Showing results: 151 - 165 of 178 items found.
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Evans Analytical Group®
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Signatone Corp.
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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i4400 -
AcQ Inducom
The i4400 is a low-cost 6U form factor PMC / PrPMC carrier for the VMEbus and forms the basis of a flexible I/O system. It offers the user a means of integrating two single PMC modules or one double PMC module in a VMEbus system. The current version of the i4400 supports PMC modules and also supports Processor PMC modules on one PMC-site. The VME-to-PCI bridge is implemented in an FPGA for flexible VME-to-PCI mapping and to allow future updates and upgrades.
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FH-1200 -
MCT, Inc.
Universal testing capabilities for film mounted strip handling. It works with semiconductor test devices including QFN, BGA, CSP and WLP to assure the highest first pass yields available by enabling increases from 1% to 10%+ through precise contactor alignment and device positioning accuracy. Supported by a cutting-edge data management system and analysis software, FH-1200 includes Smart-Track and Smart-EM – your “Virtual Process Engineer” – to handle electronic strip mapping, process control and data management.
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Dektak® -
Bruker Nano Surfaces
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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NED-LMD WG Series -
Gamma Scientific Inc.
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Zhuhai Measure Science and Technology Co. Ltd
Laser sensors can detect, count, trigger, map, profile, scan, and guide as well as verify levels, proximities and distances to practically anything you can think of. Our Laser Distance Sensor MSD30/60/100 are use for the Plant Management and Automation, Security and Surveillance, Vehicle Guidance and Automation and Traffic Management. Such as Car safety range warning, Intelligencespatial orientation, Contour scanning, Aircraft intelligence:control,obstacles, Ship: navigation, beach safety, Space scanning mapping, Safety monitoring and protection of landslides, tunnels, mines, bridges, etc. Flood warning of water level monitoring, intelligent monitoring of crude oil storage, Speed measurement application. They are used where small objects or precise positions are to be detected. If you want to used them we would like to send you the communication protocol and other documents.
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TRX Systems, Inc.
Accurate location information is critical for enabling improved navigation, situational awareness, targeting, and mapping. GPS-may be denied in triple canopy, urban canyons or indoor and subterranean environments, and can be easily jammed or spoofed. NEON Squad Tracker uses a suite of patented algorithms to opportunistically fuse inertial sensor data, GPS (including resilient GPS sources), warfighter waypoint check-in), and ultrawideband shared constraints and "dropped beacons", along with position location information from third party systems sources (psueodolite, satellite, etc.) to deliver reliable GPS-denied location. Features:Sensor fusion for dismount personnelFlexible 3rd party constraint processingIntegrates with resilient PNT sourcesWarfighter map/waypoint check-inUWB ranging and constraint sharingOperation indoor, underground, and outdoorsAPI delivers warfighter location, motion, gait
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Anritsu Corporation
Spectrum Analyzer: 9 kHz 4 GHzInterference Analyzer with Interference MappingHigh Accuracy Power Meter, 2-port Transmission MeasurementsCoverage Mapping, Channel Scanner, GPS, AM/FM/PM Analyzer3GPP, 3GPP2, WiMAX, signal analyzersTracking Generator: 500 kHz 4 GHzDigital TV ISDB-T, DVB-T/H analyzersCPRI RF MeasurementsField-proven design: Three-hour battery life, rugged, compact, lightweight, daylight viewable displayIntuitive menu-driven touchscreen user interfacePIM Alert (a downloadable easyTest script)Standard three-year warranty (battery one-year warranty)
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MEDAS -
HORIBA, Ltd.
The MEDAS system is a compact altitude simulator that reproduces a wide range of environmental conditions. It allows for testing light- to heavy-duty vehicles, including Non-Road Mobile Machinery (NRMM). It is ideally suited for a range of testing applications, such as durability, RDE replication, emission tests and mapping as well as tests from component to vehicle level. The patented technology inside the MEDAS system allows dynamic changes on the simulated atmosphere with high accuracy. The system can also be moved between different test cells due to its compact design.
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XGT-9000SL -
HORIBA, Ltd.
- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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RAMANview -
Nanophoton Corp.
RAMANview has a dedicated optical system, which substantially expand the field-of-view. Even large samples – bigger than 800 mm2 – can be analyzed without moving the sample. Just select with the mouse of your computer the area of interest and the ultra-fast laser scanning system will do the requested analysis. Regular mapping systems take a long time; have the risk of moving the sample out of area or ? working with solutions ? even slopping it. RAMANview saves your time and provides a secure analysis of any area of interest.
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ORION -
A&D Technology, Inc.
ORION automates the process of characterization and calibration of engines. It facilitates the calibration process by taking control of both the ECU calibration system and the test cell control system to run experiments as part of an automated calibration process. With connectivity to IAV’s EasyDOE, Mathworks’ MBC Toolbox and other DOE tools, ORION provides an extremely powerful environment for mapping an engine and generating the Engine Management System calibration tables. The modular design means the product can be configured to a users’ specific requirements and work practices, rather than having to adhere to rigid methodologies dictated by prescriptive software.
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5000E -
Scientific Test, Inc.
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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450 -
Oersted Technology
The Model 450 is a high-resolution, laboratory gaussmeter, capable of measuring magnetic fields from 0.001 Gauss to 300k Gauss (measurement range is dependent on probe used). This unit is designed for demanding applications, such as material analysis and field mapping, where low-noise, high-resolution magnetic measurements are necessary. Measurements of AC and DC magnetic fields are shown in Gauss or Tesla on the two-line vacuum fluorescent display. The Model 450 features RS232C and IEEE-488 ports, allowing the instrument to be controlled via a remote computer or automation equipment. A hall-effect gaussmeter probe is included with the Model 450, and may be selected from an extensive line of probe
