Bruker microCT
Manufacture systems for microtomography, nontomography and non-invasive 3D X-ray microscopy.
- 32 3 877 5705
- 32 3 877 5769
- info.BmCT@bruker.com
- Kartuizersweg 3B
Kontich, 2550
Belgium
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Product
Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Product
CS/ONH-Analysis
G4 ICARUS Series 2
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The combustion analyzer G4 ICARUS Series 2 with high frequency (HF) induction furnace and HighSense™ detection sets new standards in for a rapid and precise carbon (C) and sulfur (S) analysis in inorganic solids.
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Product
Surface Plasmon Resonance Analysis
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Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Product
Mass Spectrometry
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Innovations such as Trapped Ion Mobility (TIMS), smartbeam and scanning lasers for MALDI-MS Imaging that deliver true pixel fidelity, and eXtreme Resolution FTMS (XR) technology capable to reveal Isotopic Fine Structure (IFS) signatures are pushing scientific exploration to new heights.
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Product
Electron Microscope Analyzer
QUANTAX EDS for TEM
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Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Product
Micro-XRF Spectrometers
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Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
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Product
CS/ONH-Analysis
G6 LEONARDO
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The high-end thermal conductivity detector used for hydrogen and nitrogen analysis allows detection limits in a sub-ppm range (based on 1g sample mass)
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Product
Nanoindenter
Hysitron TI 980
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Bruker’s Hysitron TI 980 TriboIndenter operates at the intersection of maximum performance, flexibility, reliability, usability, and speed. This industry-leading system builds upon decades of Hysitron technological innovation to deliver new levels of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical characterization.
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Product
CBRNE Detectors
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Investments in intellectual horsepower, research and development; enable Bruker to offer a wide range of products with a broad technological base and high end instrumentation
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Product
Mechanical Tester
TriboLab CMP
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Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process.
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Product
Test & Measurement
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High-performance surface and dimensional analysis tools for industry and researchers
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Product
CS/ONH-Analysis
G4 PHOENIX DH
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The highly sensitive thermal conductivity detector allows analysis down to a sub-ppm range, while the optional mass spectrometer allows detection limits in the low ng/g range.
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Product
CS/ONH Analyzers
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Elemental analysis of CS and ONH in inorganic materials | Based on the know-how of many decades Bruker offers innovative solutions for rapid and precise elemental analysis of carbon, sulfur, oxygen, nitrogen and hydrogen.
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Product
Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Product
Diffractometers & Scattering Systems
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Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.






















