Showing results: 1816 - 1830 of 5205 items found.
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WT4000 -
Lisun Electronics Inc.
• Measure parameter: 1) Input: Vrms, Lrms, W, PF, Hz, Phasic angle, total harmonic and 0-39 component of harmonic. 2) Output: Lamp voltage, Lamp current, Filament current, Guided cathodic current, Lamp power, crest factor and oscillatory frequency, single high frequency analysis. • Startup: Startup lamp voltage, lamp current, filament current, guided cathodic current curve and parameter, preheating time; • Simultaneously display on 8 windows for input and output parameters, convenient for comparison and analysis; • Test preheat energy, filament preheat time. And the parameters changes from 0 to 5s of filament voltage, filament current and filament power; • Up to 1MHz lrms test content to every EB; • Analysis symmetry of high Frequency curve of lout; • 12-bit high-speed A/D, sampling rate up to 10MHz, can easily analyse signal curve of output; • Finish an input and output testing at the same time within 1 minute; • Portable, can test, display, print without computer. Test report include data and curve, comply with international standard; • Communication port for PC, run under Windows98 or Windows2000, English Version available.
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Pilot 4D M4 -
SEICA SpA
The Pilot 4D M4 is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs, from prototypes to small/medium production volume, through the repair of field returns and reverse engineering. The vertical, compact architecture and the excellent board clamping system ensure that there is no oscillation of the board under test, which in turn greatly facilitates the precise positioning of the probes on the test points.
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VA-1830 -
Astrodesign Inc.
Testing HDMI source: DVD, Blu-Ray player, Set Top Box, AV amplifier, Notebook PC and digital camera.
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HIOKI E.E. Corp
Supports remote control For automatic multipoint testing of insulation / withstand voltage Use with the 3153''''s program or with general-purpose logic sequencers
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VDE 0100 -
PeakTech Prüf- und Messtechnik GmbH
This innovative combination measuring device for testing electrical installations according to official laws convinces with its technical performance data in the high-end area. All important safety tests such as FI, voltage, loop, low-resistance, earth resistance and insulation tests for e-checks and new installations can be carried out safely by the electrician via the large 3.5“ TFT color display. Of course, the device comes with an extensive range of accessories, such as all necessary test leads, adapters, rods and the required software CD for the PC. The device can be charged with a power adapter or via a car adapter. During the daily use, this high-quality device is protected against dust and all-round water jets by its protection class IP 65.
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igentic® 421t -
Sterner Automation Limited
Electronics customers require greater test flexibility to address the growing trend towards high-mix, low-volume printed circuit board (PCB) production. Sterner Automation is pleased to introduce the igentic® 421t, the next generation of automated test solution specially engineered to address these challenges. The igentic® 421t provides the flexibility, reliability and efficiency needed in one standard platform, allowing our customers to test multiple PCB's and significantly reduce individual product testing costs.
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WB2681A -
Lisun Electronics Inc.
• Insulation test voltages: DC250V、DC500V、DC1000V • Range of open-circuit voltage: ±10% rated voltage • Testing time: 3~99 seconds or controlled manually
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EKT-2128BR -
Ektron Tek Co., Ltd.
Windows Operation Software SystemWindows operation software system provides friendly operation environment also the following characteristics: 1. User can pre-set and save the testing specifications to save time of setting procedures before test. 2. User can choose and arrange the related coordinates such as retraction value corresponding to time and temperature. 3. After tests, all test curves and related test data can be saved and retrieved for future use.
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Snap-on Inc.
• Developed with input from technicians on adaptor selection for 7.3 L, 6.7 L, 6.4 L and 6.0 L Ford®Power Stroke®engines• 0 100 PSI gauge and hose assembly• Low-pressure diesel-fuel delivery testing (lift pump)• Correct fuel delivery and dynamic fuel pressure are crucial to having a properly running engine• Helps prevent a lean condition that may cause burning of injectors or scorched cylinders• Convenient protective slide-lid case that will fit in a 4" drawer for easy tool access• Technical Support: 1-866-713-6007
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TR8100H SII -
Test Research, Inc.
The TR8100H SII is the latest ICT with High Throughput and High Accuracy for large and complex PCBAs. The TR8100H SII is the top-of-the-line board test system targeting the low-voltage testing market.
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HIOKI E.E. Corp
For general-use electrical devices Built-in non-medical use networks For rated currents of up to 20A For automatic testing on production lines, etc.
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DWC Series -
ECG KOKUSAI Co., Ltd.
Switching arrangement which suited the impulse winding testing machine of our company. It is automatic in 3 phase coil, and is with a change. A yes-no decision is examined and carried out
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Shenzhen Graigar Technology Co.,Ltd.
The Leeb rebound hardness test is one of the four most used methods for testing metal hardness. This portable method is mainly used for testing sufficiently large workpieces.
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SKZ110 -
SKZ Industrial Co., Ltd
1. It automatically counts the times of double-folding about specimen.2, It takes photoelectric control to make folding clamp back after testing and convenient for the next operation. 3. Motor control the movement of clamp, but not gear wheel4. The instrument has powerful function of data processing. 5. It can not only convert the double folding times and values of single specimen, but also analyze group specimens' data to show maximum, minimum, average and variation coefficient. 6. The data stores in micro-computer displayed by LED. Date print out.Technical characters:
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T5822 -
Advantest Corp.
Wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).
