Showing results: 2776 - 2790 of 3574 items found.
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ST2827 -
Saluki Technology Inc.
ST2827 series precision LCR meter has multiple functions and higher test frequency. With small size and portable appearance, it is convenient for use on the shelves. This instrument has a basic accuracy of 0.05%, maximum test frequency of 1MHz and resolution of 10 mHz. ST2827 series is easy to operate with a 4.3-inch LCD screen as well as English operation interfaces. Integrated transformer test function greatly improve the test efficiency. The instrument is also provided with multiple interfaces which can meet various requirements of the automatic sorting test, data transmission and storage.
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Smiths Interconnect
Filter connector series includes EMI/ EMP/ESD circular, ARINC, D-subminiature and micro-D connector styles. They can be combined with high energy TVS diode technology to achieve lightning and EMP transient protection. Smiths Interconnect's EMI filter connectors use multi-layer ceramic capacitor arrays together with inductive materials to realize robust, high performance low pass filter networks. Where required, transient protection can be combined with EMI /RFI filtering to provide maximum protection. The diodes as well as the EMI filter are packaged separately so the construction of the connector remains modular.
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Saluki Technology Inc.
SE2041 Digital Lock-in Amplifier provides an excellent performance within its bandwidth from 1 mHz to 60 MHz. With the advantage of the latest digital signal processing technology and high-speed 250MSPS 14-bit ADC, SE2041 can easily detect the phase and the magnitude of weak signals overwhelmed by various large noises. The performance of SE2041 is as good as other lock-in amplifiers all over the world, even better than them in some certain parameters, such as measurement accuracy, SNR, dynamic reserve, which meets the needs of scientific research and industrial application well.
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Neff Instrument Corporation
Low-level multiplexed systems have a single programmable gain, wide-band amplifier following the input multiplexer. To accommodate low-level signal signals such as those from strain gauges or thermocouples and at the same time high level signals from other sources, the throughput rate must be limited to enable the high bandwidth amplifier to settle to the correct value after switching to a new channel. This results in a relatively low aggregate throughput rate when compared to an amplifier-per-channel system. A major benefit of a well designed low-level multiplexed system is the extremely high performance/cost relationship.
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Tenney Environmental
Tenney Environmental offers a line of compact benchtop humidity and temperature test chambers that provide a small footprint and maximize workspace. These benchtop environmental chambers range from 1 to 5 cubic feet making them ideal for laboratories. In addition to laboratory applications, benchtop test chambers are commonly used for electronic, military, and pharmaceutical quality assurance and reliability testing, along with research testing and production processes. Even though Tenney benchtop environmental testing chambers take up minimal space they offer well sized interiors for product testing.
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Test Coach Corporation
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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Santa Barbara Infrared, Inc.
The FPA Test Set (FPATS) interface to the detectors under test (DUT’s) is via a custom pedestal plate which provides both a conductive heat path to both the individual DUT’s as well as the field of view limiting aperture plate. This custom pedestal plate protrudes through the customer provided DUT interface printed circuit board (PCB) and makes physical contact with the rear of the DUT packages and the aperture plate when the FPATS is in the closed position. The pedestal plate is mounted to the ambient source plate and its temperature is actively driven by this subsystem.
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Pickering Interfaces Ltd.
PXI simulation solutions for sensor simulation, including PXI Programmable Resistors—ideal for the simulation of resistive sensors and PXI Thermocouple Simulators—these provide multiple low-voltage sources ideal for simulating the operation of a thermocouple. Take a look below for all of our PXI Simulation Solutions, we also offer some of these in PCI format as well . All of our PXI simulation cards are supplied with comprehensive software drivers for Windows® XP/Vista/7/8, Lab Windows / CVI and LabView. The Pickering IVI drivers also fully support National Instruments' Switch Executive.
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Delta MATRiX -
Cohu, Inc.
Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
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Atico Export
All signal conditioning, as well as high-speed data acquisition and control functions are done by the unit and graphically interfaced through CATS, windows based software running on a standard PC. The system is capable of performing the full spectrum of HMA tests: dynamic complex modulus, flow number, flow time, indirect tension, beam flexural fatigue and resilient modulus. These tests are done with the appropriate testing modules. The different testing modules can be obtained after the initial system acquisition at the same discounted price. In addition, guarantees system upgrades in order to meet future standards .
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NEBULA -
Intellitech Corp.
You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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Analog Devices Inc.
Analog Devices digital-to-analog converter (DAC) portfolio provides solutions for your high speed and precision DAC applications. Thanks to complete data sheets and evaluation boards, as well as broad support among our clock and timing, RF, power management, and op amp portfolios, our DACs can help you reduce time to market and system design costs. A high speed range from 30 MSPS to multi-GSPS, 8- to 16-bit resolution, and a tiny package are just some of the features that make our industry-leading d/a converters stand out.
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Analog Devices Inc.
ADI integrated solutions combine both the D/A converter and driver in one chip to provide the required output directly from the digital domain. Analog Devices’ portfolio of leading industrial D/A converters and drivers provides a range of programmable output ranges from standard 4 mA to 20 mA for current loop communication to ±10 V for actuator control. ADI industrial converters offer considerable control functionality and advanced on-chip diagnostics to maximize system uptime, as well as eliminate the need for costly calibration routines needed by some traditional discrete architectures.
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MX CTS Series -
AMETEK Programmable Power, Inc.
A growing number of electronic products manufactured today have to meet international regulatory requirements for emissions and immunity. This is particularly true for products sold in the European community as well as a growing list of countries in the Far East. The California Instruments MXCTS System provides a cost-effective test solution aimed at verifying higher power product compliance to a number of AC and DC related harmonized test standards. The MXCTS system offers many of the same features and capabilities of the California Instruments CTS Series product line already in use at many EMC labs around the world.
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725S Family -
CAEN S.p.A.
The 725S family is a digitizer capable of recording waveforms along with performing advanced algorithms for online digital pulse processing (DPP). Utilizing DPP Firmware, users can acquire quantitative physical parameters (Integrated Charge, Pulse Shape Discrimination with very fine time resolution, Pulse Height Analysis) as well as read out waveforms with automatic pulse identification and baseline suppression on channel basis (Zero-Length Encoding and Dynamic Acquisition Window). The wide range of DPP algorithms supported by the 725S make it a “must-have” for any type of nuclear physics application.
