- Pickering Interfaces Inc.
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PXI 10W Programmable Resistor Module, 1-Channel, 1Ω to 239Ω
40-253-113
The 40-253-113 is a programmable resistor module with 1 channel which can be set between 1Ω and 239Ω with 1Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Photodiodes
Photodiodes are a type of detector, devices that generate an electrical signal when illuminated by light. ACP offers a variety of different types of photodiodes, including InGaAs PIN photodiodes.
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Avalanche Photodiodes
Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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Photodiodes & Arrays
Excelitas utilizes Silicon and InGaAs materials for our photodiodes to provide detection from 220 nm to 1700 nm. These devices are offered in a variety of sizes to meet customer sensitivity and speed requirements. Many different types of photodiodes are available to serve various unique applications.
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Photodiode
A high sensitivity receiver in a fiber pigtail coupled package, it includes a high speed InGaAs avalanche photodiode with a high gain TIA in a hermetically sealed coaxial package. It incorporates an LC/UPC pigtail and a flexible printed circuit (FPC). The signal GND and a receptacle are electrically isolated in this APD receiver.
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UV Photodiodes
Active area from 0.06 mm² to 36 mm² and quadrant photodiodes for position detections. Spectral response for broadband UV or filtered for UVA, UVB, UVC or UV-Index. Various entrance optics and housings options available (TO or SMD). Our own SiC photodiode chip production since 2009 also available with VUV sensitivity. PTB (German equivalent of NIST or NPL) measured high radiation hardness. 350°C high temperature stable photodiodes available. Photodiode application guide.
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Pyranometer with Silicon Photodiode
LP471SILICONPYRA
Pyranometer with silicon photodiade for GLOBAL SOLAR IRRADIANCE measurement.
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OSI Optoelectronics Photodiodes
Semiconductor devices used for the detection of light from the ultra-violet to the near-IR regions (200nm – 1100nm).
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10G APD Photodiodes
Macom Technology Solutions Holdings Inc.
MACOM offers the highest sensitivity avalanche photodiodes (APD) on the market to satisfy 10Gtelecom and datacom applications. Both front-illuminated and back-illuminated chips are available and usable from 1250 to 1650 nm for bit rates up to 11.3 Gb/s. Proprietary designs enable superior bandwidth, excellent temperature stability and high reliability to support market needs.
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16-element Si photodiode array
S12362-321
The S12362/S12363 series is a back-illuminated type 16-element photodiode array specifi cally designed for non-destructive X-ray inspection. These are modified versions of our previous products (S11212 series: 1.575 mm pitch). The pitch has been changed to 2.5 mm. The back-illuminated photodiode array is also simple to handle and easily couples to scintillators without having to worry about wire damage because there are no bonding wires and photosensitive areas on the back side.
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PIN Photodiode
PIN photodiode is a kind of photo detector, it can convert optical signals into electrical signals.This technology was invented in the latest of 1950's. There are three regions in this type of diode. There is a p-region an intrinsic region and an n-region. The p-region and n-region are comparatively heavily doped than the p-region and n-region of usual p-n diodes. The width of the intrinsic region should be larger than the space charge width of a normal p-n junction. The PIN photo diode operates...show more -
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*Photodiode Energy Sensors
Ophir photodiode laser energy sensors are able to measure low energy pulses down to 10pJ at frequencies up to 20 kHz. Silicon photodiodes for the UV and visible spectrum and Germanium photodiodes for infrared.
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Custom Test Fixtures
Cortek Test Solution’s design capabilities range from very basic to extremely sophisticated solutions. Developing custom test fixtures demands more engineering time as well as an in-depth knowledge of mechanical design, pcb test methods paired with precision machining. Our experienced engineers will evaluate your requirement and design innovative mechanical test fixtures to meet your application needs in both the R & D and production environments.
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Full Range Photodiode Array UV-VIS-NIR-SWIRLaboratory Spectroradiometers
The SR-Series of full range laboratory spectroradiometers is ideal for a wide range of applications, including:*Solar radiance and irradiance measurements*Solar simulator test and classification*LED, laser, light source metrology*Radiometric calibration transfer*Remote sensing applications
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RF Shielded Test Enclosure, I/O Intensive Device Tests
JRE 1720
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. A JRE exclusive, our triple door locking mechanism allows easy single handle door operation. Ventilation is standard with our JRE exclusive honeycomb style vents in enclosure rear and door.
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Leak Test Instrumentation
At Cincinnati Test Systems (CTS), we are dedicated to providing our customers with superior quality leak testing systems. With access to advanced designs, features, and test algorithms in our leak test devices, we promise a fast and reliable leak test product that will also provide repeatable results for air leakage testing, gas leakage testing, or any other leak where reliable testing equipment is needed. Browse our family of products to learn more on how our standard and custom built systems can meet your needs:
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Mixed Signal Test Systems
MTS1010i
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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*Laser Photodiode Sensors
Photodiode sensors have a high degree of linearity over a large range of light power levels: from fractions of a nanowatt to about 2 mW. Above that light level, corresponding to a current of about 1 mA, the sensor saturates and reads erroneously low. Therefore, most Ophir PD sensors have a built-in and removable attenuator allows measurement of up to 3 W without saturation.
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Modular Test System
A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solut...show more -
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Test Socket
Our test sockets are made for high performance and are of top quality, to guarantee a smooth, effortless process. We believe in providing our partners and customers with effective and intelligent solutions that they can apply with ease. Choose the solutions of TTS Group cater to the needs of detailed and complex systems.
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MANIA TEST PROBE
SERIES 76
ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Universal Test Machines
AMETEK Sensors, Test & Calibration
he single column test stands offer a wide range of materials testing possibilities no matter what your testing needs are. Use the force testing machines for compression testing (Push) and tensile testing (Pull), or to perform a wide variety of tests on the universal materials testing machines.
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Modular Test Platform
A modular test platform with a wide selection of modules allows optimal configuration of test solutions for optical component and network systems manufacturing.
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Threaded Probes Designed for Connector and Harness Test
Equip-Test Threaded Probes Designed for Connector and Harness Test