Showing results: 796 - 810 of 5306 items found.
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ViTec Co. Ltd
The automated control system based on the measuring system implements the following main functions:control and management of the units of the test stand;measurement and recording of parameters related to the APU tests and characterizing the operation of the test bed units;blocking the start and emergency stop of the APU in accordance with the specified conditions;control of calibration / calibration processes of metering channels and calculation of metrological characteristics in accordance with verification methods;formation of text test reports;the formation of graphic protocols;the formation of an archive of test reports, graphical protocols for changing parameters during testing, and calibration / calibration protocols for measuring channels.
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YGZQ Series -
Shanghai Jiuzhi Electric Co., Ltd.
Over Voltage Cycle Test System is the type test, repeated over voltage from lowest rated temperature to the ambient temperature to improve the dielectric performance for the shunt capacitor above 10kV. In the recent year, this test is more popular to done in the modern factory.
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NX5300 -
Terotest Systems Ltd.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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ROTO-SCAN -
Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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ViTec Co. Ltd
The VR-226N helicopter reduction gearbox test bench measuring system is designed to automate the VR-226N gearbox test process in order to ensure high quality product testing, increase the reliability of measurement information, increase the profitability of the test bench and reduce malfunctions associated with the human factor.
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EMC Instruments Corporation
Anechoic chamber, radio isolation room construction, removal, maintenance and repair. System Integration of complete Test System. Development team has the expertise and technical experience and provide a customized service demand, the project includes a full range of EMI / EMS / RF test equipment with neighboring sell and repair reference signal source Noise Generators Signal Generators
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36XX -
FETservice, Inc
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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SBExpress-RM5 -
SANBlaze Technology, Inc.
The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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NX5300 -
Marvin Test Solutions, Inc.
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems. Advanced capabilities include simultaneous support of up to 255 devices on a single scan chain, support of sixteen NX5300 systems controlled by single host machine and configurable JTAG/BDM clock rates up to 24 MHz. The NX5300 includes 16 high-speed measurement channels. Each channel can measure logic levels, frequency, count events and perform a CRC check at rates up to 100 MHz.
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SBExpress-RM4 -
SANBlaze Technology, Inc.
The SANBlaze SBExpress-RM4 is a complete turnkey PCIe® Gen4 NVMe SSD Drive validation test system. The SBExpress-RM4 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen4 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM hardware provides a rackmount chasis with sixteen dual or single port front-accessible drives. The hardware can be easily daisy chained for maximum scaleability.
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SGMF(T) Series -
Shanghai Jiuzhi Electric Co., Ltd.
Onsite mobile AC high voltage test systems are used for withstand voltage testing, partial discharge measurement, tan delta measurement to instrument transformers, GIS, GIL, switchgears and etc after they are installed onsite and for purposes of diagnostics in asset management up to 900kV/10A.
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InstrumentStudio -
NI
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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HBM-TS10-A -
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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OTS -
Optik Elektronik Gerätetechnik GmbH
The optics test stations of the OTS series enable the computer-based, software-controlled measurement of optical parameters of individual lenses (including cylindrical lenses) and optical systems. Measured variables are, for example, focal length, MTF, focal length, radius, contact dimension, centering, wedge angle and deflection angle. The optional software module LensTest enables the measurement of the center thickness of lenses and air gaps in complete lenses as well as the measurement of the centering error of individual surfaces.
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KRD14 series -
CME Technology Co. Ltd.
KRD14 series pneumatic shock response spectrum tester is used to measure and determine the shock resistance of electrical and electronic products or packaging, and to evaluate the reliability and structural integrity of the test product in a shock environment. The shock response spectrum is the total result of a series of single-degree-of-freedom linear systems with different natural frequencies subjected to the same shock excitation response. When a product is subjected to an impact, the maximum value of its impact response means that the product has a maximum stress. Therefore, the shock response spectrum tester can better simulate the shock wave and shock energy suffered in the real environment.
