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See Also: Test Probes, Microprobes, Test Point


Showing results: 961 - 975 of 2825 items found.

  • Differential Active Probe, 1.7 GHz

    DP0013A - Keysight Technologies

    The Keysight DP0013A is the 1.7 GHz model of the DP001xA Series differential active probes. These provide the superior general-purpose differential signal measurements required for many of today’s high-speed power-related measurements such as motor drives, automotive differential bus measurements, and high-speed digital system designs.

  • Flicker Measuring Probe for LCM ATS

    A712306 - Chroma ATE Inc.

    The Chroma A712306 Flicker Measuring Probe for LCM ATS is specifically designed for adjusting the flicker on LCM automatically following the FMA(Flicker Modulation Amplitude) standards defined by VESA (Video Electronics Standards Association) and JEITA (Japan Electronics Information Technology Industries Association) for flicker measurement.

  • High Voltage Non-Contact Current Probe

    P02-802 - The Eastern Specialty Company

    The TESCO High Voltage Non-Contact Current Probe (Catalog No. P02-802) was developed using current sensor technology. It is a two-piece, True RMS ammeter with a fiber optic link between the high voltage sensor and the readout at ground potential. The sensor is mounted on a hotstick and slipped over a high voltage line.

  • Automated Probe Stations 200 - 300mm

    P200L or P300L - The Micromanipulator Company

    The Micromanipulator P300L 300mm semiautomatic probe station comes standard with features such as single-point ground and integrated thermal chuck plumbing. Built for reliability as well as precision, the P300L features leadscrew – leadnut stage and platen drives, a stainless steel platen with removable front wedge and high stability microscope bridge that supports all high resolution long-working distance microscopes.The P300L ‘s versatile controller supports USB and GPIB communications (configured with proper options). The stage X-Y and platen (Z) are motorized / programmable. Microscope motorized / programmable control is also an option. The system may be controlled via scripts and all popular parametric test analytical prober drivers. An indexing script with user GUI and a Labview VI is provided allowing use of the system right out of the box.Micromanipulator strives to ensure our semiautomatic systems are flexible so that applications like Magnetic sensitivity testing, Probe cards, mmW, Wafer & Board level testing. Once you have developed your testing plan we also have great relationships so we can move you into a fully automatic probe station if needed.Joystick control allows for easy and quick operation when programmability is not required. The joystick intuitively operates the station stage, platen, and microscope for systems so configured.The P300L may be configured with a local dry / shielded / dark environment “Top Hat” for low level or low temperature, frost free probing. Three temperature ranges are supported:Ambient (room temperature) to 300C0C to 300C-55C to 300CThe P300L is the station of choice for a high performance, full capability and cost-effective 300 mm semi-automatic probe station.

  • DisplayPort v1.3 Protocol Analysis Probe

    FS4500 - FuturePlus Systems

    The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.

  • Temperature Logger with Integral Stab Probe

    TV-4076 - Gemini Data Loggers Ltd.

    Temperature recorder with integral stab probe LCD display of current readings 30,000 readings capacity High accuracy and reading resolution Fast data offload Splashproof case Low battery monitor and battery low indicator Programmable alarms Optional audible alarm box USB and serial download cables

  • Temperature Probe, Type K, Penetration

    8734 - TEGAM Inc.

    For measuring semi-soft materials within a restricted temperature range. Compact size makes this probe easy to transport. The 403 stainless steel sheath has a pointed tip and is 3-3/4" long with a 2" handle. Thermoplastic rubber, coil-styled cord extends from 1-1/2 feet to 5 feet.

  • Advanced High Speed Test Probe

    SQprobe - Telchemy Incorporated

    SQprobe® is an advanced high speed probe designed for emerging software defined (SDN) and virtualized networks. It monitors IP based voice, video, audio and data streams at Gigabit rates, performing deep packet inspection (DPI) and providing accurate and detailed real time service quality metrics, usage and demographic data.

  • Mercury Probe for CV IV Measurements

    Four Dimensions, Inc.

    Four Dimensions' Mercury Probe Systems use the liquid metal Mercury to form temporary non-damaging electrical contacts on numerous materials. The instantaneous contact formed on semiconducting materials can be of MOS, MIS, or Schottky barrier type. This permits various electrical characterizations of for example silicon and compound semiconductors without the need of metal deposition processes.

  • Low & High Voltage Differential Probes

    T3 - Teledyne LeCroy

    Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.

  • Temperature Probe, Type K, Surface

    8715A - TEGAM Inc.

    Type-K thermocouple probe. For monitoring hotplates, furnaces, molds, and other solid surfaces. The exposed thermocouple junction provides an accurate reading of surface temperature within 3 seconds. The sheath is 6" long with a 1/4" diameter flat tip. It is constructed with #304 stainless steel. The vinyl clad straight cord is 3-feet in length

  • Ultra-High Vacuum Scanning Kelvin Probe

    KP Technology

    Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.

  • POWER PROBE 4 MASTER KIT

    PPKIT04 - Matco Tools

    *Combines the Power Probe 4, PPECT3000 and various accessories to provide the ultimate combination of diagnostic and circuit testing capabilities*Tests for AC/DC voltage in 100ms and 50s resolutions, AC volts RMS and volts peak-to-peak, measure resistance, frequency and pulse width (negative and positive)*Tests fuel injectors, module drivers (transistors) and works as a circuit detector with the PPECT3000

  • Sensors, Probes And Coils For Component Testing

    Sensors - Foerster Instruments, Incorporated

    We offer a comprehensive range of standard and customised sensors, probes and coils for component testing. If the wide selection of standard sensors does not optimally solve your testing task, we offer you an individual new development specially adapted to your testing task. Thanks to our many years of experience, you receive reliable sensor technology for reproducible test results.

  • Low Voltage Differential Oscilloscope Probes

    Tektronix, Inc.

    Differential signaling used in high speed serial standards requires very accurate characterization. The industry-leading bandwidth and signal fidelity found in a Tektronix low voltage differential oscilloscope probe ensures that you see every possible detail. Tektronix offers TriMode™ architecture which streamlines measurement acquisition by enabling you to make differential, single-ended, and common mode measurements with a single connection!

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