Teradyne, Inc.
Teradyne tests and helps build the world’s most innovative products. Our leading-edge testers make sure that new products work right the first time, every time. And our robotics portfolio helps manufacturers to develop and deliver new products quickly, efficiently and cost-effectively.
- +1 800-837-2396
978 370-2700 - 978 370-1100
- customercare@teradyne.com
- 600 Riverpark Drive
North Reading, MA 01864
United States
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Scalable Test Solution for Mixed-Technology Test Applications
Spectrum RF Systems
The Spectrum RF Systems are fully integrated, configurable test platforms combining several digital, analog, RF, and switching instruments to provide automated functional test solutions for a wide range of mixed-signal and microwave test applications including radars, Electronic Warfare, missile, and satellite communications.
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Software
D2B
The unique capabilities of Teradyne's D2B software enable EMS and OEM manufacturers and partners to interconnect their global enterprises to optimize printed circuit board assembly test and inspection efficiencies early in the manufacturing / build cycle. D2B is a powerful suite of solutions that provides a standards-based architecture that supports GenCAM and ODB++ file formats enabling electronic manufacturers to outperform their competition, maximize profitability, and get to market first.
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Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Autonomous Mobile Robots
AMRs
Teradyne’s portfolio of autonomous mobile robots (AMRs) automates material handling tasks with payloads from 100 kg (200 lbs) to 1350 kg (10,000 lbs).Mobile Industrial Robots (MiR) is the leading company in this space. It offers high-performance, easy to deploy solutions that increase the efficiency of in-house transportation and logistics.
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Automotive Test Platform
ETS-800
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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TestStation Product Family
TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide-range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to...show more -
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VXI Analog Instruments
Ai-762
Ai-762—the newest member of the Ai-760 Series in the Core Systems Instruments (CSi) family—is a standards-based integrated test and measurement tool that consolidates traditional instruments into a single-slot VXI package.
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Semiconductor Testing
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Analog Test Instruments
Analog test building blocks for high performance ATE. VXI-based Core System Instruments (CSi) ZT-Series™ PXI/LXI instruments.
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5G Testing
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Wireless Testing
Thorough testing of wireless technologies is essential, but it can’t result in production slowdowns or increased costs. Teradyne’s industry-leading wireless testers deliver high-throughput and get the newest technologies from the lab to high-volume manufacturing, quickly and cost-effectively.
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Sustainment & Life-Cycle Support Solutions
Managing long-term ATE effectiveness and sustainment involves more than just maintenance and repair.Total Support Solution combines Teradyne’s long-term product support, unmatched engineering expertise, and deep knowledge in defense logistics to provide support solutions specific to customer’s needs throughout the ATE life cycle, enabling customers from integration labs to factories and MRO shops to achieve optimized test solutions, maximum equipment uptime and minimum life-cycle costs.
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Digital Test Instruments
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.