Advantest redefines the industry with the revolutionary V6000. Through its patent-pending Active Matrix™ and sixth-generation Tester-Per-Site® architecture, the V6000 delivers breakthrough cost-of-test, parallelism and yield for engineering, wafer sort and final test of both Flash and DRAM. The versatility of the V6000 allows testing of Flash and DRAM on the same test solution. The V6000 is scalable over time to greatly extend the useful life of your capital investment.
With the basis on DRAM test handler, where the DRAM has been one of the Korean core business in the electronics industry, Mirae is expanding its market share by exploring the flash memory test handler market.
The IST-6500 is a low cost, fully programmable tester for functional and parametric testing of DRAM, SRAM, VRAM, and SIMM devices up to 144 bits wide and 64 MB in size. The 6500 offers four different ways to automatically measure the access time of these devices from 2ns to 160ns with a resolution of 2ns. The DRAM timing parameters are programmable at the resolution of 1ns to allow for testing DRAM, SIMM, or VRAM at their required operating speeds, thus providing real time test conditions.
General-purpose DRAM is being used not only as the main memory in computers, but also for the storage of digital information in electronic products such as flat-screen televisions, DVD hard disk recorders, digital cameras and mobile phones. It is expected that demand will continue to rise sharply as new consumer-driven market populations expand. Along with this growth however, falling computer and consumer electronics prices are leading to increased pricing pressures on manufacturers of memory d...
LogicVision?s ETSystemMemory provides a complete solution for the at-speed testing of component memories. The solution provides support for most SRAM and DRAM memories, including those that utilize burst modes of operations, such as DDR and QDR memories.
The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available
The Sync DIMMCHECK 168 (p/n INN-8558-6) is our most popular SIMCHECK II test adapter and it is also part of the SIMCHECK II PLUS combination. It tests SDRAM and standard EDO/FPM DRAM 168-pin DIMM modules at an affordable price.
SP3000 tester is equipped for testing a wide variety of memory modules from DDR2, DDR to SDRAM to EDO/DRAM memory. Coverage includes 240pin, 200pin DDR2, 184pin , 200pin DDR, 168pin, 144pin SDRAM, 168pin, 72pin,30 pin EDO/FPM DRAM SIMMs DIMM SoDIMM memory module.
ADVANTEST's new T5385 memory test system for DRAM wafer test delivers an unrivaled 768-DUT parallel test capacity and 533 Mbps capability for increased throughput and lowered cost of test. Ideal for high-volume wafer fabs, the new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, allowing tester pin resources to be optimally allocated for efficiency, reduced touchdowns and improved throughput. Achieving improved efficiency per device while scaling even high...
Digital IC Tester for testing TTL / CMOS / DRAM/ Most of the Digital circuits use 74 series TTL, 40/45 series CMOS & 41/44 series DRAM. It is essential to test the ICs before it is put into the circuit. This Tester is also useful for servicing/maintenance.The IC Tester is having 24 Pin ZIF socket for testing the ICs. It has its own display of 16x1 LCD and own menu for guiding the user. It has the function of selecting the IC number, Auto Search for unknown ICs, and test the ICs. Its average sear...
The VID475 features a JPEG2000 hardware compression solution. It is based on the ADV212 codec devices suitable for on-the-fly compression prior or after the imaging processing implemented on the Virtex-4 FPGA device. The VID475 has two Xilinx Virtex-4 FPGA devices and some fast on-board SRAM and DRAM memory resources.
CST is proud to present the next generation of Eureka tester capable of testing DDR1,DDR2 & DDR3 in blazing speed. The Eureka-2 is the fourth generation benchtop DIMM/SODIMM test system specifically designed for high-volume memory distributors, memory module manufacturers, memory module design engineers, DRAM Test Labs and other PC manufacturers.