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Showing results: 9721 - 9735 of 14526 items found.

  • High Flexibility VNA Cables

    Fairview Microwave Inc.

    Our lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged, but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for use in semiconductor probe testing, precise bench top testing as well as lab/production testing where the need for a highly flexible, yet durable cable solution is required. The VNA test cables are also equipped with rugged stainless steel connectors that provide up to 5,000 mating cycles when attached with proper care. Additionally, the flexibility of these cables makes it easier and safer to test a Device Under Test (DUT). A swept right angle 2.4mm and 1.855mm connector option allows these cables to fit in tight spaces and can reduce the length of cable required in many applications.

  • HDMI Phy and Protocol Aux Channel Analyzer Module

    Teledyne LeCroy quantumdata

    The Teledyne LeCroy quantumdata 980 HDMI Phy & Protocol Aux Channel Analyzer module supports compliance testing of the HDMI DDC bus and HDMI 2.0 CEC testing (partial support only). The module’s CEC compliance tests enable you to identify compliance failures early in the development cycle. The solution is ideal for pre-testing and self-testing (where permitted) your HDMI 2.0 device. The module also supports compliance testing of the HDMI DDC bus voltage and timing parameters in accordance with HDMI 1.4b. Future releases of the module will support functional tests and compliance tests on other HDMI auxiliary channels.

  • Universal Tester with LCR meter

    MME-UT 20 - Minmax Electronics

    MME - UT 20 is the latest Microcontroller based Universal IC tester with LCR Meter from Minmax Electronics. It functionally tests 74 series of TTL ICs 40 & 45 series of CMOS ICs, Analog/Linear ICs op amps, comparators, timers, transistor arrays, ADC, DAC etc., It also tests components like diode, transistors, UJT, FET, SCR, Displays, Regulators (78/79) and DIP relays. It also measures the values of Inductance (L), Capacitance(C) and Resistance(R). MME-UT 20 has Rs232 Serial Interface through which IC test Library could be expanded.

  • Caibration Equipment For Lab Use

    Ponovo Power Co., Ltd.

    In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.

  • Dual Space Electro-hydraulic Servo Universal Testing Machine

    WAW-E Series - Jinan Testing Equipment IE Corporation

    WAW-E series computer control servo-hydraulic testing machine is suitable for testing tension, compression, bending and shearing strength of various metallic & non-metallic materials. Equipped with the electronics, computer &software packages, the servo-hydraulic tester of dual space is capable of controlling the test procedures by the predetermined programs. The computer control servo-hydraulic testing machine can also display, record, process and print the test results. The test curves can be drawn automatically in real time. The servo-hydraulictesting machine is easy to operate and is versatile in the applications of metallurgy industries such as steel mills & alloy, reinforced bar, aircraft manufacturer, research institutes, laboratories, calibration institutes etc.

  • Adjustable High Frequency Reference Ballast

    HCS-109A - Lisun Electronics Inc.

    HCS-109A Adjustable High Frequency Reference Ballast also called High Frequency Current Source. Comparing to IEC Test Method, HCS-109A is an Equivalent Test Method which is economic solution. HCS-109A equipped with Spectrophotometer & Integrating Sphere Test System. It can also measure the photo, color and electricity parameters for high frequency fluorescent lamp.Specifications: • Input voltage: 200V~240V, 50/60Hz • Input Power: 80 W max • Output Current: 130mA~400mA (Adjustable), accuracy: +/- 1% • Output Frequency: 25kHz< +/-2.0% (Adjustable), accuracy: +/- 0.3kHz • Output current total harmonic wave distortion: THD<2.5% (HF current wave)

  • Copper Diffusion TestSystems

    Materials Development Corporation

    MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software.  This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor.  Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded.  The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.

  • Passive Component LCR Meter

    Extech LCR200 - Extech Instruments Corporation

    The LCR200 is a passive component LCR meter. Discover the tremendous value with a range of features that help this meter provide the precise measurements you need. See simultaneous 20,000/2,000 count display of the primary parameter on the high contrast backlit display. You can set Hi/Lo limits using absolute values or percentages. Open and Short Zero removes unwanted stray impedances from the measurement. Use the built-in test fixture or external test leads (included). The LCR200 has an Auto Power Off function that can also be disabled and a low battery indicator to alert you when to replace the batteries. Complete with test leads and 9V battery.

  • Automotive Radar Testers

    Rohde & Schwarz GmbH & Co. KG

    Rohde & Schwarz provides automotive manufacturers, components suppliers and test houses with innovative, cutting-edge solutions which bring realistic test scenarios from the road to the lab and production line.Our range of solutions include a signal generator-based target simulator, a radome & bumper tester and an anechoic automotive radar test chamber allowing for over-the-air (OTA) testing. These solutions are at the heart of the development of advanced driver assistance systems (ADAS) with its safety-critical features such as emergency braking. Using T&M solutions by Rohde & Schwarz enables a thorough testing of chipsets, sensors and modules at each phase from development and conformance to production.

  • Power Line Purpose Tester

    LX-221A+ - Shenzhen Lian Xin Technology Co., Ltd.

    ·Meet UL, VDE, CSA, SAA, T-MARK, KS. IRAM, CCC and other countries’ standards .·Used to test single – ends ,double –ends ,three-ends power supply cords.·Auto and continuous test in COND,Insulation Resistance ,Leakage Current, Line-to-line Hi-pot(inside HV), Leaking copper(outside HV), relative length,·Auto test the fine and detective goods, tested qualified ones can be be ejected by ejector pin and marked , automatic cutting defective products, and alarmed with voice prompt and light,·Provide with RS 232 interfaces, can communicate with PC, easy to upgrade,·Provide personalized customization according to different requirements.

  • AC Ground Bond Testers

    440 Series - SCI

    The 440 Series provides advanced 4-in-1 test capability in a convenient one-box solution. This new series performs AC Hipot (448 - 500 VA), DC Hipot, Insulation Resistance and 40A AC Ground Bond tests while taking up minimal production line space. The 440 Series is simple and easy-to-use; reducing setup time and increasing production line throughput for your application. With multiple memories and an optional USB port for remote BUS communication so you can quickly perform tests on a variety of DUTs from the front panel or with a PC. Learn about our 5 Year Warranty.

  • PXIe High-Speed Source/Measure Unit, 13 V, ± 1 A or 6 V, ± 3 A, 18 W

    M9111A - Keysight Technologies

    The M9111A is a 1-slot, 2-quadrant PXIe module that provides stable, glitch-free sourcing and sinking, and high accuracy measurements. It offers high-throughput and measurement quality for design validation and production test of RF power amplifiers. With industry-leading output stability under extreme, dynamic load conditions and unmatched transient performance to dramatically reduce voltage droop due to pulse loading, the M9111A SMU speeds test time. The high-speed M9111A can change its output voltage, stabilize that voltage, and accurately measure current from Amps down to micro-Amps all in less than 1 ms so that you can move on to the next test as quickly as possible.

  • Digital Wideband Transceiver Analysis

    S94610B - Keysight Technologies

    Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.

  • PXIe Audio Analyzer

    M9260A - Keysight Technologies

    M9260A is significantly different from the traditional general purpose PXI digitizer modules which are being used for today's audio measurement. In order to achieve fast test speed and high performance it comes with large one million sample arbitrary waveform buffer and one million sample "limitless" input buffer, as well as super-linear/low noise amplifiers and digital to analog converters. This enables M9260A's ultra-low residual distortion and high amplitude accuracy. M9260A is now an important part of Keysight Radio Test Solution, and may also be easily integrated into any audio related PXI test system with its developer-friendly drivers and commands.

  • Bi-Directional Differential-TTL I/O PXI Card

    GX5642 - Marvin Test Solutions, Inc.

    The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.

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