multiLane
MultiLane has been supplying the data communications industry with high-speed test and measurement equipment for more than a decade. From the early days of 10 Gigabit Ethernet to the 400 and 800 Gigabit Ethernet test challenges of today, we have worked to ensure that our offerings keep pace with industry needs. Our portfolio of data center interconnect and high-speed IO test solutions encompasses IC and transceiver characterization, host line-card testing, and link testing.
- +961 81 794 455
- Houmal Technology Park Houmal,
Askarieh Main Road
Houmal,
Lebanon
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product
Optical Clock-Recovery Modules / O-CR
Optical clock-recovery modules are required when a clock signal is not present to trigger the oscilloscope or when it is better to use the embedded clock present in the data stream, such as for 100G Lambda optical signals.Clock-recovery modules are essential for transmitter signal characterization.
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Time Domain Reflectometer / TDR
For testing cables and interconnects, we offer the ideal tool: A time domain reflectometer (TDR). Time domain reflectometry/transmission can be used to test network return loss (S11), propagation loss (S21), and crosstalk.Moreover, it can provide the impedance profile of an electrical channel. MultiLane supplies semi-automated solutions for the testing of direct-attach cables and TIAs.
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QSFP-DD800
QSFP-DD800 has emerged as a leading standard to drive the development of 800G ecosystem. MultiLane provides a QSFP-DD800 development kit that includes a module compliance board, a host compliance board and a variety of loopback modules.
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OSFP-XD Thermal Load with a Controller Board
In an everchanging industry, new form factors are launched to support higher speeds like 800G and later, 1.6T. With the speed per lane increasing exponentially, the need for thermal and cooling tests also rises with new requirements and demands.MultiLane is offering a OSFP-XD thermal load with a controller board, with the goal of emulating transceiver thermal behavior, but also to test cooling systems.
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AWG
With the accelerated growth of hyperscale datacenters, Ethernet network infrastructure performance demands are increasing exponentially, and customer expectations for high-speed data throughput are at an all-time high.Other high-speed I/O protocols such as PCIe Gen 5 and 6 are also gaining momentum. Arbitrary Waveform Generators are the ideal general-purpose development tool for validating high-speed receivers and are extremely flexible instruments for coherent module development.
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ATE
Below is a list of high speed scopes and BERTs that form an integrated extension to Advantest’s V93000 ATE tester. In addition to these instruments, Multilane offers turnkey solutions for ATE testing.
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BERT Measurement Solutions
Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.
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