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Test Systems

group of interoperable devices whose integration perform a common test purpose.

See Also: Systems, Equipment, System Integrators, System Test, System Integration


Showing results: 3061 - 3075 of 5294 items found.

  • Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card

    GX5296 - Marvin Test Solutions, Inc.

    The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

  • Dissolution Media Prep System

    Media-Mate Plus - Teledyne LABS

    The Media-Mate Plus™ is the perfect media-prep system for a busy dissolution lab that demands both speed and accuracy. It delivers pre-heated, filtered, deaerated, and volumetrically dispensed media to 6 or 7 dissolution vessels simultaneously in less than five minutes. Built on a unique ergonomic cart, the Media-Mate Plus offers maximum portability for easy servicing of many dissolution test stations.The Media-Mate Plus exceeds USP / US FDA recommended media deaeration specifications making it one of the most effective tools in ensuring successful Performance Verification Tests (PVT). By significantly reducing dissolved oxygen levels and dispensing media simultaneously into 6 or 7 vessels, the MediaMate Plus eliminates the variable caused by Prednisone tablets that are highly sensitive to dissolved oxygen levels, thus facilitating successful passage of PVT tests.

  • Wafer Probing Machine

    UF3000EX-e - CSE Co.,Ltd

    Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.

  • AC DC Test Equipment

    Hilo Test

    The products impress with a variety of technical features: TFT display, Ethernet interface, automatic test sequence to a fully electronic generator for even faster and more accurate tests. Our safety testers can be used both stand-alone without a PC as well as integrate with existing systems.

  • Quadruple Function Tester with Shielded HF Test Chambers

    UTP 9011 RF - NOFFZ Computer Technik GmbH

    Circuit boards are the heart of all electronic devices. To ensure the reliable function of these boards, detailed tests are essential.Our board-level tester UTP 9011 RF works safely, quickly and cost-optimized at circuit board level. Our interchangeable adapters are particularly efficient in this system, with which you can even test different test items at the same time. The shielded NOFFZ HF test chamber always ensures consistently good results.

  • Digital Insulation Testers

    Premier Electrosystems

    Premier Electrosystem's Insulation Resistance test (also known as Megger, Mega Ohm Meter, Million Mega Ohm Meter) indicates whether any corrective maintenance or replacement of installed equipment is necessary, to assess if the newly installed equipment can be safely energized, and to trend the gradual deterioration of the equipment over its service life. Insulation Resistance Test is carried out to ensure the healthiness of overall insulation system of electrical equipment. It reflects the presence or absence of harmful contamination, dirt, moisture and gross degradation. Common areas of application are testing of appliances, wires, transformers, harnesses, motors, etc.

  • Innovative Multiple - Object Tracking Radar

    iMOTR - BAE Systems Inc.

    We have advanced the multiple-object tracking radar concept with an innovative application to meet today’s test range needs. The iMOTR features enhanced clutter suppression capabilities to deliver clearer, more accurate assessments of object launch trajectory and flight path data on airborne and low flying objects. This tracking information can then be handed-off to other radars or data collection sensors in real-time. The system is also better equipped to provide precision time, space, and position information (TSPI) data of multiple objects in flight over a wider field of regard than the current test range radars in service.

  • Bi-axial Dynacell Load Cells

    Instron

    During tests carried out on servohydraulic machines, elements of the system are subject to acceleration. As a result, in addition to the force applied to the specimen, the load cell also reads forces resulting from its own movement and the mass of the grips and fixtures attached to it. Dynacell is the world's first truly dynamic load cell, designed from the outset for measuring dynamic loads. Dynacell introduces the following advantages:*Reduces dynamic load errors which can be a significant percentage of reading *Increases productivity by allowing higher frequency operation while maintaining test validity *Improvements such as doubling the frequency are common

  • Test & Measurement Matrix Switches

    Quintech Electronics and Communications Inc.

    Quintech Electronics & Communications, Inc. have provided keystone NEXUS brand Test & Measurement matrix switches to tier one wireless testing laboratories around the world. These RF matrix switching systems allow for wireless test lab automation providing repeatable, recordable and remotely controlled testing. Our global customer base includes network service providers, network equipment, chipset, and device and UE manufacturers. This automation is critical for the complex, ever changing wireless environment referred to as 4G, 5G Wi-Fi, LTE, LTE-U, IoT, commonly referenced with regard to convergence and the networked society.

  • RF/Switching

    SMX-6XXX (RF/Switching) - AMETEK VTI Instruments

    The VTI SMX-6xxx Series of high density non-blocking RF multiplexers deliver exceptional performance and reliability in a compact single-slot configuration. Front panel connectivity is available in both SMB and PKZ formats to integrate seamlessly into new or existing test systems. Embedded virtual schematic control further simplifies setup and debugging allowing all relays to be engaged independent of application software and device drivers.The SMX-6xxx Series delivers unmatched bandwidth and isolation performance resulting in exceptional measurement integrity that is ideal for the most demanding aerospace, defense and automotive automated test equipment (ATE) applications.

  • NI Automated Test Software Suite

    NI

    The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application

  • Fracture Mechanics Clip-On Gages

    Model 3541 - Jinan Testing Equipment IE Corporation

    The Model 3541 is designed for determination of fracture mechanics parameters such as JIC, KIC, R-curve, fatigue crack growth rate (da/dN), and testing to standards such as E1820, E399, E647, etc. These COD gages conform to the requirements of E1820 (the replacement for E813 and E1737) for JIC and R-curve determination. Special configurations are available to meet the requirements of ASTM E399 for fracture toughness (please consult the factory for these configurations). In addition, the modified groove design complies with E1820 tests where greater stability and accuracy results from the sharper groove root. Clip-on gages are used for a variety of fracture mechanics tests, including compact tension, arc shaped, disk shaped, bend specimens or other specimen geometries in compliance with ASTM and other standards organization’s test methods. Clip-on gages can be used directly on test specimens where the knife edges are integral with the test specimen or, alternately, with optional bolt-on knife edges mounted on the test specimen.The Model 3541 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.

  • VLF Testing and Diagnostics System

    PHG 70 TD/PD - BAUR Prüf- und Messtechnik GmbH

    Cable testing and diagnostics with the BAUR PHG 70 TD/PD. With the PHG TD/PD, you get a multifunctional cable testing and diagnostics system that was specially designed and developed for medium-voltage networks. The PHG TD/PD system is also the only cable testing and diagnostics system that gives a comprehensive overview of the quality and ageing condition of the test sample. The diagnostic methods TD and PD are mutually complementary, because on one hand you can detect the complete condition and on the other hand locate * individual faults in the operating resources.* High performance VLF truesinus testing device (3 kW) with regulated output voltageCompact, enclosed design in 19" format* Variable installation option with separate control and voltage unit* Variable connection options to cable stations of different models

  • Squeak & Rattle Sub-System And Component Testing

    MB Dynamics Inc.

    At MB Dynamics, we’re proud to provide clients in a wide range of industries with quiet, custom turnkey component testing systems for combined squeak & rattle testing as well as durability testing of different components and subsystems (in 1 to 6 DOF). Test items can be excited in one or more axes to understand and characterize the physics and root causes of BSRs. Real-world, on-road vibration conditions are multi-axis simultaneous – vertical, fore-aft or longitudinal, lateral, roll, pitch, and yaw – 6 degrees of freedom or 6 DOF. Affordability drives decisions to find BSRs by exciting in one or two – fewer than 6 DOF. That has been a driving force for MB – be effective at finding BSRs with a lesser number of shakers (DOFs) and thus reduce the test equipment cost of finding BSRs. Vertical-only can be effective; sequential vertical then fore-aft then lateral is one step closer to real-world; creating vibration in four or five axes of response simultaneously is even closer; and full 6 DOF systems that are quiet come closest to duplicating in the lab the on-road conditions. MB offers all these possibilities to meet trade-offs of budget, test time, road replication, and BSR detection effectiveness.

  • Reverberation Chamber

    RTS65 - Bluetest AB

    Our new RTS65 reverberation chamber is designed to optimize the time you spend on OTA measurements. Our development focus has been on increasing the productivity in your lab. We want your focus to be on your results, not the test equipment. We have developed a new generation of RTS that is an integrated system which will give the user experience every engineer deserves..

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