Integrated Technology Corp.
We provide solutions for metrology, testing and OEM equipment requirements in many areas: Test, analysis, and repair of IC probe cards; Innovative metrology and inspection solutions for industry; Solutions for dynamic testing of power semiconductors; Numerous OEM Electronic Controls.
- 480-968-3459
- 480-968-3099
- sales@inttechcorp.com
- 1228 North Stadem Drive
Tempe, AZ 85281
United States of America
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Product
Probe Card Analyzers
PB3600
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The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
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Product
Unclamped Inductive Load Tester
ITC75100
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The ITC75100 is an enhanced unclamped inductive load (UIL) test system that builds on the success of ITC’s industry leading ITC55 series of testers by adding additional test and measurement capability.
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Product
Wafer Level Multi-Die Test System
ITC55WLMD
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The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
