Integrated Technology Corp.
We provide solutions for metrology, testing and OEM equipment requirements in many areas: Test, analysis, and repair of IC probe cards; Innovative metrology and inspection solutions for industry; Solutions for dynamic testing of power semiconductors; Numerous OEM Electronic Controls.
- 480-968-3459
- 480-968-3099
- sales@inttechcorp.com
- 1228 North Stadem Drive
Tempe, AZ 85281
United States of America
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Product
Unclamped Inductive Load Tester
ITC55100STD
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Model ITC55100STD performs ruggedness testing of power MOSFETs and IGBTs. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
Test System Mainframe
ITC59000
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The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
