Bruker Nano Surfaces
From leading edge scientific research to high-speed production, Bruker provides the critical surface measurements necessary for success with the world's broadest range of AFMs, stylus profilers, mechanical testers, non-contact 3D optical microscopes, and fluorescence optical microscopes.
- 978-663-3660
- 978-663-5585
- pr@bruker.com
- 40 Manning Road
Billerica, MA 01821
United States of America
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Product
CMP Process and Material Characterization System
CP-4
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he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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Product
Handheld/Mobile/Portable XRF Spectrometers
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Handheld / portable X-ray fluorescent (XRF) analyzers have the capability to non-destructively quantify or qualify nearly any element from Magnesium to Uranium, depending on the instrument configuration.
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Product
Stylus Profilometry
Dektak®
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Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Product
EBSD Detector
e–FlashFS
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The new EBSD detector e–FlashFS has been designed for maximum sensitivity to allow highspeed EBSD measurements without compromising data quality – even on challenging applications like deformed or lightweight materials. To further improve the pattern quality, the cooling system of the e–FlashFS has been upgraded to lower its functioning temperature and therefore reduce the dark current of the CCD camera as much as possible.
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Product
Tribology System
UMT TriboLab™
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Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance.













