Advanced Low-Frequency Noise Analyzer

E4727A - Keysight Technologies

The E4727A Advanced Low-Frequency Noise Analyzer enables fast, accurate and repeatable low-frequency noise (LFN) measurements on numerous device types. Now, thanks to tight integration with Keysight's WaferPro Express software, device modeling and characterization engineer scan now add noise measurements to a larger suite that includes high-speed DC, capacitance and RF S-parameter measurements, all the while automating wafer prober control.