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Characterization Platform
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Characterization System
System 7700
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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TIM Characterization Tools
Thermal Engineering Associates, Inc.
Combining Thermal Test Vehicles (TTVs) with Thermal Test Boards (TTBs) results in a set of tools that perform the basis for TIM thermal characterization under application-oriented measurement conditions. Availability of these tools creates a de facto standard that enable both TIM manufacturers and TIM users to compare measurement results under the same conditions.
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Arbitrary Load-Control Device Characterization
S94522B
The S94522B Arbitrary Load Control Device Characterization application. Ideal for bare transistor compact modeling. Generate Keysight’s DynaFET compact model or use large signal waveform data to generate models.
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Display Test & Characterization Solutions
The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
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Beam Characterization
Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Solar Cell I-V Characterization System
VS6821
Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Process & Material Characterization System
TriboLab CMP
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Characterization Of VCSEL Arrays Including Polarization Analysis
Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
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Device Characterization Software with Test Automation
14565B
The Keysight 14565B device characterization software is designed for easy evaluation of portable battery powered device (like 3G handsets, PDA, WLAN, and Bluetooth enable devices) current profiles to ensure long operating life of devices.
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Microwave Cavity Characterization
Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
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PCB Material Characterization
N19308B
PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
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Materials Characterization
The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
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DDR5 Receiver Conformance and Characterization Test Application
M80885RCA
DDR5 Receiver Conformance and Characterization Test Application.
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Laser Diode Characterization System
58620
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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EasyEXPERT group+ Device Characterization Software
EasyEXPERT group+
Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities EasyEXPERT group+ is upgradable from the previous generation of EasyEXPERT/Desktop EasyEXPERT software.
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Solar Cell I-V Characterization System
VS6825
Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Temp Characterized CalPod, 20 GHz
85531B
CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards. Very useful in thermal chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the thermal testing to perform a normal re-calibration.
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Portable Cryogen-Free Cryocooler-Based Material Characterization Platform
PPMS® VersaLab™
Quantum Design’s PPMS VersaLab is a portable, cryogen-free cryocooler-based material characterization platform. With a temperature range of 50 – 400 K, this 3 tesla platform is perfect for accomplishing many types of materials characterization in a limited space.
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Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
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Keithley Automated Characterization Suite Software
ACS
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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Bench & Characterization Boards
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Solutions for Nondestructive Characterization of Elastic
Sonelastic
Sonelastic® is a line of solutions for nondestructive characterization of elastic modulus and damping of materials by the natural frequencies obtained by impulse excitation technique.
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Amplifier Characterization With Wideband Modulated Signal
N5245BV
The N5245BV provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for amplifier measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements.
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Image Sensor Characterization Systems
Image Sensor QE and Spectral Responsivity Characterization
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Material Characterization Products
MeasureReady®
Unique real-time sampling architecture for synchronous sourcing and measuring.
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Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Pulse Characterization Sensors
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Automated Distortion Characterization and Information System
ADCS
Matrix Test Equipment Incorporated
The Automated Distortion Characterization and Information System (ADCS) is an extension of the Matrix equipment control software that automatically makes RF measurements selected from the following: Cross Modulation (XMOD), Composite Triple Beat (CTB), Composite Second Order (CSO), Carrier to Noise (C/N), Discrete Second Order, Discrete Third Order Distortion. Measurements are made, and the test results and a profile describing the test conditions are saved in a database for later retrieval or reporting.
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Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)
S94511B
The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
