Malvern Panalytical Ltd
Malvern Panalytical is a leading provider of scientific instrumentation for the measurement of elemental concentrations, crystallographic structure, molecular structure, remote sensing, rheology, particle size, particle shape, particle concentration and more.
- +44 (0) 1684 892456
- Enigma Business Park
Grovewood Road
Malvern, WR14 1XZ
United Kingdom of Great Britain and Northern Ireland
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Product
Process Particle Size Analyzers
Parsum Range
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Parsum Probes use Spatial Filter Velocimetry to deliver in situ, real-time size and velocity measurements for solid particles suspended in a pneumatic or gravity flow gas stream. Robust, dustproof and waterproof they measure particles in the size range 50-6000 µm with velocities from 0.01-50 m/s and are suitable for any industrial environment.
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Product
WDXRF Wafer Analyzer
2830 ZT
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Product
WDXRF Spectrometers
Zetium
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X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium XRF spectrometer leads the market in high-quality design and innovative features for sub-ppm to percentage analysis of Be to Am.
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Product
Spray Particle Size Analyzer
Spraytec
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Malvern Panalytical's Spraytec laser diffraction system allows measurement of spray particle and spray droplet size distributions in real-time for more efficient product development of sprays and aerosols. It has been specifically designed to address the unique requirements for spray characterization and deliver robust, reproducible droplet size data.
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Product
Benchtop X-ray Diffractometer
Aeris
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Meet Aeris – our brand-new benchtop X-ray diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software. Being a Malvern Panalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.











