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Test Development

Create and run Tests made for the environment you are assessing.

See Also: Development, Software Development, Developers, Development Boards, ATE Integration


Showing results: 481 - 495 of 592 items found.

  • AMIDA 3001XP Tester

    Amida Technology, Inc.

    AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.

  • Supported Test Systems

    The Test Connection, Inc.

    TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.

  • Analytical Modeling and Test Services for Lightning Phenomena Challenges in the Wind Turbine Systems and Structures

    National Technical Systems

    NTS’ Pittsfield, Massachusetts facility has long been involved in the wind power industry. Our participation in the IEC TC-88 PT 24 committee which is responsible for releasing the wind industry test standard IEC 61400-24 and the development of our analytical modeling capabilities enable our engineering department to provide the design evaluation and testing services your wind power products require.

  • Automated Testing Services

    Teledyne LeCroy

    Thorough automated testing can include thousands of repeated test cases to check for overall product stability, interoperability in a crowded ecosystem, niche failures, accelerated life and performance limits. Our automation testing services are a key component to developing: Android and Apple phones, Car Kits, Audio Equipment, Medical Devices, IoT Products, Development kits, Phone apps, Infotainment, plus more.

  • Development Software Suite

    JTAG ProVision - JTAG Technologies Inc.

    The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and supports the import of design data from over 30 different EDA and CAM systems. Other key data inputs are JTAG device BSDL models and a large, well-maintained model library describing thousands of non-JTAG devices.

  • Mini Array+

    DORC's ZX-1 - Direct Optical Research Company

    Used primarily to measure multi fiber (MT/MPO and MT-RJ) connectors, DORC's fourth generation "ZX-1 mini Array+" is the result of 18 years of hardware and software product development. Although optimized for mutifiber connectors, the ZX-1 mini Array plus also does an excellent job of measuring single fiber PC and APC connectors. DORC's patented design is based on a variant of the Michelson configuration, and provides BOTH 2D and 3D high resolution images of the sample under test in approximately 45 seconds for multi fiber connectors and just 3-4 seconds for single fiber connectors - from the time the connector is inserted.

  • Universal Friction & Wear Testing Machine

    Model MMW-1A - Jinan Testing Equipment IE Corporation

    The MMW-1A UTM for Friction Wear can simulate rolling, sliding and rolling & sliding combined movement under the certain contact pressure to complete point, line and plane simulating tests. The UTM for Friction Wear can be used to evaluate the friction wear performance of lubricant, metal, plastics, coating, rubber, and ceramics etc. The UTM for Friction Wear can not only satisfy the needs of traditional petrochemical industry to research, develop and inspect the various kinds of intermediate & high grade hydraulic oil, combustion engine oil and gear oil, but also can simulate evaluation on new material development and new technology research under dry condition.

  • Test Cell Measurement

    Accurate Technologies Inc.

    Accurate Technologies’ long history in powertrain development provided insight into the day-to-day issues that were occurring during engine testing at a time when electronic devices were being introduced to monitor performance instead of traditional mechanical means. Outside of the harsh physical environments, devices used in these applications need to perform difficult high-voltage signal conditioning and high-speed synchronous pulse processing. ATI developed unique products that satisfy specific test cell or dynamometer challenges. These highly accurate products measure engine timing (IGTM) or speed (SmartTach) in convenient ways to provide information that otherwise may not be available.

  • CANBUS OBD ECU Simlator

    mOByDic1610 - Ozen Elektronik Inc.

    The CAN BUS multiple ECU simulator provides a professional OBD development platform which allow the user to test the OBD functionality on the table. Simulates 4 differnt ECUs. reading VIN and suspended DTC is possible . Using 5 potensiometer , 5 live data can be changed and some fixed PID values are provided. Pressing DTC bouton the trouble codes are generated and the MIL LED is ON. Service 4 commands clear the DTCs and the MIL LED. Connection to the tester is provided via a J1962 female OBD port . it needs an external 12 V power supply . More information you can get from the corresponding chipset datasheet.

  • VPWM OBD ECU Simlator

    mOByDic1310 - Ozen Elektronik Inc.

    The J1850 VPWM multiple ECU simulator provides a professional OBD development platform which allow the user to test the OBD functionality on the table. Simulates 4 differnt ECUs. reading VIN and suspended DTC is possible . Using 5 potensiometer , 5 live data can be changed and some fixed PID values are provided. Pressing DTC bouton the trouble codes are generated and the MIL LED is ON. Service 4 commands clear the DTCs and the MIL LED. Connection to the tester is provided via a J1962 female OBD port . it needs an external 12 V power supply . More information you can get from the corresponding chipset datasheet.

  • OBD ECU Simlator

    mOByDic1010 - Ozen Elektronik Inc.

    The ISO 9141 multiple ECU simulator provides a professional OBD development platform which allow the user to test the OBD functionality on the table. Simulates 4 differnt ECUs. reading VIN and suspended DTC is possible . Using 5 potensiometer , 5 live data can be changed and some fixed PID values are provided. Pressing DTC bouton the trouble codes are generated and the MIL LED is ON. Service 4 commands clear the DTCs and the MIL LED. Connection to the tester is provided via a J1962 female OBD port . it needs an external 12 V power supply . More information you can get from the corresponding chipset datasheet.

  • Caibration Equipment For Lab Use

    Ponovo Power Co., Ltd.

    In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.

  • Universal Test System

    LEON System - Konrad Technologies GmbH

    A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.

  • MTM Evaluation Kit

    Acroname, Inc

    Get everything you need to evaluate MTM and develop your next functional test system with Acroname's MTM Evaluation Kit. The MTM Evaluation Kit includes: one MTM Development Board, one MTM USBStem Module, one MTM 1 Channel Power Module, one MTM IO Serial Module, one AC/DC 12V/5A power supply and one USB A to mini-B cable.

  • Firmware Engineering Projects

    Precision Development Consulting Inc

    Hand control module for teleprompter, Analog data acquisition and filtering, High-Power Arc Lamp Power Supply Controller and RTP gas flow and Vacuum System controller, Disk drive company test racks, Disk Drive Spindle Motor Tester, Disk Drive Head Stack Tester, Wafer photoresist coating and development system control PC boards, Nuclear Plant secondary water temperature monitor

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