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Transient

irregular short bursts of energy.

See Also: Surge


Showing results: 496 - 510 of 596 items found.

  • PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit

    782430-01 - NI

    PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.

  • PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit

    782432-01 - NI

    PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.

  • sbRIO-9236, Non-Enclosed, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module

    781580-01 - NI

    Non-Enclosed, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The sbRIO‑9236 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The sbRIO‑9236 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 Vrms transient isolation, providing high‑common‑mode noise rejection and increased safety. Non-enclosed modules are designed for OEM applications.

  • sbRIO-9235, Non-Enclosed, 10 kS/s/channel, 120 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module

    781579-01 - NI

    Non-Enclosed, 10 kS/s/channel, 120 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The sbRIO‑9235 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The sbRIO‑9235 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 Vrms transient isolation, providing high‑common‑mode noise rejection and increased safety. Non-enclosed modules are designed for OEM applications.

  • PCI-6123, 8 AI (16-Bit, 500 kS/s/ch), 8 DIO, PCI Multifunction I/O DeviceMultifunction I/O Device

    779409-01 - NI

    8 AI (16-Bit, 500 kS/s/ch), 8 DIO, PCI Multifunction I/O Device - The PCI‑6123 is a simultaneous-sampling, multifunction DAQ device. It offers analog input, digital I/O, two 24‑bit counters, and digital triggering. The PCI‑6123 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements. The PCI‑6123 dimensions require chassis slots that can accommodate full-length PCI modules.

  • PCI-6123, 8 AI (16-Bit, 500 kS/s/ch), 8 DIO, PCI Multifunction I/O Device

    779408-01 - NI

    8 AI (16-Bit, 500 kS/s/ch), 8 DIO, PCI Multifunction I/O Device - The PCI‑6123 is a simultaneous-sampling, multifunction DAQ device. It offers analog input, digital I/O, two 24‑bit counters, and digital triggering. The PCI‑6123 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements. The PCI‑6123 dimensions require chassis slots that can accommodate full-length PCI modules.

  • NI-9436 , 120 VDC to 240 VDC/120 VAC to 240 VAC, 8 Channel (Sinking/Sourcing Input), 20 ms C Series Digital Module

    784338-01 - NI

    120 VDC to 240 VDC/120 VAC to 240 VAC, 8 Channel (Sinking/Sourcing Input), 20 ms C Series Digital Module - The NI­‑9436 works with industrial, high-voltage logic levels and signals to connect directly to a wide array of industrial devices such as fans and motors. Each channel accepts signals from 120 VDC to 240 VDC and 120 VAC to 240 VAC; features transient overvoltage protection between the input channels and earth ground; channel to channel and channel to earth isolation up to 250 Vrms; and has an LED that indicates the status of each channel.

  • PoE Service Analyzer

    PSA-3002-SA - Sifos Technologies, Inc.

    Comprehensive Assessment of 2-Pair (802.3at) PoE Service at Any PD Outlet. The only PoE Service Tester built on Sifos PowerSync® Analyzer technology.• Analysis and Troubleshooting for All Standard 2-Pair (802.3at) PoE Installations Including Type-2, LLDP Power • Provisioning• Fully Verify Interoperability of PoE Service to the PD• Verify PoE Service Safety Features• Assess Continuous Power Delivery at the PD by PD Class• Assess Transient Power Delivery at the PD• Troubleshoot Intermittent PoE Service Problems• Colorful Microsoft Excel Reporting• Portable Instrument with Rugged Carrying Case

  • High Voltage Isolator for Logic Analyzers

    LX-08 - Link Instruments

    The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the LX-08 can provide simultaneous viewing of up to 8 circuits in the STANDALONE mode via the indicator array. Need to catch a transient event or map out a timing sequence? Just add a logic analyzer to the outputs of the LX-08 and turn it into a high voltage logic analyzer. High voltage signals that were hazardous for a logic analyzer can now be measured safely. Typical outputs of a high speed PLC sequencer can be precisely timed and measured from both sides of the control relay. With the built in user selectable AC filter circuit, an AC signal can be measured as DC events or AC cycles.

  • Surge Generator

    SGTEL-168 - Com-Power Corporation

    The SGTEL-168 is a versatile surge generator designed to simulate all the environmental surge transients as described in FCC TIA-968-B (formerly known as Part 68) and Industry Canada CS03 standard. It provides a single box solution Type A, Type B (metallic and longitudinal) and Powerline surges. These surges simulate the effect of lightning on telecom equipment under test. So it is also referred to as Lightning Simulator. The electromagnetic energy from the lightning couples into the equipment by powerline or telecom cable exposed to the lightning directly or indirectly. This model is an upgraded version of SG-168 with windows software control and a user friendly front panel for manual operation.

  • Oscilloscope Software Module

    Metra Mess- und Frequenztechnik in Radebeul e.K.

    *Oscilloscope for transient vibration signals*Displays the time response of vibration acceleration and VM-SCOPE+ also for velocity and displacement*Suitable for shock and drop testing of packagings and other products *Memory for 110 s post-trigger and 1 s pre-trigger real time signal recording*Two measuring cursors*Export function for bitmap and text*Up to four signals per window*One VM-SCOPE license can be operated simultaneously up to four times with different settings *Measurement of decay time*Measurement of HIC (Head Injury Criterion)*VM-SCOPE may trigger the frequency analyzer module VM-FFT*External Messengers *Offline measurement

  • High Performance High Power DC Electronic Load

    IT8900 Series - I-TECH Electronic Co., Ltd

    IT8900 series of high performance high power dc electronic loads provide three voltage ranges 150V/600V/1200V. The power expands to 600kW by master-slave paralleling, and maintains stand-alone functions. 50kHz high speed measurement, six working modes, transient over-power loading capability, CV loop speed adjustment, Measurement function, 25kHz dynamic test and other multiple accurate testing functions make IT8900 series well-suited for types of high power applications. Built-in LAN/USB/RS232/GPIB interfaces are designed formany fields such as power supply, power battery, DC charging station, generators, military and aerospace etc.

  • Power Discrete Tester

    Mostrak-2 - ipTest Limited

    M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).

  • Non-Multiplexed High Speed Continuous Function Card Overview

    Neff Instrument Corporation

    This type of system can be designed with benefits of both the multiplexed amplifier-per-channel and transient recorder systems. Benefits of the non-multiplexed amplifer-per-channel system include: High Sampling Rates: With an ADC per channel, the sampling rate is not encumbered with considerations such as multiplexing and post-amplifier settling time.Superior Filtering: With an ADC per channel, digital filtering can be used to augment analog filtering to achieve better anti-aliasing performance with much lower effective sampling rates.Superior Phase Matching: Digital filtering provides much steeper, more predictable rolloff rates and phase characteristics than analog filtering with greater stability with time and temperature changes at lower cost.

  • Connect Generators to the Grid

    GridCode - DIgSILENT GmbH

    DIgSILENT has developed a new verification tool called DIgSILENT GridCode. The software has been designed in response to the need to verify whether a conventional or renewable power plant is compliant with local Grid Code interconnection requirements on basis of generating unit tests. There is a new trend towards verification of requirements at the point of interconnection of a power plant using transient stability simulations with numerical models. An increasing number of Transmission System Operators are including model validation methods to quantify the risk and uncertainty when using these simulation models in stability studies. These new methods have been included in the DIgSILENT GridCode tool.

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