Showing results: 151 - 165 of 5306 items found.
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CTS-2700 -
Astronics Corporation
The CTS-2700 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Focus-FX -
Kyoritsu Testsystem Co., Ltd.
This is general function test system. User can change board model easily by replacing a test fixture and changing inspection program. We have variety of measurement instruments such as FX modules which can control commercial instruments. It is possible to add required modules into existing units as they are connected by USB port. User can expand as per desired inspection specification.
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NorCom 2020 -
NorCom Systems Inc.
The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Cohu, Inc.
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Anritsu Corporation
With an established market leadership position in GCF and PTCRB approvals for LTE-Advanced and all leading-edge technologies, Anritsu continues expanding its number of test case validations in GCF and PTCRB for Protocol, RF and RRM conformance testing. With increasing complexity of wireless technologies, Anritsu Conformance Test systems provide easy-to-use control software to maximize testing efficiency.
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3380 -
Chroma ATE Inc.
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Applied Relay Testing Ltd.
When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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GIANT 9000 Series -
HORIBA, Ltd.
The major test target is to detect noise and vibrations generated by the vehicles brake. Our intention was to build a dynamometer that can operate either with brakes mounted to the complete vehicle, or with just the axle module mounted to a universal adaptor system or wheel suspensions.
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Sandwich Box Kit -
Verif-i Ltd
"Gold standard” for vibrator tests provides more information than radio, wireline similarities or internal analysis. Other forms of vibrator QC use the vibrator controller accelerometers to measure vibrator motion. The Sandwich Box system includes external accelerometers which are used to independently record vibrator motion, thus providing a check of the whole vibrator system including the accelerometers.
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UTP 5065 -
NOFFZ Computer Technik GmbH
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Eltel Industries
Fully pre-wired comprehensive turn test system. *Suitable for CTs up to 6000A & VTs up to 132kV. * Precision to (0.005 class) internal multi-ratio standard CT. * Internal 4KA current source. * State-of-the-art Instrument Transformer Test Set AITTS-98 with computer & printer interfaces. * Electronic potential divider facilitates testing any VT ratio upto 132kV. * Current & potential burdens.
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CM Series -
Gen3 systems
The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.
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LCII -
Radiant Technologies, Inc.
Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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V93000 SoC / Smart Scale -
Advantest Corp.
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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IEC61000 -
Newtons4th Ltd
N4L are the only IEC61000 EMC test system manufacturer in the world* with an on site UKAS ISO17025 calibration laboratory offering accreditation to IEC61000-3-2, IEC61000-3-3, IEC61000-4-7 and IEC61000-4-15. Calibration and trace-ability are a vital aspect of any EMC test solution and the coverage provided through N4L’s UKAS Laboratory is comprehensive. N4L’s IEC61000-4-15 calibration procedure is particularly noteworthy as it covers the entire test protocol detailed in Annex C of IEC61000-4-15. It is commonplace for specific parameters within IEC61000-4-15 (d parameters are frequently omitted from calibration procedures) to remain untested during typical flicker calibration due to the difficulty in providing trace-ability for such measurements. All tests within the test protocol of Annex C are included within the scope of accreditation and calibration procedures at N4L.
