
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Advanced Power System - Dynamic DC Power Supply, 20 V, 50 A, 1000 W
N7951A
The N7900 Series dynamic DC power supplies are designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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Upstream-Measurement-System
AMA 310 UMS & VAROS 107
This system combines the KWS devices AMA 310/UMS and VAROS 107 to a high-end monitoring system for the return path frequency range. An AMA 310 in a 19-inch version (3.5 RU) with UMS module is used in the headend, in the field the CATV handheld VAROS 107 is the counterpart.
