Cohu, Inc.
We are a global leader in test handling, thermal subsystems, package inspection, contactors and MEMS test solutions used by the semiconductor industry.
- 858.848.8000
- 858.848.8180
- info@cohu.com
- 12367 Crosthwaite Circle
Poway, CA 92064
United States of America
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Wafer Inspection
Inspection of integrated circuits in wafer form for contaminants, flatness, size, and roughness.
See Also: Wafer, Wafer Thickness, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Handlers
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product
Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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product
Inspection & Metrology Platform
Neon
Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in automotive, consumer, industrial and medical, and mobility applications.
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ECT
Has been a leader in the development of advanced probes and fixtures since 1965.
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Equiptest Engineering Pte Ltd
Equiptest Engineering (EQT) is focused in providing innovative test interface solutions to cater today rapidly changing technological environment.
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KITA Manufacturing Co.,Ltd.
KITA Manufacturing Co.,Ltd. is manufacturing company and specializing in spring probes(Pogo pin) for testing semiconductor and PCB based in Osaka, Japan.
