Showing results: 1 - 15 of 21 items found.
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Nanovea Inc.
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
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MicroCam™ -
NOVACAM Technologies, Inc.
MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
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Tencor™ -
KLA-Tencor Corp
KLA Instruments™ Alpha-Step®, Tencor P- and HRP®-series stylus profilometers deliver high-precision, 2D and 3D surface metrology, measuring step height, surface roughness, bow and stress with industry-leading stability and reliability for your R&D and production requirements.
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KLA-Tencor Corp
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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NanoMap-WLI -
AEP Technology
White light interferometer- brings high resolution. 4 million pixel image, large scanning range, customizable wavelength range to give users flexibility to image any kind of surfaces with ease.
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NanoMap-D (Dual mode) -
AEP Technology
NanoMap-D (Dual mode) takes imaging to next level. It brings competing techniques – contact and optical profilometer - on one platform. Automatic sample movement and one click measurement, makes NanoMap-D a step forward in imaging world.
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NanoMap-LS -
AEP Technology
NanoMap-LS with large scanning range allows to generate high resolution 3D and 2D images with a press of a button.
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TIME®3231 -
Beijing TIME High Technology Ltd.
TIME® 323X series is advanced high-end surface roughness measuring instruments with wide testing range (±400µm) and high accuracy (tolerance±5%, repeatability 3%). Meanwhile, TIME® 323X surface roughness tester features with skidless/skid measurement, which means it can reach smaller and harder to reach parts than other conventional tools. Up to 55 paramenters for roughness, waviness and primary profile are supported. Apart from those features mentioned above, TIME®3231 is loaded with 90° measurement function.
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SRG-4000 -
Phase II Plus
The latest in state-of-the-art surface roughness testers profilometer, the SRG-4000 is designed with the shop environment in mind. These surface roughness testers profilometer are distinguished by a high level of accuracy, multiple parameters and simplicity of operation. Extremely sensitive and highly accurate readings from this Phase II surface roughness tester are offered via multiple surface roughness profilometer parameters, Ra, Rq(Rms), Rt and Rz.
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SRG-2000 -
Phase II Plus
The PHASE II SRG-2000 surface roughness tester profilometer is a pocket-sized economically priced instrument for measuring surface roughness texture conforming to traceable standards. It can be used on the shop floor in any position, horizontal, vertical or anywhere in between.
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Filmetrics, Inc.
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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LensAFM -
Nanosurf
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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9200 Series -
Kinetic Systems, Inc.
The 9200 Series Vibration Isolation Workstation is a smaller, more compact design providing affordable personal convenience. The 9200 is ideal for applications such as Balances, Optical Microscopes, Cell Injection, Roundness Checkers, and Surface Profilometers.
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µscan -
NanoFocus, Inc.
Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
