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Test Systems

group of interoperable devices whose integration perform a common test purpose.

See Also: Systems, Equipment, System Integrators, System Test, System Integration


Showing results: 2956 - 2970 of 5294 items found.

  • High-voltage Testers

    Kharkovenergopribor Ltd.

    Operational safety and reliability of electrical equipment and cables directly depend on the dielectric strength of the insulation. Portable and mobile high-voltage testers from KharkovenErgoPribor Ltd. are used for acceptance and operational testing of substation equipment and cable lines, as well as for checking the reliability of personal electrical safety equipment. Our testers range is represented by test systems that allow conducting high-voltage tests with DC and AC voltage, testing polymer insulated cables with very low frequency, testing and locating faults in cable sheath, as well as performing the initial burning of insulation on damaged sections of cable lines.

  • NI-9225, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module

    780159-02 - NI

    300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.

  • NI-9225, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module

    780159-01 - NI

    300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.

  • Vibration Test Chambers

    Cincinnati Sub-Zero Products

    Our vibration test chambers offer a variety of solutions for vibration testing. AV-Series and CV-Series vibration chambers offer rapid temperature change rates with combined temperature, humidity, and/or vibration environments. These chambers are designed for compatibility with your choice of electrodynamic or mechanical vibration systems. The Benchtop Vibration Table, ideal for vibration testing of small components or electronics and is designed for stand-alone testing or may be placed in an environmental chamber for combined temperature and vibration testing. HALT/HASS Test Chambers provide extreme vibration and temperature capabilities in order to identify design and product weaknesses.

  • Dual HD Test Signal Generator with Embedded Audio

    7751TG2-HD - Evertz Microsystems Ltd.

    The 7751TG2-HD Test Signal Generator provides a cost-effective method of generating 1.5Gb/s HDTV 4:2:2 and 4:4:4 test signals. The 7751TG2-HD is ideal for checking signal path integrity, or to determine system performance over varying cable lengths. The 7751TG2-HD generates test signals in a wide variety of SMPTE 292M video formats.

  • GPIB Controlled Signal Routing Box

    GPIB - Test Electronics

    Test Electronics will customize the TE3000 GPIB signal routing box for your test application. Then, you simply rack and stack all the equipment, cable all the switched signals to the back of this GPIB box, add a rack mount computer, plug in the National Instruments GPIB board and software. Then run your customized GPIB based test system.

  • Digital Test Instrumentation

    Di-Series™ - Teradyne, Inc.

    The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).

  • PXIe CW Source, 1 MHz to 3 GHz or 6 GHz

    M9380A - Keysight Technologies

    Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system

  • Optical Test Instruments

    OptiSpheric® & Spherometer - Trioptics GmbH

    TRIOPTICS' OptiSpheric® and Spherometer are the classic optical test systems for spherical lenses that can be found in virtually any optical manufacturing process. While the Spherometer is used for the tactile determination of lens radii, OptiSpheric® systems provide contactless measurement of effective focal length, back focal length, flange focal length, MTF on axis and the radius of lenses. Specific upgrades allow determining centration errors and angles on plane surfaces. Systems for testing IOLs in compliance with EN/ISO 11979 form a class of their own. OptiSpheric® IOL R&D is preferably used for measuring single lenses while OptiSpheric® IOL PRO 2 is designed for the fully automated IOL measurement in serial production.

  • MPI SiPH Probe Systems

    MPI Advanced Semiconductor Test

    MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE

  • Universal Offline AXI Systems

    AXI XT-6 Series - Nordson Corporation

    The XT-series provides the advanced inspection capability of Nordson TEST & INSPECTION's inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acquisition with high resolution. It is suitable for high-quality X-ray analysis of electronic assemblies and material analysis of parts that require flexible part manipulation with multiple inspection angles. For batch modes and volume inspection the XT-6 can be equipped with a single-sided conveyor setup and magazine load/unload station (XT-6A).

  • Single Channel Signal Buffer Module

    Alliance Support Partners, Inc.

    Signal quality problems caused by mismatched impedance can result in intermittent measurements and faulty diagnostics. This is most often observed when transporting a test program from one system to another, such as re-hosting it from an older generation system to a new one. The primary root cause of the impedance mismatch is the signal path from the UUT to the measurement instrument. The switching system technology often is responsible for much of the distortion. The Signal Buffer Module (SBM) is designed to receive a signal from the UUT with high impedance output and accurately reproduced it at the output for delivery to the measurement instrument. The SBM output matches the 50 ohm input impedance of most measurement instruments and result in significantly reduced signal distortion.

  • Ground Grid Tester

    GGT Series - IBEKO Power AB

    The GGT500 ground grid integrity tester is designed for inspection of the substation ground grid. It can also be used as a portable micro-ohmmeter with Both Sides Grounded and Remote Control functionalities. It is intended to inspection the conditions of a grounding system beneath substations, testing of medium- and high-voltage circuit breakers, disconnecting switches, high-current bus bar joints, cable splices, and different high-current links.In the United States when inspecting the quality of the grounding systems beneath a substation, the proper procedure is to inject 300 A DC during a time period of 60 s. This is what the GGT500 will do, and in that time period, the current path and voltage drop are checked. Also acting as a micro-ohmmeter, the GGT500 can test low resistance values by producing high test currents of up to 500 A.The instrument is placed in an unbreakable, plastic case with IP67 protective rating (with closed lid). Although very portable and lightweight, micro-ohmmeters have very high output power capabilities. High output voltage enables a wider measurement range at higher test currents, as well as the use of thinner/longer test cables. GGT500 ground grid integrity tester generates a true DC ripple-free (less than 1 % ripple) current with automatically regulated test ramps. This significantly decreases magnetic transients and ensures great accuracy.When used for testing in Both Sides Grounded conditions, a special current clamp powered from the ground grid integrity tester is used for measuring a current through groundings. If even a higher safety level is required, the remote control feature enables the operator to perform measurements from a distant location, away from the instrument and test object.

  • Primary Current Injection Sets

    R.R.Transformers & Equipments

    Protective devices such as relays, overload Coils, Circuit breakers and CTS etc. must be checked regularly to ensure that they are always ready to operate correctly, Routine current injection testing will quickly detect faulty or incorrectly adjusted protection circuits / devices & will be possible to prevent serious damage to the system. Primary injection kit is designed to operate on single phase 230/240 volts AC 50 HZ to develop smooth & continuous test current as for loading, calibrating, and testing of CTS, Bimetal Relays, Protection Relays etc. The test set gives high current output at low cost and with inherent safety. The primary current injection testing checks all parts of the protection system by injecting current down the cable / bus bars. The application of the primary current injection sets is to ascertain the current carrying capacity of any Conductor, insulator, connector or calibration of CTS / Bi-metallic relays etc.

  • ARINC 664 ProView Software

    ProView - Innovative Control Systems, Inc.

    ProView is a low cost, ARINC 664 bus reader / logger / analyzer designed specifically for the Rockwell-Collins specific ARINC 664 implementation that works well, is very low cost, and no external capture hardware is required. Innovative Control Systems, Inc. is pleased to announce the release of our new ARINC 664 ProView logging analyzer software which allows you to perform live display, recording, playback, and Export (to CSV file) of Rockwell Collins specific ARINC 664 data on a suitable Microsoft® Windows® operating system based laptop or PC. No additional capture hardware is required for this analyzer, just an available Ethernet port on the computer and you are able to analyze your data. The software can also be used to create configuration files for our FTSIU flight test data acquisition interfaces as well as playback flight test data sets recorded by that equipment.

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