Showing results: 61 - 75 of 243 items found.
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Hysitron TS 77 Select -
Bruker microCT
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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Hilo Test
The ESD Simulators ESD suitable for performing EMC tests of systems and equipment according to the standards IEC / EN 61000-4-2 and ISO / TR 10605. It can far beyond the standard boundaries higher test levels are adjusted. Depending on the device under test and the test setup are two test method shall be: Air discharge (AIR) and contact discharge (CON).
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WaveCore™ Products -
Textron Systems
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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K8223B -
Keysight Technologies
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
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K8223A -
Keysight Technologies
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
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Pickering Interfaces Ltd.
Pickering's GPIB (IEEE-488) switching systems offer you a comprehensive line of switching modules that are ideal for functional test, factory automation and data acquisition applications. These GPIB switching systems range from small low-cost entry level systems to large high performance units with extensive built in self-test.
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T940 Series -
Astronics Corporation
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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Precision Milimeter Wave
Standard gain horns can be used to experimentally determine the gain of other antennas by using the substitution method. The standard gain horn and the antenna under test are alternately connected to a well matched detector system in order to compare their relative power levels. The power level difference is then added to the appropriate level of the calibration curve to determine the absolute gain of the antenna under test.View more Standard Gain Horn Antennas
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Amida Technology, Inc.
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Apollon -
Afore
APOLLON is a tri-temperature strip-level test system for motion sensors. It is especially designed for high-end Automotive and Industrial applications. APOLLON offers extremely good testing conditions: high stimulus and temperature accuracy and low noise level.
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ELMA Electronic, Inc.
Embedded Computing Systems require more than just a chassis housing with backplane, power supply, cooling and payload boards. To compliment our wide range of systems, Elma offers a comprehensive range of system level accessories, including: I/O solutions, HMI displays, system/power management controllers and test & development boards.
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STAR-Dundee
The SpaceWire Physical Layer Tester (SPLT) is a tool designed to test, validate and verify a SpaceWire system across all levels of the SpaceWire standard. Two SpaceWire ports employ a special LVDS interface which allows the transmitted signals to be deliberately and measurably manipulated to test the capability of a unit under test to receive signals of varying quality.
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400SW -
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection.
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Data Patterns Pvt. Ltd.
Built in strict adherence to open architecture standards, Data Patterns designs COTS module products which are used in today's rugged applications and automatic test equipment platforms. Open standard form factors include cPCI, FMC & XMC, IP, MM, PCI, PCMCIA, PMC, VME, VPX and VXI.A portfolio of 'Off the Shelf ' products for testing and on-board applications have been developed by Data Patterns. COTS boards developed have been sold to many customers, in India as well as Europe and North America. They are used for system level products such as Automatic Test Equipment, Rugged Military Electronics, etc.Data Patterns focus on building COTS product is to provide the technological capability to develop system level products with very fast run around times. Use of Data Patterns' COTS module in system level products ensures Data Patterns ability to maintain the products for a significantly longer life cycle. The proximity to the system level engineering team with the COTS development team ensures that end applications are delivered faster, enabling a shorter time to market for the customers
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Pilot 4D M4 -
SEICA SpA
The Pilot 4D M4 is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs, from prototypes to small/medium production volume, through the repair of field returns and reverse engineering. The vertical, compact architecture and the excellent board clamping system ensure that there is no oscillation of the board under test, which in turn greatly facilitates the precise positioning of the probes on the test points.
