DRAM

This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price. ...more

CST is proud to present the next generation of Eureka tester capable of testing DDR1,DDR2 & DDR3 in blazing speed. The Eureka-2 is the fourth generation benchtop DIMM/SODIMM test system specifically designed for high-volume memory distributors, memory module manufacturers, memory module design engineers, DRAM Test Labs and other PC manufa ...more

Managing yield for today’s giga-scale DRAM, SRAM and FLASH memory devices is a complex activity. Huge volumes of test and fabrication data from multiple sources must be gathered, correlated and analyzed with a short turnaround time. Out of spec conditions must be flagged and reported automatically when discovered. For interactive analysis, the raw ...more

The DIMM-PC/520-I is an extremely compact PC module to be plugged on to customised base boards. The new DIMM-PC/520-I , based on AMD Elan SC520 133 MHz, features high performance with a integrated floating point unit, up to 32 MByte DRAM and 32 MByte IDE compatible Flash. Due to the extreme low power design no active cooling is required ...more

The T5383 provides a timely response to these trends. From front-end test for DRAM to back-end test for FLASH memory, MCP/SIP, and other devices, the T5383 provides a high-throughput solution that offers flexible support for increasingly fast and versatile memory devices. In addition, T5383 high-density pin electronics deliver 50% more capacit ...more

The DIMMCHECK 168P PRO (p/n INN-8484-10) supports standard EDO/FPM DRAM 168-pin DIMM modules which are either buffered or unbuffered and use either 3.3V or 5V. ...more

ArraytestMaker is an advanced embedded test, diagnosis and repair solution for SRAM, CAM and DRAM. ArraytestMaker prevents ICs containing faulty SRAM from reaching systems. The user can select one of five algorithms that are built-into ArraytestMaker. ...more

SP3000 tester is equipped for testing a wide variety of memory modules from DDR2, DDR to SDRAM to EDO/DRAM memory. Coverage includes 240pin, 200pin DDR2, 184pin , 200pin DDR, 168pin, 144pin SDRAM, 168pin, 72pin,30 pin EDO/FPM DRAM SIMMs DIMM SoDIMM memory module.  ...more

The Sync DIMMCHECK 100 (p/n INN-8558-8) is the state-of-the-art solution for testing SDRAM and standard EDO/FPM DRAM 100-pin S.O. DIMM modules at an affordable price.  ...more

The T5588 meets such market demands with a maximum testing rate of 800 Mbps and by allowing the simultaneous testing of up to 512 devices. This enables high throughput testing at greatly reduced costs. T5588 is also the first DRAM package tester to offer an optional flash memory test function, making it uniquely adaptable to changing market co ...more

The Sync DIMMCHECK 168 (p/n INN-8558-6) is our most popular SIMCHECK II test adapter and it is also part of the SIMCHECK II PLUS combination. It tests SDRAM and standard EDO/FPM DRAM 168-pin DIMM modules at an affordable price. ...more

Our new addition to the RAMCHECK line provides support for common 20 to 42-pin EDO/FPM DRAM SOJ chips of sizes 256Kx16/18, 1Mx16/18, 8Mx8, 16Mx4, 2Mx8, 4Mx4, 16Mx1, 1Mx4, and 4Mx1.  ...more

The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available ...more

The DIMMCHECK 144P PRO (p/n INN-8558-2) tests standard EDO/FPM DRAM 144-pin DIMM modules. Tested modules include x64 parity and x72 ECC modes for either 3.3V (default) or 5V. ...more

The DRAM CARD TESTER (p/n INN-8484-3) tests all 88-pin DRAM CARDS.  ...more

LogicVision?s ETSystemMemory provides a complete solution for the at-speed testing of component memories. The solution provides support for most SRAM and DRAM memories, including those that utilize burst modes of operations, such as DDR and QDR memories.  ...more

Designed for very high speed acquisitions, the CPCI 412 performs the analog / digital conversion of 4 simultaneous channels in 12 bits at a speed of 25 MHz. A large buffer of 32 Mbytes of DRAM (4 Mega Acquisitions per channel) can be used in ?One Shot? mode or in ?Flip/Flop? mode. ...more

LogicVision’s ETSystemMemory provides a complete solution for the at-speed testing of component memories. The solution provides support for most SRAM and DRAM memories, including those that utilize burst modes of operations, such as DDR and QDR memories. ...more

The X5-210M is an XMC IO module featuring four 14-bit 210 MSPS A/Ds with a Virtex5 FPGA computing core, DRAM and SRAM memory, and eight lane PCI Express host interface. ...more

Tanisys Technology, the leader in DRAM and flash module test equipment, introduces the next generation DRAM test system. The M1K test system is the solution for 400 to 800MHz+ DDR/DDR2 module test, as well as FB-DIMM. ...more

The IST-6500 is a low cost, fully programmable tester for functional and parametric testing of DRAM, SRAM, VRAM, and SIMM devices up to 144 bits wide and 64 MB in size. The 6500 offers four different ways to automatically measure the access time of these devices from 2ns to 160ns with a resolution of 2ns. The DRAM timing parameters are programmable ...more

The Verigy V5500 addresses the test challenges of complex multi-chip packaged devices (MCPs) and the need for the highest possible throughput for low and high pin count discrete Flash. The tester-per-site architecture of the V5500, combined with the Verigy Programmable Interface Matrix technology, optimizes single insertion testing of MCPs wit ...more

The Verigy V93000 HSM Series ? the fastest DRAM tester available ? is targeted at final test of high-speed memories offering 3.6Gbps at-speed IO and at-speed memory core test to ensure the required test quality and fast yield learning at competitive cost-of-test ...more