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Showing results: 331 - 345 of 419 items found.

  • Industrial Ovens

    Cincinnati Sub-Zero Products

    Our complete industrial oven product portfolio consists of heating and drying ovens, curing ovens, tempering ovens, conveyor ovens, tempering ovens, vacuum ovens, sterilizing ovens, explosion resistant ovens, conveyor ovens and IR Infrared ovens provide the technology for your testing and production processes needs. With advanced user and product safety features, our ovens meet many safety and industry requirements including EN 1539, and AMS 2750E or CQI-9. We have both pre-engineered and custom solutions.

  • Altitude Test Chambers

    Russells Technical Products

    Altitude chamber testing is important for manufacturers of products that might be shipped via air. It is especially important for defense and aerospace applications where pressure and vacuum conditions are even more intense. Our altitude test chambers simulate a variety of environmental conditions including temperature, altitude, humidity, and vibration for the rigorous testing standards of combined environment.

  • Residual Gas Analyzer

    Models XT100, XT200, XT300 - Extorr Inc.

    The XT residual gas analyzer (RGA) from Extorr offers exceptional performance and value. These RGAs provide a more detailed vacuum gas analysis than is offered by any other single competitive device. Each system comes complete with a multi-gauged quadrupole probe, a control and communications unit (CCU), and a real-time Windows software package.

  • Switchgear Testing Solutions

    IES Systems, Inc.

    IES Systems is a world leader in the design and manufacturing of power switchgear test systems.*GFCI/AFCI Circuit Breaker Test Solutions*Medium Voltage Breaker Test Solutions*Residential Circuit Breaker Test Solutions*Molded Case Circuit Breaker Test Solutions*AIR Circuit Breaker Test Solutions*Vacuum Bottle Test Solutions

  • Flash Diffusivity Analyzers

    DLF 2800 - TA Instruments

    The Discovery Laser Flash DLF 2800 is an advanced freestanding instrument for the measurement of thermal diffusivity and specific heat capacity of materials from room temperature to 2800°C. The distinctive design incorporates a proprietary laser, laser optics, detector, and furnace technologies, and along with the unique six-position sample carousel, ensures unprecedented measurement accuracy and sample throughput. With the ability to operate in a variety of atmospheric conditions, including inert gas or under vacuum, the DLF 2800 can characterize a wide variety of materials, including polymers, ceramics, carbons, graphite, composites, glasses, metals, and alloys.

  • Nanotesla Meter

    RM100 - Macintyre Electronic Design Associa

    The RM100 uses a differential measurement technique employing two subsystems to achieve its high accuracy. The first subsystem is a user controlled field neutralization unit with a dynamic range of ±100,000 nT and a resolution of 0.1 nT. The second is a low noise analog output magnetometer that measures the difference between the ambient and neutralization fields. The neutralizing field and difference field are displayed on a large Vacuum Florescent Display on the front panel. The difference field is also provided as an analog voltage through a connector on the back of the chassis. The factory calibration of the neutralization subsystem to ±0.01% is traceable to NIST.

  • WAFER MVM-SEM

    E3300 Family - Advantest Corp.

    The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.

  • New Link system Control and Image Capture Software

    Linkam Scientific Instruments

    New uncluttered and intuitive user interfaceLive display of current status for easy monitoringFull control of heating and cooling rate, limit and hold time of up to 100 rampsRow by Row control of Vacuum, Humidity, Tensile Force and Shear modes controllable and synchronised with TemperatureParameters of connected Linkam sensors displayed and stored - e.g. Vacuum, Humidity, Force, XY position and Pressure (dependent on connected stage type)Real Time chart of temperature and other measured parametersTrigger I/O for synchronisation with other equipmentTriggers recorded and plotted row by rowAutomatic setup of controls and parameter limits based on stage type connectedFull five point temperature calibrationUSB 2.0 to T96 and CSS450 ControllersOptional modules including Linkam Imaging Systems with high performance camerasIncludes .NET Components for easy integration into 3rd party applications e.g. LabViewNative 64 bit application

  • Laser Shearography NDT Sensor for Quality Control, Academic Research, or NDT Training

    FlawScout - Dantec Dynamics A/S

    The FlawScout is a laser shearography non-destructive testing (NDT) sensor designed to be used for (post-production) quality control, academic research, or NDT training. The sensor can be configured with thermal or vacuum (partial) excitation systems depending on the application. The FlawScout incorporates the very latest in phase-shifting technology delivering accurate and reliable measurement results through clear and sharp imaging with sub-micrometer displacement resolution.

  • Ultrasonic Leak Detection Camera

    Leakshooter LKS 1000-V.2 - Synergys Technologies

    1st ultrasonic compressed air, gaz and vacuum leak detector with camera. Specialy dedicated to visualize the spots where compressed air is leaking, the LEAKSHOOTER LKS 1000 – V.2 has many other applications such as : steam trap monitoring, bearing monitoring, electrical applications like partial discharge, corona effects, punctured isolators, electrical tracking detection.

  • AC/DC Hipot Tester

    HDYD-5kVA/50kV - HD Power Test Equipment Co.ltd

    The Hipot test is a nondestructive test which is effective way to determine the insulation strength for electric equipment . Our Hipot Tester can check dangerous flaws and make sure electric equipment continuous working. It is widely used on transformers, switchgear, cables, capacitors,aerial motors platforms and other related equipment like vacuum interrupters, blankets,instruments transformers generators.

  • Climatic Testing

    Environment Associates Inc.

    Environmental Test Chamber. Environment Associates' complete Climatic test facilities offer precise simulation of Temperature, Humidity, Altitude, Thermal Vacuum, Salt Fog, Sand and Dust, and Rain as well as many other specialized environments. Microprocessor Control along with calibrated recorded measurements and outstanding attention to detail by our technical staff make for a perfect test everytime.

  • Fully Automatic Solar Cell Module

    Laminator-Ⅲ - Qinhuangdao Boostsolar Photovoltaic Equipment Co., Ltd

    1. Effective lamination area: 2200mm × 3600mm2. Dimensions: length 12380mm × width 3665mm × height 2164mm3. Heating method: heat conduction oil heating4. Compressed air source pressure: 0.6~0.8MPa5. Working vacuum degree: 100~40Pa6. Evacuation rate: 70L/S7. Temperature control accuracy: ±1.5°C8. Temperature control range: room temperature - 180°C9. Temperature uniformity: effective lamination area ≤±2°C10. Lamination cavity height: 30mm11. Evacuation time: depending on the process, it is recommended to be 5 to 8 minutes12. Upper cover stroke: 300mm

  • WAFER MVM-SEM® E3300 Series

    E3310 - Advantest Corp.

    The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.

  • Laser Sherography NDT Sensor for Post-Production Quality Control or In-Field Component Inspections

    FlawExplorer - Dantec Dynamics A/S

    The FlawExplorer is a laser shearography NDT sensor designed to be used for post-production quality control applications or in-field (in-service) component inspections. Depending on the application, the sensor can be configured with thermal or vacuum (partial) excitation systems and may also be automated. It incorporates the very latest in phase-shifting technology delivering accurate and reliable measurement results through clear and sharp imaging with sub-micrometer displacement resolution.

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