Integrated Technology Corp.
We provide solutions for metrology, testing and OEM equipment requirements in many areas: Test, analysis, and repair of IC probe cards; Innovative metrology and inspection solutions for industry; Solutions for dynamic testing of power semiconductors; Numerous OEM Electronic Controls.
- 480-968-3459
- 480-968-3099
- sales@inttechcorp.com
- 1228 North Stadem Drive
Tempe, AZ 85281
United States of America
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Product
test measurement unit
ITC59100 Rg/Qg
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The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
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Product
Unclamped Inductive Load Tester
ITC55300C
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Model ITC55300C performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.
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Product
Unclamped Inductive Load Tester
ITC55600C
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Model ITC55350 is the high current (600A) version of theITC55100 tester. The ITC55350 performs the same testsas the ITC55100 and includes many features that improvetesting accuracy, test results collection, test resultsviewing, and multiple tester networking
