Showing results: 2266 - 2280 of 5294 items found.
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Ball Systems, Inc.
The cross-disciplinary strengths of our technical teams at Ball Systems can assist with your most challenging design, production, and test problems from concept to design, to rapid prototyping, and through to production. We are a fully integrated service provider.
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VS6845E -
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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MBX1 -
OMICRON electronics
With the MBX1 platform and our software, you can easily test SCADA and substation automation systems (SAS) in a highly secure way. The mobile solution allows you to perform quick assessments and temporary monitoring, e.g. during commissioning.
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Freese Enterprises Inc.
Several examples of our automatic test equipment expertise can be found below by clicking on each description in the table. For more information on a custom automated system design for your application, a fixed price quote, or time and materials rates.
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Scorpion ILS 1000 -
Terotest Systems Ltd.
Acculogic's Inline Scorpion is a fully automated in-circuit test system for high volume production with the added advantage of a very fast change over time for different assemblies - less than one minute, including fixture change.
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Instron
Provides system control, data acquisition, real-time graphs, calculation of results, storage of data to disk, and post test graphs and reports in accordance with the relevant sections of ASTM E606-04, BS 7270 (2006), and ISO 12106 (2003).
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ECAD System 2005 -
CM Technologies Inc.
The ECAD System 2005 is a suite of test instruments for both lumped and distributed data for analysis of electrical circuits and/or wiring harnesses. ECAD is completely self contained, and has a built-in multimeter, impedance meter, TDR, and megohmeter.
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Crystal instruments
EDM Modal Geometry/ODS/Animation is the primary EDM Modal software module, and is required for every EDM Modal system. This option provides fast and efficient structural model generation and full 3D visualization of test and analysis results.
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TestStation -
Teradyne, Inc.
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Kontron
The Hartmann Load Boards were originally designed for in house use to test, setup and qualify standard chassis and custom systems. As demand for these products presented itself, Hartmann answered the call with a lineup of high quality load boards.
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TTCN-3 -
Verifysoft Technology GmbH
Elvior TestCast is a TTCN-3 test development and execution platform which includes TTCN-3 editor, TTCN-3 compiler and TTCN-3 executive. TestCast can be used for testing software or hardware components in a wide range of industry sectors. Candidate systems for testing with TestCast can be found from the industry sectors where TTCN-3 is widely used as an accepted generic test language - telecommunication, IOT, transport and automotive, military and defense. TestCast is ideal for incremental project development. It can be used for testing of an individual task or process. One can continue with the integration tests of a subsystem consisting of processes and later to integrate those subsystems and test them together as a whole software subsystem. It is even possible to continue to perform software/hardware integration tests where TestCast can be used to test software embedded in target hardware.
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SA 30i+ -
Scope T&M Pvt, Ltd.
SA 30i+, the wireless Leakage Current Analyser from SCOPE is a State of the Art, On-line test system for Residual Life Assessment of Metal Oxide Surge Arresters. The instrument measures and directly displays the values of Total Leakage Current and Third Harmonic Resistive Leakage Current. It provides system harmonic compensation as per IEC 60099-5-B2. It provides Corrected Resistive Leakage Current after applying correction factors for change in system voltage & temperature.
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IMADA, Incorporated
Imada offers manual and motorized wire crimp test systems in either vertical or horizontal configurations.Lever-operated systems offer basic functionality and rapid destructive testing up to 220 lbf.Motorized systems have speed control and are capable of destructive or force-controlled non-destructive testing up to 1100 lbf.Choose from manual or automatic wire-gripping fixtures.Digital gauges offer data output for analysis with data acquisition software.Create your own custom configuration or consult our application specialists.
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Accel-RF Corporation
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Noisecom
The Noisecom 60 GHz Noise Figure test set has 4 separate systems designed to perform Y-factor noise figure measurements using a high performance Spectrum Analyzer or a dedicated receiver. Each system contains a highly stable V-band noise source, isolator(s), optional waveguide to coaxial transitions and an optional pre-amplifier for use with a spectrum analyzer. The two standard calibration tables have ENR data points at 1 GHz intervals.* System ENR is measured before the DUT connector and at the final output stage allowing for pre-test calibration of the system.