Applied Test Resources
Applied Test Resources (ATR) was established in 1997, with the primary objective of providing advanced Analog Test software solutions for the semiconductor Industry. As ATR's business developed, we saw an increasing need in the industry for cost effective, user-friendly, specific advanced analog test hardware. ATR then redirected our focus to develop total test solutions at highly competitive prices. Our product to meet the demand for customized test solutions at lower test costs is the MTS-2010 Mixed Signal Test System.
- (610) 488-0802
- sales@atr-inc.org
- 3219 E. Camelback Rd.
Suite 201
Phoenix, AZ 85018
United States of America
Categories
-
product
Quad Op-Amp Loop
QOAL400
The QOAL400 module is a precision instrument capable of measuring all common parameters of an Op Amp, including AC as well as DC parameters. The QOAL400 has four completely independent channels, which allow a quad device to be tested in a minimum amount of time. Each channel has a full set of resources to measure all common parameters.
-
product
DUT Prototype Board
DPB8800
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
-
product
Solid State Matrix Card
SSM4010
The SSM4010 module is a general purpose-switching matrix, consisting of 40 solid-state switches arranged in 5 rows by 8 columns. Each row/column consists of independent Force/Sense lines that are switched simultaneously. Each switch has a maximum ON resistance of 5 Ohms and a minimum OFF resistance of 100 M Ohms.
-
product
Timing Measurement Unit
TMM200
The TMM200 is a resource available for measuring such parameters as propagation delays, rise time, fall time and any other time-related parameter. Because of its wide input levels, the TMM200 is an instrument well suited to test both digital an analog devices.
