V6000 Memory - Test Solution for Flash and DRAM Applications Advantest redefines the industry with the revolutionary V6000. Through its patent-pending Active Matrix™ and sixth-generation Tester-Per-Site® architecture, the V6000 delivers breakthrough cost-of-test, parallelism and yield for engineering, wafer sort and final test of both Flash and DRAM. The versatility of the V6000 allows testing of Flash and DRAM on the same test solution. The V6000 is scalable over time to greatly extend the useful life of your capital investment.

Sync DIMMCHECK 100 - SDRAM and Standard EDO/FPM DRAM 100-pin S.O. DIMM Modules Tester The Sync DIMMCHECK 100 (p/n INN-8558-8) is the state-of-the-art solution for testing SDRAM and standard EDO/FPM DRAM 100-pin S.O. DIMM modules at an affordable price. 

64DUTs - Multi-Die For 64-DUT simultaneous measurement. Supports LOC layout DRAM product.

ATE Test Handler With the basis on DRAM test handler, where the DRAM has been one of the Korean core business in the electronics industry, Mirae is expanding its market share by exploring the flash memory test handler market.

Hi-Fix - Memory Module Board Mirae provides Test Interface Solution for Memory Modules such as DDR1, DDR2, FLASH and RAMBUS DRAM

IST-6500 - RAM Tester The IST-6500 is a low cost, fully programmable tester for functional and parametric testing of DRAM, SRAM, VRAM, and SIMM devices up to 144 bits wide and 64 MB in size. The 6500 offers four different ways to automatically measure the access time of these devices from 2ns to 160ns with a resolution of 2ns. The DRAM timing parameters are programmable at the resolution of 1ns to allow for testing DRAM, SIMM, or VRAM at their required operating speeds, thus providing real time test conditions.

Ramcheck 100 - Test Adapter This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.

TurboBIST - Built-in Self-Test TurboBIST family of products from SynTest Technologies, Inc. includes tools for logic (TurboBIST - Logic) and memory (TurboBIST - Memory) (SRAM, ROM, DRAM and CAM) built-in self-test.

DIMMCHECK 168P PRO - Universal 168P DIMM Adapter The DIMMCHECK 168P PRO (p/n INN-8484-10) supports standard EDO/FPM DRAM 168-pin DIMM modules which are either buffered or unbuffered and use either 3.3V or 5V.

ETSystemMemory - Embedded External Memory Test LogicVision?s ETSystemMemory provides a complete solution for the at-speed testing of component memories. The solution provides support for most SRAM and DRAM memories, including those that utilize burst modes of operations, such as DDR and QDR memories. 

Sync DIMMCHECK 168 - Test Adapter The Sync DIMMCHECK 168 (p/n INN-8558-6) is our most popular SIMCHECK II test adapter and it is also part of the SIMCHECK II PLUS combination. It tests SDRAM and standard EDO/FPM DRAM 168-pin DIMM modules at an affordable price.

SIMM Test Adapter The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available

SP3000 - Memory Tester SP3000 tester is equipped for testing a wide variety of memory modules from DDR2, DDR to SDRAM to EDO/DRAM memory. Coverage includes 240pin, 200pin DDR2, 184pin , 200pin DDR, 168pin, 144pin SDRAM, 168pin, 72pin,30 pin EDO/FPM DRAM SIMMs DIMM SoDIMM memory module. 

Model 2000B - Gravity Feed IC Handler The 2000B Series Handler is a basic, no-frills machine with a basic, no-frills price tag. The 2000B is ideal for the down-graded DRAM market, low to mid-volume, single application customers, start-ups and other applications where the budget is the primary issue when selecting a handler vendor.

DIMMCHECK 144P PRO - 144-P Small Outline DIMMs The DIMMCHECK 144P PRO (p/n INN-8558-2) tests standard EDO/FPM DRAM 144-pin DIMM modules. Tested modules include x64 parity and x72 ECC modes for either 3.3V (default) or 5V.

SOJ EDO/FPM - Chip Test Adapter Our new addition to the RAMCHECK line provides support for common 20 to 42-pin EDO/FPM DRAM SOJ chips of sizes 256Kx16/18, 1Mx16/18, 8Mx8, 16Mx4, 2Mx8, 4Mx4, 16Mx1, 1Mx4, and 4Mx1. 

Advanced Probe Cards We address all memory device applications—NOR and NAND Flash and DRAM, in both 200mm and 300mm wafer sizes. Our innovative solution begins with a unique 3D MEMS Probe structure. Our probe provides ACCU-TORQ™ Probe provides superior mechanical properties and compression dynamics, enabling increased probe density and high probe counts through redundant probe utilization

VID475 JPEG2000 - Hardware compression system solution The VID475 features a JPEG2000 hardware compression solution. It is based on the ADV212 codec devices suitable for on-the-fly compression prior or after the imaging processing implemented on the Virtex-4 FPGA device. The VID475 has two Xilinx Virtex-4 FPGA devices and some fast on-board SRAM and DRAM memory resources.

T5588 - Memory Test System The T5588 meets such market demands with a maximum testing rate of 800 Mbps and by allowing the simultaneous testing of up to 512 devices. This enables high throughput testing at greatly reduced costs. T5588 is also the first DRAM package tester to offer an optional flash memory test function, making it uniquely adaptable to changing market conditions.

Eureka-2 - Memory Tester CST is proud to present the next generation of Eureka tester capable of testing DDR1,DDR2 & DDR3 in blazing speed. The Eureka-2 is the fourth generation benchtop DIMM/SODIMM test system specifically designed for high-volume memory distributors, memory module manufacturers, memory module design engineers, DRAM Test Labs and other PC manufacturers. 

T5383 - Memory Test System The T5383 provides a timely response to these trends. From front-end test for DRAM to back-end test for FLASH memory, MCP/SIP, and other devices, the T5383 provides a high-throughput solution that offers flexible support for increasingly fast and versatile memory devices. In addition, T5383 high-density pin electronics deliver 50% more capacity than provided by its predecessor, T5377S, and within the same small footprint.

JET-1050 - PCI Test Card The PCI Test Card is designed for troubleshooting ,burn in test and reliability test. It is easy to do burn in test even no DRAM module is plugged. The system will auto reset after user specific setup time is reach for burn in test. User can also use this card for reliability testing, the system will auto reset when user specific setup POST code is match. So the system will keep running more and more when it has not any error occurs. The system will be HALF when it caused by BIOS detects error during testing.