Showing results: 166 - 180 of 243 items found.
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MSight -
MiraVid Inc.
Instantly jump to any stream location with fast seeking which makes navigation simple and easy. MSight Analyzer will jump to the exact location of any error identified in a compliance test to allow full inspection of all the stream data at that location. Complete coverage with support for VC-1, H.264/AVC, MPEG-4 part 2, MPEG-2, MPEG-1, and system level (program and transport stream analyzer features) in a single tool.
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786320-01 -
NI
1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.
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VQL -
VideoQ Inc
VQL Instantly reveals your video display, codec, scaler, converter or other video device performance VQL test patterns cover all 3 levels of video QA/QC: Instant visual-aural Quality Estimation Objective Measurements of video and audio performance Fully automated (unattended) Quality Control VQL features: Compatibility with all commonly used software or hardware codecs and media players VideoQ VQV / VQMA / VQTS / VQDM compatible tests Wide range of video frame sizes: from 192x108 to 4096x3072 Variety of bit rates up to uncompressed 4:4:4 4K @60 fps, 48 bit per pixel Variety of video and audio formats, color spaces and level schemes All test patterns remain suitable for accurate measurements even after low bitrate coding, heavy scaling and/or cropping, e.g. after down-conversion for mobile devices Standard, custom and semi-custom tests for development labs, content processing facilities, CDN systems, software developers and high volume manufacturers
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Wuhan Sunma Technology Co., Ltd.
QAM Analyzer designed for both installation and maintenance of HFC system. Measure and display main parameters in DVB testing (channel power, MER, BER, Constellation Diagram), signal level on any frequency, amplitude of the carriers singly in the whole system range, and etc. The Analog, QAM and FM channel can be set and tested efficiently; it also supports HUM measurement, C/N measurement, voltmeter function, spectrum analysis and data logging. Also it is easy for user to obtain a report of test data via PC or printer through toolbox software.
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EL30000 Series -
Keysight Technologies
The Keysight EL30000 Series Bench electronic load with a built-in data logger provides new levels of test insights for your devices like power supplies, batteries, DC to DC converters, and more. View voltage and current trends to make real-time decisions, rather than waiting hours for a test to complete. At the heart of the EL30000 is a highly accurate measurement system that provides real-time updates to the large display. Keysight’s PathWave BenchVue software allows you to operate the electronic load remotely, execute test sequences, log data, and integrate with other test instruments. Single and dual-channel models are available with up to 600 W for measurements that require more power. Start your test with confidence and finish with results you trust.
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Luxyn Model MLVS-0520 -
Micro Lambda Wireless, Inc.
Lyxyn synthesizers are ideal main local oscillators in Receiving Systems, Frequency Converters and Test & Measurement Equipment. MLVS-0520 is VCO-based and provides 0.001 Hz frequency resolution over the 50 MHz to 21 GHz frequency range. Output power level of +15 dBm is provided throughout the full frequency range. Full band switching speed is 50 μsec maximum. The MLVS-0520 is 4” x 3.6” x 0.94” high.
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Guangzhou Jumho Electric Co., Ltd.
Cell phones and other wireless devices radiate powerful electromagnetic fields that can cause interference and noise in microphone signals. The interference and noise is called RF interference, which is an unwanted “signal” that occurs at the same time and frequency as a data signal. The RF interference disrupts the flow of data and degrades quality-of-service. Jumho Electric provides a cost-effective RF interference test system for GSM interference level measurement of wireless microphone.
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780993-02 -
NI
200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6545 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6545 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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780993-03 -
NI
200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6545 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6545 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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72-490 -
Tenma
Highly versatile compact audio generator is perfect for sound system and speaker component testing. Its high precision and remote VCO input make it suitable for the serious test environment, yet its compact size and low cost make it suitable for any tool box. This device is designed to be connected to the line level of any consumer or commercial designed audio amplifier. While it is designed to be used with unbalanced inputs, it is also suitable for balanced equipment
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Transmission Line Pulse Test System -
Impulse Semiconductor Inc.
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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780992-02 -
NI
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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780992-03 -
NI
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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TH2829A -
Changzhou Tonghui Electronic Co., Ltd.
By dint of leading impedance measurement technology and rich R&D experience, Tonghui continuously introduces representative impedance measurement product --- TH2829 series automatic component analyzer is another excellent product we have produced. TH2829A automatic component analyzer possesses a higher test speed, a more comprehensive analysis function and friendly human-computer interactive experience by adopting the latest high-speed processor and a new software system. Well-designed measuring circuit and optimized algorithms further enhance the test stability of low-D capacitance and high-Q inductors. The instrument is provided with 10V AC test level, 10V/100mA bias current and standalone 10V/50mA DC current, making it convenient for applying in the test of all kinds of active/ passive devices. Main/ sub parameters display, enhanced display system design, 150-points list sweep and graphical analysis capabilities of multiple parameters meet the most application requirements of customers.
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ForTest Italia Srl
The Dual Absolute.The new Dual Absolute technology makes it possible to eliminate the disadvantages of a classic differential system, improve its advantages and renew an industry that has been standing still for decades. Thanks to the new Dual Absolute technology, ForTest has combined the simplicity of a classic absolute decay system with the precision and sensitivity of a differential system, bringing leak testing instruments to a level never seen before.The new algorithms and measurement hardware eliminate typical defects in a differential system, such as differences in stabilization between the test part and the reference sample.The new range of instruments is able to work in 3 different ways: Pure Differential, Dual Absolute and Central Zero.The new Dual Absolute technology is so powerful and reliable that ForTest has decided to stop developing the classic differential system.
