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Showing results: 3601 - 3615 of 14526 items found.

  • PCI Express Gen 3 Test Backplane

    SKU-015-01-PCIe - Amfeltec Corp.

    PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.

  • Traction Battery Short Circuit Test Machine

    Guangdong Bell Experiment Equipment Co.,Ltd

    Traction Battery Short Circuit Test Machine Relevant standards requirement:Single Storage Cell Safety Test6.2.4 Short circuitCharge the single storage cellaccording to 6.1.3 standardThe cellis to be short-circuited by connecting the positive and negative terminal with a external resistance of less than 5mΩ for 10 minObserve for 1HBattery module safety test6.3.4 Short circuitCharge the battery module according to standard 6.1.4The battery module is to be short-circuited by connecting the positive and negative terminal with a external resistance of less than 5mΩfor 10 minObserve for 1H

  • USB Controlled Loudspeaker & Microphone Test Interface

    AmpConnect™ ISC - Listen Inc

    AmpConnect ISC is an all-in-one audio interface that simplifies your test setup and operation. It is a single, rugged, rack-mountable piece of hardware containing a high-accuracy audio interface, impedance box, amplifier, headphone amplifier, 2 microphone power supplies and digital I/O. It replaces multiple hardware devices, connecting to your computer via a single USB cable, and it is fully controlled by SoundCheck. This simplifies setup and calibration, eliminates cabling and reduces connectivity errors, as well as reducing overall system cost.

  • Multi-Protocol Test & Simulation Adapter for USB or Ethernet

    EXC-UNET2/xx - Excalibur Systems, Inc.

    The EXC-UNET2/xx is a multi-protocol test and simulation adapter for USB or Ethernet equipped computers. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of a number of communications protocols, both in the lab and in the field.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.

  • MCB Magnetic (Instantaneous) Trip Test Bench

    SCR ELEKTRONIKS

    The test bench is specially built for low voltage- B, C & D curve MCBs. Specially designed custom built jigs are able to accommodate single, double, three and four pole MCBs. Decades of experience has helped us to design current source (transformer) in a special way such that good current regulation and high accuracy is ensured with a variable range without the use of any variable transformer in the system. The product is better than the competition with conventional technology at a lesser price!

  • Test Solutions for Networked Vehicle Components/Connected Cars

    Infotainment & Telematics - NOFFZ Computer Technik GmbH

    Developing automatic test systems for the automotive industry is one of our core areas. This industry in particular is characterized by rapid technological progress and ever faster time-to-market requirements.In the vehicle, multimedia devices are used for pure entertainment, but also as vehicle information, which are intended to cover security and navigation services.Infotainment and telematics devices such as eCall modules, connected gateways, instrument clusters or the HMI (Human Machine Interface) are networked with each other and with the most important vehicle functions. All of this is made possible - in addition to GNSS (Global Navigation Satellite System) - by wireless and new communication standards such as A 2 B, BLE, C-V2X, Wi-Fi 6 and 5G.The complex networking is a very attractive factor for drivers and passengers, but this complex communication can become a major challenge for developers.High-speed interfaces and high-frequency modules used in combination must send and receive signals between the different devices absolutely error-free.With our individual and sensitive test and inspection systems, we also simulate vehicle components or emulate the vehicle environment and thus ensure the functionality of your devices. We take your pioneering developments to the next level.

  • In-Circuit Test Application Development & Fixture Fab

    Arxtron Technologies Inc.

    Arxtron Technologies has been in the Agilent3070/HP 3070 (Medalist i3070) In-circuit test application development and fixture fabrication business since 2004 when it took over the Agilent Canadian application centre. Our engineers count more than 35 years of experience and have been serving a variety of customers focusing on high end/ high node count complex products (Telecom, Medical, Industrial computers etc.) as well as Automotive and consumer electronics customers. We are also an Agilent channel partner.

  • SMT & THRU HOLE LOADED BOARD TEST PROBES

    SERIES 43 - Test Connections Inc.

    MechanicalMINIMUM CENTERS: .075 (1.91)FULL TRAVEL: .250 (6.35)WORKING TRAVEL: .167 (4.24)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 3 amps continuous at working travel, non-inductiveRESISTANCE: At 35 mA test current,30 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper or steel hardened to 55-60RC, both 24Kt gold plated over nickelBARREL: Nickel silver with 24Kt gold plated ID and OD over nickelSPRING: Music wire, 24Kt gold plated over nickel

  • Thermally Protected Ballast Heating Test Chamber

    TPB-UL935 - Lisun Electronics Inc.

    Working room dimension: 610×610×610mm• Temperature range: RT+10℃~+100℃• Materials of inner and outside chamber: Senior stainless steel• Insulation Material: Ultra-fine glass wool insulation material• Heater: Dedicated strip heater (heating surface area of 300 × 40 mm), each group three hundred watts, a total of four groups, with the power supply in parallel.• Special wooden test sample holder• Third gear temperature measurement points (at any time monitoring and conversion)

  • NI PXIe Based Platform for Radar/EW Test

    BAT - ADVINT, LLC

    • NI PXIe Based Platform for Radar/EW Test- Leverages a Variety of NI FPGAs/VSTs/Upconverters up to 44GHz- LabVIEWTM and LabVIEWTM FPGA Software Environment• Provides PDW to IQ Generation• Multi-Emitter System- Faster Simulation Setup- More Complex Scenario Testing- Ease of Changing Scenarios• Supports Multiple PDW Formats- Simple, Built-In PDW Format- Industry Standard PDW Formats (e.g., NEWEG)- Custom PDW Formats• PDW Data Accessible via Stored Files, or Live Streaming• Factory to Field Deployable

  • Semi-Rigid Test Probes Up to 6 GHz

    Fairview Microwave Inc.

    Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.

  • Small Device Noise Emission Test System

    ViAcoustics

    The Small Device Noise Emission Test System from VIacoustics is a turnkey solution for the measurement of noise emissions of small devices typically used in computers, consumer electronics, appliances and automobiles. The system includes all hardware and software necessary (see the components tab) for the determinations of sound power levels (1/3 octave band and A-weighted), emission sound pressure levels (normalized 1/3 OB, A-weighted and high resolution FFT) and *ISO 532B loudness. The system is designed to be operated by a technician for production level testing or to be used by an engineer in the product development process.

  • 60 GHz Noise Figure Test Set

    Noisecom

    The Noisecom 60 GHz Noise Figure test set has 4 separate systems designed to perform Y-factor noise figure measurements using a high performance Spectrum Analyzer or a dedicated receiver. Each system contains a highly stable V-band noise source, isolator(s), optional waveguide to coaxial transitions and an optional pre-amplifier for use with a spectrum analyzer. The two standard calibration tables have ENR data points at 1 GHz intervals.* System ENR is measured before the DUT connector and at the final output stage allowing for pre-test calibration of the system.

  • Reach-In Xenon Lamp Weathering Test Chamber

    ACMAS Technologies Pvt. Ltd.

    Weiber xenon lamp chamber uses xenon lamp to simulate the whole sunlight spectrum that can produce many destructive effects on the products. This simulation environment provided in the chamber is used to test the resistance of various manufactured products towards these destructive conditions. This chamber is used for quality control, product development and scientific researches and many more. With a variety of models and options, you can customize your chamber to fit your testing needs. Reach in chambers provide a compact testing area for small applications. These are easy to install, transport and occupies less space.

  • Wireless Device Test Sets & Wireless Solutions

    Keysight Technologies

    Keysight products provide mobile phone designers and manufacturers with increased measurement speeds, improved accuracy, and exceptional flexibility for testing mobile devices. Our one box test sets cover all the major technology formats: LTE-Advanced, LTE (FDD and TDD), GSM/GPRS/EGPRS/E-EDGE, W-CDMA/HSPA/HSPA+/DC-HSDPA, cdma2000®/1xEV-DO/eHRPD, TD-SCDMA/TD-HSDPA/TD-HSUPA, IS-95, TIA/EIA-136, AMPS, Bluetooth®, Bluetooth Enhanced Data Rate (EDR), Bluetooth Low Energy, ZigBee™, Wireless LAN (WLAN), 802.11a/b/g, 802.11n, NFC/EMV, MIMO, and WiMAX™.

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