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See Also: Equipment, Test Systems, System Integrators, System Test


Showing results: 5641 - 5655 of 17110 items found.

  • FLIM Upgrades for Leica

    SP2 / SP5 / SP8 - Becker & Hickl GmbH

    *Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Identical Systems for Multiphoton FLIM and Confocal FLIM*Detectors can be Swapped Between RLD Port and X1 Port*Systems are Modular: More FLIM Channels can be Added

  • Software for Your Measured Data

    Rotronic Measurement Solutions

    We offer various versions of PC software for configuration and data retrieval from Rotronic measuring instruments. With the more extensive, cloud-based Rotronic Monitoring System (RMS), you benefit from maximum flexibility and outstanding data availability for system solutions and evaluations. The RMS software meets all requirements for server-based monitoring. It is linked to a database that stores all measured data and system activities. It is thus possible to access the data on all popular platforms from anywhere in the world as long as you have an Internet connection. This means the measured data being monitored are always available for evaluation in the central database.

  • Substrate Manufacturing

    KLA-Tencor Corp

    KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.

  • Battery Monitor

    BAF-M2 - Schumacher Electric Corporation

    BATTERY MONITOR• Plugs into a 12 volt automotive cigarette lighter receptacle• Allows instant monitoring of battery & charging system voltage• Constant automotive battery and charging system check with a digital readout• LED warning lights alert you when your battery or charging system is not functioning properly• Detects charging input voltage within 0.1 volts variance• Detects problems with the alternator, diode and any variance of more than 0.8 volts• Alerts you once battery drops to 12.0 volts giving you approximately one more hour of run time, depending on the system’s wattage• Digital display indicates electrical voltage of your battery• Mounted display on your car’s dashboard for constant monitoring of your electrical system Contents: (1) Battery Monitor with 12V DC plug

  • Diagnostic Engineering Software

    eXpress - Spherea Technology Ltd.

    eXpress is a software suite of diagnostic engineering tools that encompass diagnostics, testability, prognostics and systems engineering and represents the result of over 30 years of software development. It provides enormous short and long-term cost-savings, realized throughout the entire life cycle.eXpress provides the capability to capture design information from a systems perspective and may be used to seamlessly combine disparate sources of data. eXpress couples the Systems Engineering, Reliability, Testability, Maintainability and Diagnostic/Testability disciplines. This provides a true end-to-end solution, which can begin as early as concept exploration, and carries through run-time deployment and beyond.eXpress' approach handles system-level design capture and analysis across large engineering teams. By providing the most in-depth Testability and Diagnostics assessment capabilities on the market today, eXpress can tackle tasks ranging from the smallest embedded component to entire aircraft systems.

  • Total Sulfur Process Analyzer

    NEX XT - Applied Rigaku Technologies, Inc

    Featuring third-generation X-ray transmission technology, the NEX XT represents the next evolution of process gauge for sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.The Rigaku NEX XT system is faster, more sensitive and far more compact than competitive systems, and provides continuous, reliable detection of sulfur at pressures up to 1480 psig. Rigaku NEX XT can operate as a stand-alone analyzer or provide real-time closed-loop control when tied into a blending or plant-wide automation system. Among its other key features are a simplified user interface, reduced standards requirement, automatic density compensation, password protection, and standard platform for communicating sulfur and density to a plant-wide DCS. Due to its unique design and robust construction, sample conditioning and recovery systems are typically not required.

  • Dynamic Gas Analyser

    ExQ - Hiden Analytical Ltd.

    The Hiden ExQ quantitative gas analyser is a new multi-featured and compact mass spectrometer system providing continuous on-line analysis of dynamic gas streams at pressures from sub-atmospheric up to 30 bar, the fully integrated system now being configurable both for benchtop and for rack-mounting operation. Connection to the process is via a flexible heated inert capillary line with a sample consumption rate less than 10 mL/minute and a response time of less than 300 milliseconds at pressures near atmosphere. The comprehensive range of process interface options enables adaptation of the system to accommodate analysis of up to 16 individual process streams, and adaptors are available for direct connection of the system to most standard TGA/TA instruments. External process data, sample temperature or mass for example, can be imported for combined integration and presentation with the mass spectral data.

  • Control Unit

    Epec 3724 - Epec Oy

    Epec 3724 Control Unit has an optimized number of both input and output pins to be used for numerous roles in the control system. The total number of I/O pins is 52, and the I/O solution is based on the same proven in use combination as in the previous 2024 control unit. This product is our all-time favourite and a real multipurpose controller for distributed control systems.

  • CXAR Custom Chassis

    Cytec Corp.

    Cytec has a complete metal fabrication shop and a laser etching machine so we can build custom systems with very low NRE. Module arrangement, custom labeling, custom configurations are done fairly easily and nearly 50% of the systems we build are not shown in our standard product line. Don't see what you need? Just ask!

  • Film Thickness

    TQC B.V.

    A correct paint- or coating thickness is an important parameter in the surface treatment industry. The performance of a coating system is based upon correct application of this system following the paint manufacturers specification sheet. Each layer from primer to topcoat and individual intermediate layers are exactly specified with a minimum and maximum coating thickness. Often both a dry and wet film thickness is specified.

  • Mixers and Playback Devices

    Monacor International GmbH & Co. KG

    If several participants are discussing at conferences or different audio sources are to be combined in your ELA system, mixing consoles are required. MONACOR offers you reliable devices for mixing audio from microphones or other sources perfectly. To expand your PA system, we offer you suitable playback devices for media such as MP3, audio CDs or Bluetooth audio.

  • QDRII/DDRII/ QDRII+/DDRII+ SRAM

    Renesas Electronics Corp.

    DDR II / II+ (Double Data Rate) SRAMs and QDR^(TM) II / II+ (Quad Data Rate) SRAMs are the ideal memory devices for next generation networking and communications systems. These ultra-fast devices can support high bandwidth systems that require memories capable of very high operating frequencies combined with low latencies and full cycle utilization.

  • Engineering Services

    Genmark Automation

    - Design and implementation of custom material handling solutions- Selection of optimal, tool specific, material handling systems- Optimization of tool automation performance- Reducing tool programming time via automated teaching- Development of customized tool diagnostic tools- Development of specialized automation system teaching wizards- Provide specialized training courses in material handling automation

  • Spectrum Analyzer

    SPA Series - Com-Power Corporation

    The SPA-series high performance, low cost, easy to use, portable spectrum analyzers are ideal for a pre-compliance laboratory. All three models feature a wide frequency range and low noise floor to increase system sensitivity and system to noise ratio. An advanced, easy to use interface makes your work simple by putting the features you need at your fingertips.

  • Laser Scanning FLIM Microscopes

    Becker & Hickl GmbH

    DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.

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