Showing results: 3421 - 3435 of 5294 items found.
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Pickering Interfaces Ltd.
The design is fully scalable, allowing a variety of matrix sizes to be offered in a single family. It maintains a close path loss match for all routes through the matrix, minimizing the calibration effort that has to be invested by users in optimizing their test system performance. The design is non-blocking Y to X (or X to Y) allowing any input to be connected to any output. The construction is based on high quality electromechanical relays which provide a fast operating time compared to microwave relays.
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2000A -
SCR ELEKTRONIKS
SCR ELEKTRONIKS have developed “TEMPERATURE RISE TEST BENCH FOR MEDIUM VOLTAGE SWITCH BOARDS” to measure rise in temperature at various points as mentioned in standard at junctions. The set-up consists of a True RMS Constant Current Source (to maintain the Current within + / - 1 % of set value with Digital Indication), PC based control system, Temperature data logging on PC, Servo-Controller and other indications. Digital voltmeter Primary Voltage) indicates the position of auto transformer (variac).
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Analysis Tech Inc.
The Analysis Tech TIM Tester 1300 is an automated test system for measurement of thermal impedance and conductivity on thin, thermally conductive materials of the type frequently used for electronic packaging, as well as a wide variety of flexible or rigid solids and semi-liquid or viscous materials. Generally, the TIM Tester 1300 can accommodate samples with high-to-medium thermal conductivity with contact pressures ranging from 10 to 550 psi (70-3800 kpa) and at sample temperature ranging from 15C to 70C.
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JT 2154 -
JTAG Technologies Inc.
The JT 2154 is an experiment board based on National Semiconductor’s STA111 device, aimed at users looking to utilise addressable bridge/multiplexors within their designs, and thus set-up ‘system level’ JTAG access. The unit can also be used in semi-permanent installations to expand the TAP (Test Access Port) count on JTAG Technologies controllers in order to address highly segmented designs. Built-in support for ScanBridge-type devices within ProVision allows easy set-up of TAP assignments and device addressing.
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781098-01 -
NI
100 kS/s/ch Simultaneous, ±10 V, Isolated, 4-Channel C Series Voltage Output Module - The NI‑9269 is a channel‑to‑channel isolated analog output module. The NI‑9269 adds channel‑to‑channel isolation for increased safety and improved signal quality. Channel‑to‑channel isolation is commonly needed for applications that have multiple electrical systems, such as automotive tests, or industrial applications that are subjected to increased noise and often contain multiple ground planes.
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781098-02 -
NI
100 kS/s/ch Simultaneous, ±10 V, Isolated, 4-Channel C Series Voltage Output Module - The NI‑9269 is a channel‑to‑channel isolated analog output module. The NI‑9269 adds channel‑to‑channel isolation for increased safety and improved signal quality. Channel‑to‑channel isolation is commonly needed for applications that have multiple electrical systems, such as automotive tests, or industrial applications that are subjected to increased noise and often contain multiple ground planes.
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NEOSEM TECHNOLOGY INC
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
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DIOEasy -
Marvin Test Solutions, Inc.
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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In-Phase Technologies, Inc.
Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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Lorlin Test Systems
The Double-Impact Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The system uses a Windows 10® 64-BIT OS and a USB 2.0.
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1940000140-0000 -
ELMA Electronic, Inc.
The Elma Electronic VME / VME64x load board provides a means to test the power generated by and cooling capability of VME systems. This makes it easier to locate hot spots in the chassis, so the airflow can be properly directed.
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RogaREC -
ROGA-Instruments
RogaREC software is designed for many different test and measurement devices which allow using such Front End system as a PC based Data Recorder; RogaREC works also with any PC sound cards.
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Iwasaki Electric Co., Ltd.
Whatever your application, from an environmental chamber for small components to an extensive array for a complete automobile or aircraft test, EYE / Iwasaki has the experience to provide a solar lighting system customized for your requirements.
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Meltak Technology
Design for phone device test and system verify.Phone device: CPU,flash,baseband,LPDDR,power IC.etcPitch range from 0.30 to 1.27mmKey material: PEI,Peek,Torlon,PPS.etcContact with top pogo pin
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8000 -
Chroma ATE Inc.
It is a customized system for Electric Vehicle AC Charging Compatibility testing.Hardware : Integrated by AC Source/Power Meter/DC Source/Function Generator/Scope/ EVSE CP & PD Simulator…。Software : Fully complies with SAE-J1772, CNS15511 test requirements