Showing results: 2536 - 2550 of 3753 items found.
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DD-1+ -
D'Amore Engineering llc
The purpose of this tool is to enable the installer to set the gain of an audio amplifier to match the source unit's output level, accurately and quickly. It can also be useful for detecting distortion in the audio signal caused by poorly designed or malfunctioning audio equipment. Sets audio system gain overlap, continuously variable from 0.0dB - 15.0dB in 0.1dB steps Checks gain overlap of an audio system without making any adjustments to the existing settings Verifies that the gain overlap of an install hasn't been tampered with after install Features our Patent Pending Distortion Detection system plus digital microcontroller and our proprietary firmware
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VORTEX -
TeamCast
VORTEX is a very innovative and advanced solution that supports ATSC 1.0 waveform on an optimized hardware platform.It has been especially designed to meet transmitter manufacturer’s demand for integrating a “read-to-use” and future proof modulator/exciter within their own designs.Fully controlled via a friendly WEB GUI and via SNMP, VORTEX features some very unique functionalities dedicated to control the transmitter (TX) such as a Power Measurement Unit (measuring in real-time the forward and reflected power levels), the TX power ON/OFF control system and the Automatic Gain Control (AGC) mechanism.VORTEX Digital Adaptive Precorrection circuits, powered by TeamCast GAP® – Green Adaptive
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779010-01 -
NI
±5 VDC to ±250 VDC/10 VAC to 250 VAC, 4-Channel (Sinking/Sourcing Input), 3 ms C Series Digital Module - The NI‑9435 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel accepts signals from ±5 VDC to ±250 VDC and 10 VAC to 250 VAC; features transient overvoltage protection between the input channels and earth ground; and has an LED that indicates the status. The NI‑9435 is a correlated digital module, so it can perform correlated operations, triggering, and synchronization when installed in a CompactDAQ chassis.
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Bestone Industrial Ltd.
This multifunction anemometer provides instant data such as Air Speed and Temperature in Dual Level LCD display with Backlight. This tool has wide measuring range of wind speed from 0 ~ 45m/s (0 ~ 8800ft/min) and temperature from 0 ~ 45°C (32 ~ 113°F).
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Smiths Interconnect
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Model #:PE-200 -
Pansco, Ltd
The PoE Tester Pro is designed for speed testing and verifying standard active and passive PoE networks as well as measuring power level of a PoE system even with reversed polarity on IEEE 802.3 af (PoE), 802.3 at(PoE+) and 802.3bt(PoE++) type3 compliant standard PoE.
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Shanghai Morningtest Environmental Chambers Co.,Ltd.
Morningtest altitude test chamber combines temperature and altitude environments with optional humidity for simultaneous environmental testing. An altitude chamber allows users to control the environmental test chamber temperature while subjecting the product under test to various levels of altitude up to 150,000 feet.
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T940 Series -
Astronics Corporation
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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GX6325 -
Marvin Test Solutions, Inc.
The GX6325 is 6U switching card with 75 SPDT Form C relays with a switching power rating of 60 W. Featuring the highest density available in PXI for this type of switch card, the GX6325 is suitable for all test applications requiring general purpose, low level switching.
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NEOSEM TECHNOLOGY INC
We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market. The integrated system with CMB (custom designed Motherboard), Thermal subsystem and Automation technologies provides a Turn-key Automated Test System which reduces Integration risks and time to Volume Production. Our Automated DIMM SLT (System Level Test) System is highly configurable to address our customers needs and environments constraints for Best Cost of Ownership, Best Performance and shortest Time to Yield.
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SONIK-E -
Castle Group Ltd.
Ultra low sound level detection with the SONIK-E, Environmental Sound Meter. SONIK-E is the pick up and go noise meter for any environmental noise assessor. It's solid and dependable, and is our most robust sound meter yet making it perfect for your most rugged environments.
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Reedholm Systems
Reedholm has configured an integrated system, not just a set of boxes, for testing high power devices at the wafer level. Sophisticated testing, prober control, and database management do not carry a programming burden. As a result, fast, automated wafer testing is done in an inexpensive, compact probing platform.
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TH2840AX -
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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TH2840BX -
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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TH2840NX -
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file