Showing results: 1 - 10 of 10 items found.
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LCD Driver -
SV Probe, Inc.
LCD Driver devices are utilized in some of the most popular high definition tech products such as LCD televisions, high functioning smart phones and tablets.
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SpringTouch -
SV Probe, Inc.
Wafer Level Chip Scale Package is fast becoming popular because of its small form factor utilized in such applications as Wifi, Bluetooth and GPS units. The WLCSP is also very cost-effective with a simplified manufacturing process that eliminates the need for the final or package test step..
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Vertical Space -
SV Probe, Inc.
With our TrioTM vertical and LogicTouchTM fine pitch vertical technologies an interconnect, otherwise known as a space transformer (ST), is used between the printed circuit board and the probe head, transferring the test signal. SV TCL provides a variety of space transformers, each with its own specific benefits and applications. SV TCL offers a number of space transformer options including:
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Venture -
SV Probe, Inc.
SV TCL's VentureTM line of cantilever probe cards, represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Our Venture FX™ fine pitch cantilever cards are ideal for LCD driver testing, with higher probe counts for greater density bond pad layouts.
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SV Probe, Inc.
SV TCL also has the capability to emulate the testing environment with our probe card analyzers including newly installed direct dock analyzers in the United States, Taiwan and Vietnam. SV TCL is dedicated to continuous product improvement so that we can provide our customers the latest and most innovative test solutions.
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Direct Dock -
SV Probe, Inc.
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Ceramic Blades -
SV Probe, Inc.
SV TCL offers a variety of ceramic blades and blade probe cards. We have patented ceramic microstrip blade probes available in low leakage and low capacitance for optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF testing.
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CIS -
SV Probe, Inc.
CMOS Image Sensors (CIS) allow camera functions in high tech tablets and smart phones. Testing CIS devices utilizes cantilever technology and layering for high density probe layouts. SV TCL''s CIS probe card products employ a wide variety of materials ensuring they are a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features include:
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LogicTouch -
SV Probe, Inc.
The shrinking of IC die geometries and the growing complexity of device designs are making the task of on-wafer testing increasingly more difficult. SV TCL''s LogicTouchTM is suited perfectly for these types of advanced designs, a fine pitch technology utilizing a MEMS-style probe targeted for pad-limited devices such as High-Volume SoCs, Microcontrollers, DSPs and 3D Packages. LogicTouch is also ideal for the latest device applications including TSV (Through-Silicon Via) and Copper Pillar (Cu-Pillar).
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Trio Vertical -
SV Probe, Inc.
SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.