Showing results: 3181 - 3195 of 5297 items found.
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390PT -
PulseTech Products Corp.
The 390PT Battery and System Tester lets you quickly, safely and accurately test both 6-Volt and 12-Volt lead-acid flooded, AGM (flat and spiral plate) and gel cell batteries in or out of the vehicle and test 12-Volt and 24-Volt charging systems for proper operation. Combined singe load, dynamic resistance technology and algorithms display battery voltage and capacity in easy to understand results in seconds. The handy "QUICK START" instruction guide is printed on the back of the tester.
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ViTec Co. Ltd
The hardware part of the measuring system of the test bench is built on the basis of equipment from National Instruments and contains the following components: multichannel switching system for signal conditioning SCXI, interrogation system of "fast-changing" voltage signals and AC power PXI, including M-series NI PXI-6220 board for SCXI module measuring channels, a high-performance Ethernet controller for the distributed I / O system and industrial control cFP-2110 running operating systems hard real-time, multi-channel vibration measurement complex K-5101.
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400SW -
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection.
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National Technical Systems
Gravelometer testing is designed to evaluate the resistance of vehicle surface coatings (paint, clear coats, metallic plating, etc.) to chipping caused by the impacts of gravel and other flying objects in accordance with SAE and ASTM standards. The primary usage of this test is to simulate the effects of the impact of gravel or other debris on automotive parts. Test samples are typically mounted in the back of the Gravelometer, and air pressure is used to project 1 pint (approximately 300 pieces) of gravel at the sample. The test sample is then removed and gently wiped off with a clean cloth. Tape is then applied to the entire tested surface. Removal of the tape then pulls off any loose fragments of the coating. The appearance of the tested sample is then compared to standard transparencies supplied by SAE to determine the chipping ratings. Visual examination can also be used to describe where in the coating/substrate system that the failure has been induced.
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Ponovo Power Co., Ltd.
PONOVO has long-term follow-up technology in China and abroad. Based on its own mature intelligent power detection equipment, and according to its own advantages in the field of new energy, PONOVO could be able to provide users with professional new energy test system solutions. In the field of electric vehicle technology, the electric vehicle charging facility detection platform based on the Internet cloud platform was introduced. This platform is one of the few domestic testing platforms that can automatically test the charging piles for network inspection, project acceptance, and factory testing. The platform has the advantages of automatic testing, low usage threshold, and high integration. It is widely used in the detection of relevant charging facilities in more than 20 provinces and cities in China, effectively meets the inspection of electric vehicle charging stations, and provides powerful technical support for the site acceptance test of charging stations.
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mTOP™ -
GL Communications Inc.
Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
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GL Communications Inc.
Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
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MBP850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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FLP850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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XMC850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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PCIE850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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VPX850 -
Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Silicon Control Inc.
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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ATE QT2256-640 PXI -
Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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MOTOMEA
*The performance data of electric motors, in the majority of all cases, is performed by a brake test. Power input is calculated from current and voltage. Torque and power output are measured with a brake. It is important to reach, for each point, a persistent temperature. In case of large outer rotor BLDC motors, which are usually used for electric scooters, this traditional procedure may take many hours to complete, and is very complicated. *For several years, an innovative motor tester of MEA Testing Systems Ltd. is on the market. This testing system avoids any temperature confusion by testing a motor at constant temperature over the entire speed range. The test procedure is very fast, and gives the full load performances, including PWM current, voltage, torque, and driver efficiency, from stall up to no load. *During the test procedure, the motor is freely accelerated from stall to no load speed. The load of the motor is only the predetermined inertia of the rotor. From the moment of inertia and the acceleration, the torque of the motor is calculated and, also, the power output over the whole speed is given. Since the entire measuring time, depending on the motor size, is usually less than one second, the motor has no time to warm up. It remains at room temperature.
