Applied Test Resources
Applied Test Resources (ATR) was established in 1997, with the primary objective of providing advanced Analog Test software solutions for the semiconductor Industry. As ATR's business developed, we saw an increasing need in the industry for cost effective, user-friendly, specific advanced analog test hardware. ATR then redirected our focus to develop total test solutions at highly competitive prices. Our product to meet the demand for customized test solutions at lower test costs is the MTS-2010 Mixed Signal Test System.
- (610) 488-0802
- sales@atr-inc.org
- 3219 E. Camelback Rd.
Suite 201
Phoenix, AZ 85018
United States of America
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Product
Four Quadrant Power Source
PM2010
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The PM2010 is a four-quadrant power source capable of supplying up to 20 V/10 Amps to a load. The maximum power that may be safely generated is 50 Watts on a continuous basis and 200 Watts peak on a pulsed mode for no more than 100 ms, and a duty cycle of less than 10%
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Product
Quad Op-Amp Loop
QOAL400
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The QOAL400 module is a precision instrument capable of measuring all common parameters of an Op Amp, including AC as well as DC parameters. The QOAL400 has four completely independent channels, which allow a quad device to be tested in a minimum amount of time. Each channel has a full set of resources to measure all common parameters.
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Product
Matrix Card
MATX4010
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The MATX4010 module is a general purpose-switching matrix, consisting of 40 relays arranged in 5 rows by 8 columns. Each row/column consists of independent Force/Sense lines that are switched simultaneously. Each relay is capable of handling 10 Amps and can isolate up to 5 KV. Each relay on the matrix is independently controlled with an On/Off command via software.
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Product
Mixed Signal Test Systems
MTS1000i
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The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
