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System Level Test

assures application unit operation.

See Also: Depot Level Test, Flightline


Showing results: 151 - 165 of 244 items found.

  • Digital Display Auto Circuit Tester

    1676 - Peaceful Thriving Enterprise Co Ltd

    This is a DC voltage tester with smart over-voltage protection and warning for vehicle repair. As electrical system for vehicle becomes more complex, the tester is able to test voltage value, identify DC polarity from different background light color, positive / negative sign, and over-voltage level indication. Moreover, the special designed probe is able to help user to hook, piercing, and probing the wires.

  • Wireless Cmmunications and Networks

    Fraunhofer Institute for Telecommunications

    The Wireless Communications and Networks Division has been working on mobile and wireless radio communications solutions for more than 20 years. The work covers a wide range and ranges from information and network theory via channel measurements and radio channel modeling, algorithms and protocol design, systematic reviews at link, system and network level to prototypical implementations in demonstrators and field tests.

  • Slow Motion Cameras

    Optronis GmbH

    Whether it’s needed in the laboratory, at external sites or for crash tests, you can expect high performance every time, every place and everywhere from Optronis’ slow motion cameras of CamRecord-CR and CamRecord-Sprinter series. The systems are particularly easy to operate. The high level of light sensitivity of these cameras gives you a clear view of your subject, even in poor light conditions.

  • Advanced 3D Automatic X-Ray Inspection

    V810 S2EX - Kyoritsu Testsystem Co., Ltd.

    V810 is "3D Automatic X-ray inspection System" that corresponds to the double side mounting SMT-PCB that is not able to be checked by a transmission-type X-ray machine. It has the ability to detect a wide range of defects, and It have 100% complete defect detection capability in the Hip-defective.And, it is the inspection machine of world's highest level that combines the ability of the ultra-fast test speed and the lowest false call positives further.

  • Refrigerant Leak Detector

    Extech RD300 - Extech Instruments Corporation

    The RD300 Refrigerant Leak Detector detects leakages from air-conditioning units and cooling systems. It's easy to use and is ideal for detecting leaks from air-conditioning units and cooling systems that use all standard refrigerants. The multi-colored LED light bar indicates the level of leaking refrigerant detected by the RD300. The built-in, bright LED convenience light located at the sensor tip illuminates dimly lit inspection areas. Complete with leak test bottle, 9V battery, and protective hard carrying case.

  • MXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz

    N5183B - Keysight Technologies

    Get a fast, compact (2U) alternative to the PSG in the lab, depot or fieldAddress demanding tests of radar modules & systems with near-PSG levels of spectral purityCompensate for system loss & drive high-power amplifiers: +19 dBm output power, -55 dBc harmonics & -68 dBc spurious @ 20 GHzReduce calibration time with switching speed 600 sSimulate narrowband chirps & radar antenna scans with up to five internal function generators that can be used with AM, FM, OM pulse modulation

  • High Resolution USB Programmable Digital Attenuator 200 to 6,000 MHz

    LDA-906V Lab Brick® - Vaunix Technology Corporation

    The Lab Brick LDA series of Digital Attenuators bring affordability, functionality, reliability and simplicity to the microwave test bench. The LDA products range from 6 MHz to 20 GHz with input level tolerance to 2 Watts and step size as small as 0.1 dB. Lab Bricks use a native USB HID interface to avoid the difficulties inherent in using older serial or IEEE-488 interfaces implemented over USB. As a result, Lab Brick users can get to work faster without having to install kernel level drivers, and Lab Brick devices can be easily used on any system that supports USB HID devices, including low cost embedded computers using Linux or similar operating systems.

  • Measurement, Communications & Testing

    Process & Analytical Instruments division of AMETEK

    Measurement Communications & Testing provides the design, integration and installation of critical communication systems, workflow, life-safety solutions and calibration instruments for temperature, pressure and process control. It also is a leader in level measurement devices, continuous position sensors, hardness testers, force measurement devices and retractable cord reels. In addition, it offers a line of weathering test instrumentation along with laboratory and outdoor testing services.

  • Noise Generators

    AtlanTecRF

    Manual Broadband Noise Generators provide up to 1 watt of white Gaussian noise output in several models over the 10Hz to 18GHz frequency range and are designed to be used either as laboratory instruments or as built-in system test facilities. The noise, which is diode generated, is amplified and the level can be varied in 1dB steps from 0 to 10dB or optionally in 0.1dB steps from 0 to 101dB.

  • PXI-6541, 50 MHz, 32-Channel PXI Digital Waveform Instrument

    778952-03 - NI

    50 MHz, 32-Channel PXI Digital Waveform Instrument—The PXI‑6541 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXI‑6541 can sample digital waveforms at up to 50 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6541 also features advanced synchronization capabilities for building integrated mixed-signal test systems.

  • PXI-6541, 50 MHz, 32-Channel PXI Digital Waveform Instrument

    778952-02 - NI

    50 MHz, 32-Channel PXI Digital Waveform Instrument—The PXI‑6541 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXI‑6541 can sample digital waveforms at up to 50 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6541 also features advanced synchronization capabilities for building integrated mixed-signal test systems.

  • Build to Print

    ARC Technology Solutions

    In today’s fast paced manufacturing environment, where time to market and cost competitiveness is key, having a manufacturing partner like ARC can be a valuable resource for your company. ARC has a build-to-print manufacturing capability with our unique ‘engineer-to-print’ philosophy to make sure precision manufacturing and final build accuracy is top priority for your module level or system level builds. ARC can support up to several hundred module level assemblies (CCA subassemblies, cabling, mechanical and paneling elements) with abilities to perform a variety of software, embedded tasks and functional testing including a mixed signal test capability using our in-house MSAT (Mixed Signal Automated Tester) platform. We have a thorough process created through the development of our own products and test solutions. We know the importance of having a regimented manufacturing process, augmented with engineering expertise to address challenges that come up with building complex, high-mix, medium volume products.

  • High-Density PXI Switch Matrix Modules

    Pickering Interfaces Ltd.

    Pickering's range of high-density switch matrix modules is a cost-effective solution for applications that require high-density matrices in the PXI format. The ability to expand to larger matrices is possible by connecting together multiple modules. Reed relay versions use high quality sputtered ruthenium reeds that exhibit excellent contact performance under low and medium level switching conditions, solid-state relay versions available for high speed and long life and electro-mechanical versions for current handling up to 2 Amps. Select models are supported by Pickering's Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.

  • Functional Testing

    A.T.E. Solutions Ltd.

    Whatever your functional testing requirement, whether analogue, digital, or a combination of technologies, we have a solution. With over 2500 applications delivered in this field we have a level of experience that cannot be matched. Ensure the reliability of your product with our functional testing tools. Our functional test solutions range from completely standalone applications to those matched for our FLEX range of ATE test systems. Whatever your testing needs, we will help you choose the best option for you.

  • JTAG/Background Debug Mode Test System PXI Card

    NX5300 - Marvin Test Solutions, Inc.

    The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems. Advanced capabilities include simultaneous support of up to 255 devices on a single scan chain, support of sixteen NX5300 systems controlled by single host machine and configurable JTAG/BDM clock rates up to 24 MHz. The NX5300 includes 16 high-speed measurement channels. Each channel can measure logic levels, frequency, count events and perform a CRC check at rates up to 100 MHz.

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