Showing results: 46 - 49 of 49 items found.
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TestBase -
Astronics Corporation
TestBase is a test executive that supports the visual development, database storage and run-time execution of test program sets.
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National Technical Systems
NTS has a number of facilities capable of conducting dual shaker testing, vibration testing utilizing multiple electrodynamic exciters, for the evaluation of large payloads.Once such example was conducted as part of the test program for NASA’s Lunar Atmosphere and Dust Environment Explorer or LADEE. NTS worked with NASA’s Ames Research Center for simulated environmental testing of the LADEE observatory which included dual shaker vibration.Vibration testing on the observatory was conducted utilizing the NTS Santa Clarita facilities tandem Ling B-340 electrodynamic exciters. These exciters allow either dual shaker vibration testing, or in the case of the LADEE observatory tests, they minimize the test set-up time. The electrodynamic exciters were staged with one in the thrust axis and the other set-up for lateral axes vibration. This dual shaker set up allowed for a quick transition from one test to the other. During the tests, the vibration test lab was maintained at a class 10,000 cleanliness level.
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CodeReport -
Test Spectrum, Inc.
CodeReport is an easy-to-use application for verifying test program quality. CodeReport comes with many different, known quality screening rules that can be used to verify your test program is complete and ready for production. CodeReport also provides a graphical Rule Editor that allows you to create your own, custom rules. Ensure your coding standards and quality specifications are correct by generating your set of rules, checks, and screenings. Easily generate a detailed report for locating, correcting, and documenting the state of your test program. Quickly identify the tester hardware and instrumentation needed to run your program with the Tester Resource report. Save a session file to quickly return to your project after edits have been made or use the Session on other similar projects to transfer your configuration and custom rules.
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Focus-2005 -
Kyoritsu Testsystem Co., Ltd.
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltage biased current measurement and constant current biased voltage measurement. User can set the threshold of 10 ranks. （auto measurement）Only device can be measured. It is also possible to fabricate the test fixture.Various devices can be measured by replacing the socket board.It is no need to generate complex test programs as reference values are calculated from good device.It can be expanded by adding multiplexer boards which are 128pins per one board.(MAX 2048pins)
