Gravity Handler

tri-temp from -55 to +175 °C (+200 °C on request)
fast and reliable kit exchange for SO and MLF/QFN packages
throughput up to 28,000 uph
contacting: standard, high frequency and high power Kelvin
tube and metal magazine loading and unloading
bowl feed loading and bulk unloading
installed MT99x8 base: more than 1.000 systems

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Semiconductor Test Handlers

Xcerra Corp.

Our broad portfolio ensures the most-efficient solution for your test application, including leaded and leadless devices, singulated packages and packages in strips, tri-temp test and MEMS test. We offer optimized performance with our fast and accurate systems.Striving to offer the best cost of test, our handlers are designed to meet the requirements for best return on investment, highest efficiency and maximum productivity.

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Tri-Temp Test Handling

MT2168 XT - Xcerra Corp.

innovative, extremely scalable architecturesimplified operations and auto self-teaching processeshigh throughput for the entire temperature rangesproven temperature performance with scalable temperature test capabilitiesadvanced plunging for best first pass yield

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Tri-Temp Pick and Place Handler

MT9510 XP - Xcerra Corp.

up to 8 contact sitestri-temp from -55 °C to +175 °Ckitable system for QFP, BGA, QFN and other packagesindex time 0.38 secthroughput up to 5,300 uphcontacting: standard, high frequency and Kelvinoutstanding temperature performanceinstalled MT9510 bases: more than 800 systems

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High Parallel Tri-Temp Pick and Place Handler

MT9510 x16 - Xcerra Corp.

up to 16 contact siteoutstanding temperature performancetri-temp from -55 to +175 °Ckitable system for QFP, BGA, PGA, QFN and other packagesadvanced, scalable ESD protectioncontacting: standard, high frequency & Kelvinthroughput up to 5,300 uphinstalled MT9510 base: more than 800 systems

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High Parallel Test of ICs and Sensors

InStrip® - Xcerra Corp.

temperature range: -40 °C +125 °Cpanel exchange time < 3,5 sindextime < 250 msmassive parallel testing capabilitylarge soak capacityslotted input and outputconversion in less than 15 minutesmaximum contacting force 4000 N

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Xcerra Test in Carriers

InCarrier® Process - Xcerra Corp.

loading into strip-like device carriers with Xcerra loading equipmentsupports standard transportation media of the backend processleverages Xcerra InStrip for singulated packagesoffers all features of the standard InStrip set-upunloading into final packaging mediafull traceability

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High Speed Loading for Test in Carriers

InCarrier Loader plus - Xcerra Corp.

up to 16,000 uphfull device traceabilitystandard SEMI mapping interface G84 or E142integrated loading quality controlcarrier damage control

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Gravity Handler

Semiconductor Test Handlers

Tri-Temp Test Handling

Tri-Temp Pick and Place Handler

High Parallel Tri-Temp Pick and Place Handler

High Parallel Test of ICs and Sensors

Xcerra Test in Carriers

High Speed Loading for Test in Carriers