Showing results: 91 - 105 of 245 items found.
-
KS8000A -
Keysight Technologies
TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. The Keysight KS8000A Test Automation Platform (TAP) Deployment System provides a lower cost, scaled down alternative to the full KS8400A TAP Developers System without the graphical user interface, results viewer and timing analyzer. Deploy your existing test software and TAP plugins into manufacturing environments using the KS8000A command line interface or your own interfaces.
-
Fairview Microwave Inc.
Our millimeter wave variable waveguide attenuators allow designers and engineers to test their systems at various signal strengths and attenuation values to determine the optimum signal performance of the system. The key feature of these waveguide attenuators is that the attenuation level is adjusted using a built-in micrometer which enables repeatable and rapid re-setting to different attenuation levels without the need for additional external components. Our waveguide attenuators handle varying attenuation levels from 0 to 30 dB over the specified band allowing the designer to tune the attenuation level needed for the application. These continuously variable waveguide attenuators cover a broad frequency range of 33 to 110 GHz in five bands and also display flat performance across a wide band with low insertion loss.
-
UTP 6010 RF -
NOFFZ Computer Technik GmbH
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
-
BAUR Transcable 4000/S 110-1 -
BAUR Prüf- und Messtechnik GmbH
Transcable 4000/S 110-1. The transcable 4000/S 110-1 cable test van is a 110 kV cable fault location system in single-phase version. The system is actuated with the semi-automatic MGS control unit. The high voltage switch unit is single-phase, up to 32 kV, the 110 kV switching level is designed as air-insulated ceiling switch.
-
E8663D -
Keysight Technologies
Tackle demanding radar & satcom measurements with metrology-grade performance, including high output power & superior level accuracyUse as an ideal reference in phase noise test systems or for analog-to-digital converter testing with the lowest phase noise in a commercial sourceCharacterize devices & circuits by adding AM, FM, M & pulse modulation to your signalImprove existing test system performance: E8663D is built on the outstanding legacy of the 8663A & is fully code compatible
-
UTP 9011 RF -
NOFFZ Computer Technik GmbH
Circuit boards are the heart of all electronic devices. To ensure the reliable function of these boards, detailed tests are essential.Our board-level tester UTP 9011 RF works safely, quickly and cost-optimized at circuit board level. Our interchangeable adapters are particularly efficient in this system, with which you can even test different test items at the same time. The shielded NOFFZ HF test chamber always ensures consistently good results.
-
Data Patterns Pvt. Ltd.
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
-
YDTW\YDTCW series -
Shanghai Jiuzhi Electric Co., Ltd.
Conventional AC test transformers are especially designed for testing objects of medium capacitance. These systems are particularly suited for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (inductive voltage transformers). The possibility of stacking several of these transformer modules allows reaching very high voltage levels by keeping reasonable floor space.
-
Amida Technology, Inc.
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
-
402LV -
Testronics Inc.
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
-
XJIO -
XJTAG Ltd.
The XJIO boards are expansion units that enable you to improve the test coverage for a Unit Under Test (UUT) by verifying the signals right through to the external connections. They will integrate with your XJTAG test system to provide access to otherwise inaccessible areas of your circuit. With a range of digital and analogue I/O pins on the board, you can improve fault isolation, verify power rail levels, and dispense with costly custom test jigs - even for non-JTAG boards.
-
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations. It is further necessary that these expanding testing capabilities be met with a similar improvement in the simplification of a test instrument’s user interface and software control.
-
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations. It is further necessary that these expanding testing capabilities be met with a similar improvement in the simplification of a test instrument’s user interface and software control.
-
Beehive Electronics LLC
Beehive Electronics designs custom high power RF filters used in vacuum coating systems. Our experience spans from kilohertz to gigahertz and power levels up to 50 kilowatts. We provide a turnkey solution: we design, build, and test the filters to the customer's specification.
-
JEMIO -
StarTest
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
