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Simulation

the approximation of actual operational conditions.

See Also: Simulators, Simulation Software, Simulation Testing, Modelling, Emulation


Showing results: 1186 - 1200 of 1357 items found.

  • Power Electronics Test Solutions

    Chroma ATE Inc.

    Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.

  • ISA Bus Dual Redundant MIL-STD-1553 A/B Simulator / Analyzer / Tester

    CIC101-4 - Andor Design Corp.

    Price: Request QuoteMIL-STD-1553 A, B Simulator/Analyzer/Tester ISA BUS Interface Card. The CIC101 can be used for Validation Testing,Production Testing, full bus simulation and monitoring, as ageneral purpose 1553 interface or a stand alone bus Analyzer. It provides precise message scheduling andmeasurements. Major and minor frame times areindependent of message sequences or retransmissions onerrors. The start of all command messages may be set to beindependent of message length, response time or length ofresponse. The CIC101 features a calibrated Message timingand low jitter RT responses.

  • FPGA Test System

    DO-254/CTS - Aldec, Inc.

    DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests. The FPGA testing results are captured at-speed and displayed using a simulator waveform viewer for advanced analysis and documentation.

  • MIL-STD-1553 A, B Simulator/Analyzer/Tester

    CIC201 - Andor Design Corp.

    MIL-STD-1553 A, B Simulator/Analyzer/Tester - CIC201B VME/VXI B Size Interface, CIC201C VME/VXI C Size Interface - The CIC201 can be used for Validation Testing, Production Testing, full bus simulation and monitoring, as a general purpose 1553 interface or a stand alone bus Analyzer. For precise message scheduling and measurements, the Major and minor frame times are independent of message sequences or retransmissions on errors and the start of all command messages are independent of message length, response time or length of response. Message timing is calibrated and RT responses have low jitter.

  • Digital Controller

    SPARC Controller - HORIBA, Ltd.

    SPARC Brake is a digital controller optimized for Inertia Brake Dynamometers. As a member of the SPARC family of universal controllers, SPARC Brake is using a modular design to enable more flexible configurations to fulfill any specific test environment.SPARC Brake uses sophisticated control algorithms and provides superior and intelligent control of brake actuators with highest control accuracy to cover the wide range of brake test applications. From simple static brake testing to high dynamic simulation procedures, it is able to meet the highest demands for today’s and tomorrow’s brake test requirements, for example GM-TIP.

  • Lithium Battery Test Chambers

    Dongguan Amade Instruments Technology Co., Ltd

    Lithium battery test chambers are used to simulate various extreme conditions such as crush, impact, penetration, overcharge etc the lithium ion cells and batteries are subjected to during use, transportation, storage and disposal to determine the safety performances, tests including altitude simulation test, thermal test, vibration test, shock test, external short circuit test, impact/crush test, overcharge test, discharge test etc based on UN38.3, IEC62133, UL1642 standards. Applicable to communication products, computer products, consumer electronics, automobile power supplies and so on.

  • Wide Range High Voltage Programmable DC Power Supply

    N3600 Series - Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.

    N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.

  • PXI BRIC8 FIBO Matrix Dual 248x4 2pin Brkout

    40-592A-118 - Pickering Interfaces Ltd.

    The 40-592A FIBO (Fault Insertion Break-Out) Matrix Module is a large-scale high density switching matrix based on the Pickering BRIC format. The fault insertion BRICs are designed for applications requiring the simulation of a variety of faults in complex, high pin count, applications involving sensors and control units. Typical faults that can be simulated are open-circuits, short circuits to ground or battery, or short-circuits between input/output lines. Typical applications are in automotive and aerospace industries which involve safety or mission critical systems that have to behave predictably when cabling or sensor faults occur.

  • PXI BRIC4 FIBO Matrix Dual 124x4 2pin Brkout

    40-592A-014 - Pickering Interfaces Ltd.

    The 40-592A FIBO (Fault Insertion Break-Out) Matrix Module is a large-scale high density switching matrix based on the Pickering BRIC format. The fault insertion BRICs are designed for applications requiring the simulation of a variety of faults in complex, high pin count, applications involving sensors and control units. Typical faults that can be simulated are open-circuits, short circuits to ground or battery, or short-circuits between input/output lines. Typical applications are in automotive and aerospace industries which involve safety or mission critical systems that have to behave predictably when cabling or sensor faults occur.

  • Bidirectional DC Power Supply + Regenerative Load

    62000D - Chroma Systems Solutions, Inc.

    Chroma 62000D programmable bidirectional DC power supplies have both power source and load characteristics, two quadrant operation, and allows feedback of the power from the DUT. They can be used for testing renewable energy power systems including PV/storage hybrid inverters, power conversion system (PCS) on charging/discharging, and as a battery simulator. The 62000D also is a fit for testing power components used in electric vehicles, such as bidirectional on-board chargers (BOBC), bidirectional DC convertors, and DC-AC motor drivers, and power conversion simulation tests of batteries in both directions.

  • Reach-In Xenon Lamp Weathering Test Chamber

    ACMAS Technologies Pvt. Ltd.

    Weiber xenon lamp chamber uses xenon lamp to simulate the whole sunlight spectrum that can produce many destructive effects on the products. This simulation environment provided in the chamber is used to test the resistance of various manufactured products towards these destructive conditions. This chamber is used for quality control, product development and scientific researches and many more. With a variety of models and options, you can customize your chamber to fit your testing needs. Reach in chambers provide a compact testing area for small applications. These are easy to install, transport and occupies less space.

  • Test House Services

    TS Space Systems

    At TS-Space Systems we have over 30 years experience in designing, building and operating vacuum systems for space simulation and materials testing. We have three in-house thermal vacuum chambers which are configurable for a range of temperatures for either monitored vacuum bakeout or thermal vacuum cycling. We design, build and operate these systems in-house which means we are more flexible than most test houses and are happy to modify feedthroughs, manufacture additional support equipment and even change the operation of the chambers, where possible, in order to accomodate customer requirements.

  • PCI-8511, 2-Port, Low‑Speed/Fault-Tolerant CAN Interface Device

    780682-02 - NI

    The PCI‑8511 is a fault-tolerant controller area network (CAN) interface for developing applications with the NI‑XNET driver. The PCI‑8511 excels in applications requiring real-time, high-speed manipulation of hundreds of CAN frames and signals such as hardware‑in‑the‑loop simulation, rapid control prototyping, bus monitoring, automation control, and more. The NI‑XNET device‑driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time for processing complex models and applications.

  • PXI Digital Waveform Instrument

    NI

    PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.

  • NI-9866, 1-Port C Series LIN Interface Module

    781963-01 - NI

    1-Port C Series LIN Interface Module—The NI‑9866 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver. The NI‑9866 excels in applications requiring real-time, high-speed manipulation of hundreds of LIN frames and signals such as hardware‑in‑the‑loop (HIL) simulation, rapid control prototyping, bus monitoring, automation control, and more. You can perform this manipulation while taking other DAQ measurements in the same CompactDAQ hardware platform or while performing low-level FPGA control and embedded monitoring in the same CompactRIO Chassis.

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