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Showing results: 1 - 15 of 24 items found.

  • PCIe 5.0 Test Platform

    PXP-500A - Teledyne LeCroy

    The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.

  • PCI Express 5.0 Test Platform

    Teledyne LeCroy

    Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.

  • ARINC 818 Tester

    iWave Systems Technologies

    iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces

  • Portable Test Platform

    GT9000P-USB3 - Guide Technology, Inc.

    A 2 channel Portable “CTIA” and/or “TIC” Test Platform controlled by USB3

  • Scalable 2 to 10 Channel Benchtop "CTIA" and/or "TIC" Test Platform with 10" Touch-Screen-Display

    GT9000 - Guide Technology, Inc.

    GT9000 is a scalable 2 to 10 channelsBench-Top CTIA and/or TIC Test Platformwith 10” touch-screen-display (iPhone quality), integrated GUI with Touch, Ethernet, WiFi and/or wireless keyboard & mouse.

  • Scalable 2 to 24 Channels 19” Rack-Mount and/or Bench-Top “CTIA” and/or “TIC” Test Platform

    GT9000R - Guide Technology, Inc.

    GT9000R is a scalable 2 to 24 channels 19”Rack-Mount CTIA and/or TIC Test Platformwith integrated GUI, Ethernet, Wi-Fi and/orwireless keyboard & mouse.

  • Measures Wide Range of Anchor Strengths

    Anchor Test System - James Instruments Inc.

    Two models, each with two different gauge capabilities enable precision readings over a wide range of applications - from light to heavy duty loads. The standard system has a pull stroke of two inches with an option to extend to four inches. The longer pull stroke allows for complete extraction of most fixings in one simple operation. A load diffusion bridge and pyramid are available to keep reaction loads away from the anchor point.

  • Automated Shock Test Systems

    AutoShock-II Test System - L. A. B. Equipment, Inc.

    The AutoShock-II is a fully automated series of shock test systems used to measure and identify product fragility levels and evaluate protective packaging. With the simulation of real world shock pulses and impact energy levels, manufacturers can systematically test and optimize product design and packaging. L.A.B. Equipment, Inc.''s fully automated computer controlled shock and data analysis test systems are the critical path in accomplishing this optimization.

  • Resistivity Meter for Concrete

    Ohmcorr Test System™ - James Instruments Inc.

    OhmCorr has two probes spaced 1.97" (5cm) apart which are placed in holes drilled to a depth of 3/8th" (8mm) and filled with conductive gel. The direct digital read-out of resistivity is displayed on the LCD when the control switch is activated. OhmCorr and CorMap, when used together, provide an economical and sound diagnostic system of corrosion in reinforced concrete.

  • Power-Switching Test System

    High Voltage Switching Test System - Accel-RF Corporation

    The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.

  • Impulse Semiconductor High Current Integrated

    Transmission Line Pulse Test System - Impulse Semiconductor Inc.

    The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.

  • Inspection Tools

    Multi Disk Test System (4-Port) - YEC Co. LTD

    16 types of inspection modes can be registered and edited. More accurate acceptance inspections can be performed using various types of inspections.High speed data communications using USB interface for communicating with host computer.Acceleration testing for temperature loaded HDD can also be performed. (Optional)Easy attaching and removing HDD using optional plug-in unit.

  • Fiber Optic Test System

    OPTOWERE-S100 (Fiber Optic Test System) - Notice

    The frame of FOTS system consists of the Main control part and the Slot mounting part. The Main control part is in charge of control and interface of the system and the Slot mounting part can hold up to maximum 8 slots, which are modularized according to each function and come out in five kinds. This integrated test system is designed to help manage the test and measurement related to optical communication and component. And the modular architecture of FOTS allows for customized configuration so that the slot of LD Driver, 2 channel VOA, 1 X 4 switch, WDM EDFA and C + L – Band ASE Source can be chosen according to user’s necessities. Main control part and each function module are run by effective and multi-functioned system control program in the base of high speed remote interface, GUI display and the discriminative high speed driving of module and system. This system can provide variety manufacturing and laboratory applications such as general quality test and reliability test of optical component and optical signal transmission test through efficient linkage with other system.

  • Testing Large Radar Sensors with CATR Technology

    CATR Radar Test System UTP 5069 - NOFFZ Computer Technik GmbH

    Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.

  • ThermalAir Series Temperature Forcing System

    ThermalAir TA-1000B Rack Mount Test System - MPI Thermal Test Systems

    The ThermalAir TA-1000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device  temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.

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